DE68918384D1 - Ionenanalysator. - Google Patents

Ionenanalysator.

Info

Publication number
DE68918384D1
DE68918384D1 DE68918384T DE68918384T DE68918384D1 DE 68918384 D1 DE68918384 D1 DE 68918384D1 DE 68918384 T DE68918384 T DE 68918384T DE 68918384 T DE68918384 T DE 68918384T DE 68918384 D1 DE68918384 D1 DE 68918384D1
Authority
DE
Germany
Prior art keywords
ion analyzer
analyzer
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68918384T
Other languages
English (en)
Inventor
Yoshiaki Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE68918384D1 publication Critical patent/DE68918384D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7293—Velocity or momentum separators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE68918384T 1988-10-05 1989-10-04 Ionenanalysator. Expired - Lifetime DE68918384D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63249860A JPH0713624B2 (ja) 1988-10-05 1988-10-05 イオンの抽出および分析装置

Publications (1)

Publication Number Publication Date
DE68918384D1 true DE68918384D1 (de) 1994-10-27

Family

ID=17199268

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68918384T Expired - Lifetime DE68918384D1 (de) 1988-10-05 1989-10-04 Ionenanalysator.

Country Status (4)

Country Link
US (1) US5132002A (de)
EP (1) EP0362813B1 (de)
JP (1) JPH0713624B2 (de)
DE (1) DE68918384D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2633974B2 (ja) * 1990-04-18 1997-07-23 株式会社日立製作所 試料のイオン化および質量分析のための装置
JP2598566B2 (ja) * 1990-10-26 1997-04-09 株式会社日立製作所 質量分析計
US5331160A (en) * 1993-03-31 1994-07-19 Hewlett-Packard Company Particle-beam generator for LC/MS interface
JP3198965B2 (ja) * 1997-02-20 2001-08-13 株式会社島津製作所 エレクトロスプレイイオン化装置
US5792347A (en) * 1997-04-10 1998-08-11 Metafix Inc. Effluent precipitation and neutralization vessel and method
JP4882559B2 (ja) * 2006-07-11 2012-02-22 株式会社島津製作所 液体クロマトグラフ質量分析計
DE102007059726B4 (de) 2007-12-12 2010-01-07 Excor Korrosionsforschung Gmbh Dampfphasen-Korrosionsinhibitoren, Verfahren zu deren Herstellung und deren Verwendung
US8070929B2 (en) * 2008-08-21 2011-12-06 Snu R&Db Foundation Catalyst particles on a tip
US7917966B2 (en) * 2008-08-21 2011-03-29 Snu R&Db Foundation Aligned nanostructures on a tip

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1483966A (en) * 1974-10-23 1977-08-24 Sharp Kk Vapourized-metal cluster ion source and ionized-cluster beam deposition
US4209696A (en) * 1977-09-21 1980-06-24 Fite Wade L Methods and apparatus for mass spectrometric analysis of constituents in liquids
JPS583592B2 (ja) * 1978-09-08 1983-01-21 日本分光工業株式会社 質量分析計への試料導入方法及び装置
JPS58156848A (ja) * 1982-03-15 1983-09-17 Fuji Photo Film Co Ltd イオン選択電極及びその製造法
JPS5932861A (ja) * 1982-08-18 1984-02-22 Jeol Ltd 液体クロマトグラフ質量分析装置

Also Published As

Publication number Publication date
EP0362813A3 (de) 1991-03-20
US5132002A (en) 1992-07-21
EP0362813A2 (de) 1990-04-11
JPH0298662A (ja) 1990-04-11
EP0362813B1 (de) 1994-09-21
JPH0713624B2 (ja) 1995-02-15

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Legal Events

Date Code Title Description
8332 No legal effect for de