DE68928916D1 - Erzeugung einer Wellenform aus zwei elektrischen phasenverschobenen Signalen - Google Patents

Erzeugung einer Wellenform aus zwei elektrischen phasenverschobenen Signalen

Info

Publication number
DE68928916D1
DE68928916D1 DE68928916T DE68928916T DE68928916D1 DE 68928916 D1 DE68928916 D1 DE 68928916D1 DE 68928916 T DE68928916 T DE 68928916T DE 68928916 T DE68928916 T DE 68928916T DE 68928916 D1 DE68928916 D1 DE 68928916D1
Authority
DE
Germany
Prior art keywords
waveform
generation
electrical phase
shifted signals
shifted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68928916T
Other languages
English (en)
Other versions
DE68928916T2 (de
Inventor
Robert Charles Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Inc USA
Original Assignee
Asea Brown Boveri Inc USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asea Brown Boveri Inc USA filed Critical Asea Brown Boveri Inc USA
Publication of DE68928916D1 publication Critical patent/DE68928916D1/de
Application granted granted Critical
Publication of DE68928916T2 publication Critical patent/DE68928916T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/247—Details of the circuitry or construction of devices covered by G01R15/241 - G01R15/246

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
DE68928916T 1988-09-28 1989-09-25 Erzeugung einer Wellenform aus zwei elektrischen phasenverschobenen Signalen Expired - Lifetime DE68928916T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/250,289 US4904931A (en) 1988-09-28 1988-09-28 Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals

Publications (2)

Publication Number Publication Date
DE68928916D1 true DE68928916D1 (de) 1999-03-04
DE68928916T2 DE68928916T2 (de) 1999-09-02

Family

ID=22947139

Family Applications (2)

Application Number Title Priority Date Filing Date
DE68922951T Expired - Fee Related DE68922951T2 (de) 1988-09-28 1989-09-25 Elektrooptisches Spannungsdifferenz-Messverfahren und -Gerät in einem Messsystem für phasenverschobene Signale.
DE68928916T Expired - Lifetime DE68928916T2 (de) 1988-09-28 1989-09-25 Erzeugung einer Wellenform aus zwei elektrischen phasenverschobenen Signalen

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE68922951T Expired - Fee Related DE68922951T2 (de) 1988-09-28 1989-09-25 Elektrooptisches Spannungsdifferenz-Messverfahren und -Gerät in einem Messsystem für phasenverschobene Signale.

Country Status (8)

Country Link
US (1) US4904931A (de)
EP (2) EP0613015B1 (de)
JP (1) JP3189840B2 (de)
AR (1) AR247791A1 (de)
AU (1) AU616303B2 (de)
BR (1) BR8904866A (de)
CA (1) CA1328482C (de)
DE (2) DE68922951T2 (de)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5434698A (en) * 1989-11-13 1995-07-18 Dai Nippon Printing Co., Ltd. Potential sensor employing electrooptic crystal and potential measuring method
US5059894A (en) * 1990-05-16 1991-10-22 Abb Power T&D Company, Inc. Electro-optic voltage measuring appartaus with single ended optics
US5247244A (en) * 1990-05-16 1993-09-21 Abb Power T&D Company Inc. Electro-optic voltage measuring system with temperature compensation
DE4128687A1 (de) * 1991-08-29 1993-03-04 Asea Brown Boveri Faseroptischer sensor
CA2117344C (en) * 1991-12-24 2001-04-24 Ian Grainge Clarke Current sensor
US5677622A (en) * 1991-12-24 1997-10-14 The University Of Sydney Current sensor using a Sagnac interferometer and spun, single mode birefringent optical fiber to detect current via the Faraday effect
DE4416298A1 (de) * 1994-05-09 1995-11-16 Abb Research Ltd Verfahren und Vorrichtung zur optischen Ermittlung einer physikalischen Größe
JP2810976B2 (ja) * 1994-11-28 1998-10-15 工業技術院長 電気信号測定方法および装置
DE19544778A1 (de) * 1995-11-30 1997-06-05 Siemens Ag Verfahren und Anordnung zum Messen einer Meßgröße, insbesondere eines elektrischen Stromes, mit hoher Meßauflösung
US5734263A (en) * 1996-02-06 1998-03-31 Eaton Corporaton Electro-optic voltage transducer with extended range and temperature compensation
DE29707379U1 (de) * 1997-04-24 1997-06-19 PMK Mess- und Kommunikationstechnik GmbH, 63150 Heusenstamm Gerät zur Messung von Hochspannung an Hochspannungsleitungen
WO1999005488A1 (en) 1997-07-28 1999-02-04 Hinds Instruments, Inc. Measurement of waveplate retardation using a photoelastic modulator
JP4629869B2 (ja) 1998-02-20 2011-02-09 ハインズ インスツルメンツ インコーポレイテッド 複屈折特性測定方法および装置
WO1999050678A2 (de) 1998-03-31 1999-10-07 Siemens Aktiengesellschaft Verfahren und anordnung zur verarbeitung mindestens eines analogen, mehrere frequenzbereiche umfassenden signals
EP1099117B1 (de) * 1998-07-23 2002-05-29 Siemens Aktiengesellschaft Verfahren und einrichtung zur messung einer elektrischen spannung mit hilfe des pockelseffektes
US6252388B1 (en) 1998-12-04 2001-06-26 Nxtphase Corporation Method and apparatus for measuring voltage using electric field sensors
US6697157B2 (en) * 1999-05-24 2004-02-24 Hinds Instruments Birefringence measurement
US6479979B1 (en) * 1999-07-09 2002-11-12 Srico, Inc. Opto-electric device for measuring the root-mean-square value of an alternating current voltage
US6307666B1 (en) * 2000-01-13 2001-10-23 Bechtel Bwxt Idaho, Llc Voltage sensing systems and methods for passive compensation of temperature related intrinsic phase shift
US6268914B1 (en) 2000-01-14 2001-07-31 Hinds Instruments, Inc. Calibration Process For Birefringence Measurement System
EP1397651B1 (de) * 2001-06-18 2007-06-06 Hinds Instruments, Inc. Doppelbrechungsmessung für wellenlängen im tiefen ultraviolettbereich
US7123032B2 (en) * 2003-12-04 2006-10-17 Fieldmetrics, Inc. Voltage sensor and dielectric material
US7129693B2 (en) * 2004-07-19 2006-10-31 Fieldmetrics, Inc. Modular voltage sensor
CN101568842B (zh) * 2006-12-22 2013-11-20 Abb研究有限公司 光学高电压传感器
WO2011154029A1 (en) 2010-06-07 2011-12-15 Abb Research Ltd High-voltage sensor with axially overlapping electrodes
WO2012163924A1 (en) 2011-05-27 2012-12-06 Abb Research Ltd Fiber-optic voltage sensor
US9513315B2 (en) 2012-08-21 2016-12-06 Abb Schweiz Ag Electro optical voltage transducer signal processing system
AU2015220811C1 (en) 2014-02-21 2019-11-28 Abb Power Grids Switzerland Ag Interferometric sensor
DE112015000882T5 (de) 2014-02-21 2016-11-17 Abb Schweiz Ag Interferometrischer Sensor
CN110988435B (zh) * 2019-11-29 2023-01-17 中国人民解放军92942部队 提高光纤电流传感器信噪比的光路系统
EP4105666A1 (de) 2021-06-17 2022-12-21 Hitachi Energy Switzerland AG Polarisationsanalysator, messanordnung und detektionsverfahren

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH509597A (de) * 1969-12-23 1971-06-30 Bbc Brown Boveri & Cie Verfahren und Anordnung zur Messung eines Magnetfeldes
CH520321A (de) * 1970-05-26 1972-03-15 Bbc Brown Boveri & Cie Verfahren und Anordnung zur Umformung des Signalflusses in einer lichtelektrischen Messeinrichtung
DE2845625A1 (de) * 1978-10-19 1980-04-30 Siemens Ag Anordnung zur elektrooptischen spannungsmessung
DE3006840A1 (de) * 1980-01-31 1981-08-06 BBC AG Brown, Boveri & Cie., Baden, Aargau Verfahren zur phasendifferenzmessung und phasenmeter
JPS5918923A (ja) * 1982-07-23 1984-01-31 Toshiba Corp 複屈折測定装置
ATE32954T1 (de) * 1983-05-16 1988-03-15 Elektroprojekt Anlagenbau Veb Messwandler auf der basis des elektro- bzw. magnetooptischen effektes.
FR2584810B1 (fr) * 1985-07-09 1987-10-16 Enertec Procede et dispositif d'evaluation d'un angle sur une plage etendue
US4698497A (en) * 1986-05-22 1987-10-06 Westinghouse Electric Corp. Direct current magneto-optic current transformer

Also Published As

Publication number Publication date
BR8904866A (pt) 1990-05-08
AU4127089A (en) 1990-04-05
EP0361832B1 (de) 1995-06-07
EP0613015A1 (de) 1994-08-31
JP3189840B2 (ja) 2001-07-16
DE68922951T2 (de) 1996-01-11
US4904931A (en) 1990-02-27
AR247791A1 (es) 1995-03-31
CA1328482C (en) 1994-04-12
EP0613015B1 (de) 1999-01-20
AU616303B2 (en) 1991-10-24
EP0361832A3 (en) 1990-09-12
EP0361832A2 (de) 1990-04-04
DE68922951D1 (de) 1995-07-13
JPH02120673A (ja) 1990-05-08
DE68928916T2 (de) 1999-09-02

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