DE69000302D1 - Redundanzschaltung mit speicherung der position des ausgangs. - Google Patents

Redundanzschaltung mit speicherung der position des ausgangs.

Info

Publication number
DE69000302D1
DE69000302D1 DE9090403293T DE69000302T DE69000302D1 DE 69000302 D1 DE69000302 D1 DE 69000302D1 DE 9090403293 T DE9090403293 T DE 9090403293T DE 69000302 T DE69000302 T DE 69000302T DE 69000302 D1 DE69000302 D1 DE 69000302D1
Authority
DE
Germany
Prior art keywords
saving
output
redundancy circuit
redundancy
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE9090403293T
Other languages
English (en)
Other versions
DE69000302T2 (de
Inventor
Cabinet Ballot-Schm Costabello
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Publication of DE69000302D1 publication Critical patent/DE69000302D1/de
Application granted granted Critical
Publication of DE69000302T2 publication Critical patent/DE69000302T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
DE9090403293T 1989-11-24 1990-11-21 Redundanzschaltung mit speicherung der position des ausgangs. Expired - Fee Related DE69000302T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8915508A FR2655177A1 (fr) 1989-11-24 1989-11-24 Circuit de redondance avec memorisation de position de plot de sortie.

Publications (2)

Publication Number Publication Date
DE69000302D1 true DE69000302D1 (de) 1992-10-15
DE69000302T2 DE69000302T2 (de) 1993-04-22

Family

ID=9387772

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9090403293T Expired - Fee Related DE69000302T2 (de) 1989-11-24 1990-11-21 Redundanzschaltung mit speicherung der position des ausgangs.

Country Status (4)

Country Link
US (1) US5058068A (de)
EP (1) EP0432004B1 (de)
DE (1) DE69000302T2 (de)
FR (1) FR2655177A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5388072A (en) * 1992-04-10 1995-02-07 International Business Machines Corporation Bit line switch array for electronic computer memory
JP2816062B2 (ja) * 1992-10-05 1998-10-27 株式会社東芝 メモリセルの情報の消去方法
US5392245A (en) * 1993-08-13 1995-02-21 Micron Technology, Inc. Redundancy elements using thin film transistors (TFTs)
EP0889413A3 (de) * 1997-06-30 2002-03-27 Sun Microsystems, Inc. Vorrichtung und Verfahren um einen Personalrechner und einen Rechnerarbeitsplatzzu verbinden
DE60306488D1 (de) * 2003-02-27 2006-08-10 St Microelectronics Srl Eingebautes Testverfahren in einem Flash Speicher
CN100468314C (zh) * 2003-03-31 2009-03-11 财团法人北九州产业学术推进机构 可编程序逻辑装置
US20050159925A1 (en) * 2004-01-15 2005-07-21 Elias Gedamu Cache testing for a processor design

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1158010A (en) * 1966-12-21 1969-07-09 Ibm Data Storage Apparatus
SE358755B (de) * 1972-06-09 1973-08-06 Ericsson Telefon Ab L M
JPS57129297U (de) * 1981-02-06 1982-08-12
US4471472A (en) * 1982-02-05 1984-09-11 Advanced Micro Devices, Inc. Semiconductor memory utilizing an improved redundant circuitry configuration
US4672240A (en) * 1983-02-07 1987-06-09 Westinghouse Electric Corp. Programmable redundancy circuit
JPS6150293A (ja) * 1984-08-17 1986-03-12 Fujitsu Ltd 半導体記憶装置
US4598388A (en) * 1985-01-22 1986-07-01 Texas Instruments Incorporated Semiconductor memory with redundant column circuitry
US4819205A (en) * 1985-03-25 1989-04-04 Motorola, Inc. Memory system having memory elements independently defined as being on-line or off-line
JPS61264599A (ja) * 1985-05-16 1986-11-22 Fujitsu Ltd 半導体記憶装置
KR950008676B1 (ko) * 1986-04-23 1995-08-04 가부시기가이샤 히다찌세이사꾸쇼 반도체 메모리 장치 및 그의 결함 구제 방법
JPS62293598A (ja) * 1986-06-12 1987-12-21 Toshiba Corp 半導体記憶装置
FR2611301B1 (fr) * 1987-02-24 1989-04-21 Thomson Semiconducteurs Memoire integree avec redondance de colonnes de donnees
US4800535A (en) * 1987-04-28 1989-01-24 Aptec Computer Systems, Inc. Interleaved memory addressing system and method using a parity signal
JPH01109599A (ja) * 1987-10-22 1989-04-26 Nec Corp 書込み・消去可能な半導体記憶装置
US4831285A (en) * 1988-01-19 1989-05-16 National Semiconductor Corporation Self precharging static programmable logic array

Also Published As

Publication number Publication date
US5058068A (en) 1991-10-15
EP0432004A1 (de) 1991-06-12
FR2655177A1 (fr) 1991-05-31
DE69000302T2 (de) 1993-04-22
EP0432004B1 (de) 1992-09-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee