DE68916144D1 - Kapazitätsmessanordnung. - Google Patents

Kapazitätsmessanordnung.

Info

Publication number
DE68916144D1
DE68916144D1 DE68916144T DE68916144T DE68916144D1 DE 68916144 D1 DE68916144 D1 DE 68916144D1 DE 68916144 T DE68916144 T DE 68916144T DE 68916144 T DE68916144 T DE 68916144T DE 68916144 D1 DE68916144 D1 DE 68916144D1
Authority
DE
Germany
Prior art keywords
capacitance measurement
measurement arrangement
arrangement
capacitance
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68916144T
Other languages
English (en)
Other versions
DE68916144T2 (de
Inventor
Richard Emerson George
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of DE68916144D1 publication Critical patent/DE68916144D1/de
Application granted granted Critical
Publication of DE68916144T2 publication Critical patent/DE68916144T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE68916144T 1988-09-23 1989-09-21 Kapazitätsmessanordnung. Expired - Fee Related DE68916144T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/248,489 US5073757A (en) 1988-09-23 1988-09-23 Apparatus for and method of measuring capacitance of a capacitive element

Publications (2)

Publication Number Publication Date
DE68916144D1 true DE68916144D1 (de) 1994-07-21
DE68916144T2 DE68916144T2 (de) 1994-12-15

Family

ID=22939371

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68916144T Expired - Fee Related DE68916144T2 (de) 1988-09-23 1989-09-21 Kapazitätsmessanordnung.

Country Status (6)

Country Link
US (1) US5073757A (de)
EP (1) EP0360605B1 (de)
JP (1) JPH0726988B2 (de)
CN (1) CN1041457A (de)
CA (1) CA1327994C (de)
DE (1) DE68916144T2 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136251A (en) * 1988-09-23 1992-08-04 John Fluke Mfg. Co., Inc. Capacitance measurement
DE4039006C1 (de) * 1990-12-06 1992-03-12 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De
US5245294A (en) * 1991-03-08 1993-09-14 General Electric Company Method for evaluating operability of filter components in power conversion system
EP0496147A1 (de) * 1991-01-25 1992-07-29 John Fluke Mfg. Co., Inc. Rauschunempfindliche, kalibrierte Messung niedriger Widerstände
DE4116961A1 (de) * 1991-05-24 1992-11-26 Abb Patent Gmbh Messschaltung zur messung einer kapazitaet
US5294889A (en) * 1992-03-27 1994-03-15 Tandy Corporation Battery operated capacitance measurement circuit
EP0652445B1 (de) * 1993-11-08 2001-09-19 Honda Giken Kogyo Kabushiki Kaisha Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters
JP3233791B2 (ja) * 1994-08-25 2001-11-26 株式会社山武 差動容量反転積分器及びこれを用いた静電容量変化量検出装置
US5576628A (en) * 1994-09-30 1996-11-19 Telcom Semiconductor, Inc. Method and apparatus to measure capacitance
US5661240A (en) * 1995-09-25 1997-08-26 Ford Motor Company Sampled-data interface circuit for capacitive sensors
US5838241A (en) * 1996-12-18 1998-11-17 Robertshaw Controls Company Liquid level transmitter
EP0961383A1 (de) * 1998-05-29 1999-12-01 Siemens Aktiengesellschaft Verfahren zum Überprüfen der Kapazität in einem Insassenschutzsystem vorgesehenen Speicherkondensators sowie Prüfvorrichtung
US6191723B1 (en) 1999-07-22 2001-02-20 Fluke Corporation Fast capacitance measurement
US6529017B2 (en) 2000-04-14 2003-03-04 Robertshaw Controls Company Capacitance level measurement circuit and system
US6509745B1 (en) * 2000-09-25 2003-01-21 Detroit Diesel Corporation Method and apparatus for measuring liquid dielectric behavior
TWI242648B (en) * 2001-02-07 2005-11-01 Fluke Corp Capacitance measurement
US6624640B2 (en) * 2001-02-07 2003-09-23 Fluke Corporation Capacitance measurement
US6441592B1 (en) 2001-04-13 2002-08-27 Visteon Global Technologies, Inc. Method for measurement of backup power supply capacitance in restraint control module
FR2853058B1 (fr) * 2003-03-27 2005-05-13 Valeo Securite Habitacle Detection de presence par capteur capacitif
DE10333154A1 (de) 2003-07-22 2005-02-24 Vega Grieshaber Kg Verfahren und Schaltungsanordnung zum Auswerten einer Messkapazität
US7148697B2 (en) * 2004-06-04 2006-12-12 Doljack Frank A System and method for measuring electrical characteristics of a capacitor
JP4363281B2 (ja) * 2004-09-08 2009-11-11 オムロン株式会社 容量計測装置および方法、並びにプログラム
US7816146B2 (en) * 2005-12-27 2010-10-19 Palo Alto Research Center Incorporated Passive electronic devices
US8564252B2 (en) * 2006-11-10 2013-10-22 Cypress Semiconductor Corporation Boost buffer aid for reference buffer
US8035401B2 (en) 2007-04-18 2011-10-11 Cypress Semiconductor Corporation Self-calibrating driver for charging a capacitive load to a desired voltage
FI121979B (fi) * 2008-03-26 2011-06-30 Elsi Technologies Oy Sovitinkomponentti mittausjärjestelmään
CN101738544B (zh) * 2008-11-17 2012-08-22 瑞鼎科技股份有限公司 电容测量电路及其电容测量方法
US8866499B2 (en) * 2009-08-27 2014-10-21 Analog Devices, Inc. System and method for measuring capacitance
JP2011075507A (ja) * 2009-10-01 2011-04-14 Toyo Electric Mfg Co Ltd 電力変換装置のコンデンサ容量判定方法
JP4727754B1 (ja) * 2010-03-04 2011-07-20 Ｓｍｋ株式会社 静電容量式タッチパネル
US8364870B2 (en) 2010-09-30 2013-01-29 Cypress Semiconductor Corporation USB port connected to multiple USB compliant devices
US9667240B2 (en) 2011-12-02 2017-05-30 Cypress Semiconductor Corporation Systems and methods for starting up analog circuits
US8947107B2 (en) * 2012-09-17 2015-02-03 Semtech Corporation Capacitance measurement of high voltage device
CN103675468A (zh) * 2013-12-26 2014-03-26 天津市松正电动汽车技术股份有限公司 一种动态检测超级电容容值的方法
CN110275047B (zh) * 2018-03-14 2021-01-22 京东方科技集团股份有限公司 加速度传感器、电容检测电路、加速度处理电路及方法
CN109030977B (zh) * 2018-06-01 2021-01-26 北京新能源汽车股份有限公司 一种高压断线盒及其控制方法和控制装置
US11342910B2 (en) * 2019-09-30 2022-05-24 Skyworks Solutions, Inc. Power transistor detection with self-protection

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644751A (en) * 1970-07-10 1972-02-22 William L Spaid Digital capacitance meter
JPS539542B2 (de) * 1972-09-21 1978-04-06
US3947760A (en) * 1973-11-14 1976-03-30 Hewlett-Packard Company Integrating component measuring device
US4040041A (en) * 1975-10-24 1977-08-02 Nasa Twin-capacitive shaft angle encoder with analog output signal
US4022990A (en) * 1975-10-28 1977-05-10 Wiltron Company Technique and apparatus for measuring the value of a capacitance in an electrical circuit such as a telephone communication line
US4196475A (en) * 1976-09-02 1980-04-01 Genrad, Inc. Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques
JPS53131377U (de) * 1976-10-20 1978-10-18
US4636714A (en) * 1984-01-18 1987-01-13 Wystron, Inc. Capacitive transducer and method
JPS63161371U (de) * 1987-04-11 1988-10-21

Also Published As

Publication number Publication date
JPH0726988B2 (ja) 1995-03-29
EP0360605A3 (de) 1991-04-24
CN1041457A (zh) 1990-04-18
JPH02194367A (ja) 1990-07-31
CA1327994C (en) 1994-03-22
EP0360605A2 (de) 1990-03-28
DE68916144T2 (de) 1994-12-15
EP0360605B1 (de) 1994-06-15
US5073757A (en) 1991-12-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee