DE60237966D1 - Schnelle komparatoren mit verriegelungsstufe - Google Patents

Schnelle komparatoren mit verriegelungsstufe

Info

Publication number
DE60237966D1
DE60237966D1 DE60237966T DE60237966T DE60237966D1 DE 60237966 D1 DE60237966 D1 DE 60237966D1 DE 60237966 T DE60237966 T DE 60237966T DE 60237966 T DE60237966 T DE 60237966T DE 60237966 D1 DE60237966 D1 DE 60237966D1
Authority
DE
Germany
Prior art keywords
locking level
fast comparators
comparators
fast
locking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60237966T
Other languages
English (en)
Inventor
Klaas Bult
Plassche Rudy Vander
Jan Mulder
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Broadcom Corp
Original Assignee
Broadcom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Broadcom Corp filed Critical Broadcom Corp
Application granted granted Critical
Publication of DE60237966D1 publication Critical patent/DE60237966D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356017—Bistable circuits using additional transistors in the input circuit
    • H03K3/356034—Bistable circuits using additional transistors in the input circuit the input circuit having a differential configuration
    • H03K3/356043—Bistable circuits using additional transistors in the input circuit the input circuit having a differential configuration with synchronous operation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
    • H03K3/35613—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit the input circuit having a differential configuration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356182—Bistable circuits using complementary field-effect transistors with additional means for controlling the main nodes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356182—Bistable circuits using complementary field-effect transistors with additional means for controlling the main nodes
    • H03K3/356191—Bistable circuits using complementary field-effect transistors with additional means for controlling the main nodes with synchronous operation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/002—Provisions or arrangements for saving power, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains or by selectively turning on stages when needed
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • H03M1/362—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type the reference values being generated by a resistive voltage divider
DE60237966T 2001-02-27 2002-02-27 Schnelle komparatoren mit verriegelungsstufe Expired - Lifetime DE60237966D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US27142501P 2001-02-27 2001-02-27
PCT/US2002/005655 WO2002069497A2 (en) 2001-02-27 2002-02-27 High speed latch comparators

Publications (1)

Publication Number Publication Date
DE60237966D1 true DE60237966D1 (de) 2010-11-25

Family

ID=23035496

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60237966T Expired - Lifetime DE60237966D1 (de) 2001-02-27 2002-02-27 Schnelle komparatoren mit verriegelungsstufe

Country Status (4)

Country Link
US (4) US6639430B2 (de)
EP (1) EP1371137B1 (de)
DE (1) DE60237966D1 (de)
WO (1) WO2002069497A2 (de)

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* Cited by examiner, † Cited by third party
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WO2002069497A2 (en) * 2001-02-27 2002-09-06 Broadcom Corporation High speed latch comparators
TW200412890A (en) 2002-09-05 2004-08-01 Novalabs L L C Toilet cleaning apparatus and caddy
US7888706B2 (en) * 2006-05-31 2011-02-15 Infineon Technologies Ag High-efficiency filler cell with switchable, integrated buffer capacitance for high frequency applications
US8427224B2 (en) * 2011-07-26 2013-04-23 National Chiao Tung University On-chip active decoupling capacitors for regulating voltage of an integrated circuit
US8836375B2 (en) 2012-09-06 2014-09-16 Lsi Corporation Continuously self-calibrated latched comparator
US10015429B2 (en) * 2015-12-30 2018-07-03 Omnivision Technologies, Inc. Method and system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter
US10079990B2 (en) * 2016-09-27 2018-09-18 Omnivision Technologies, Inc. Comparator for double ramp analog to digital converter
TWI658701B (zh) * 2018-02-07 2019-05-01 National Taiwan University Of Science And Technology 動態電流關聯電路及其應用之比較器及類比數位轉換裝置
CN113723037A (zh) * 2021-09-06 2021-11-30 上海集成电路研发中心有限公司 用于射频mos器件建模的测试系统和射频mos器件的建模方法

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US4169233A (en) * 1978-02-24 1979-09-25 Rockwell International Corporation High performance CMOS sense amplifier
US4521703A (en) * 1982-08-30 1985-06-04 Rca Corporation High speed sense amplifier
US4549100A (en) * 1983-05-06 1985-10-22 Rockwell International Corporation MOS Voltage comparator and method
US4551641A (en) * 1983-11-23 1985-11-05 Motorola, Inc. Sense amplifier
JPS6387014A (ja) * 1986-09-30 1988-04-18 Sony Corp ラツチドコンパレ−タ
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US4816706A (en) * 1987-09-10 1989-03-28 International Business Machines Corporation Sense amplifier with improved bitline precharging for dynamic random access memory
US5245223A (en) 1992-03-17 1993-09-14 Hewlett-Packard Company CMOS latching comparator
JPH0750556A (ja) * 1993-08-09 1995-02-21 Fujitsu Ltd フリップフロップ型増幅回路
US5438287A (en) * 1994-06-01 1995-08-01 United Memories Inc. High speed differential current sense amplifier with positive feedback
US5808487A (en) * 1994-11-30 1998-09-15 Hitachi Micro Systems, Inc. Multi-directional small signal transceiver/repeater
US5486779A (en) * 1994-12-29 1996-01-23 Cyrix Corporation Sense amplifier
DE69532377D1 (de) * 1995-10-12 2004-02-05 St Microelectronics Srl Implementierung einer Flip-Flop-Schaltung niedrigen Verbrauchs und hoher Packungsdichte, insbesondere für Standardzellen-Bibliotheken
EP0768610B1 (de) * 1995-10-13 2000-08-09 STMicroelectronics S.r.l. Niederspannungsneuronalnetzwerk mit sehr niedrigem Leistungsverbrauch
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US5698998A (en) * 1996-04-12 1997-12-16 Hewlett-Packard Co. Fast, low power, differential sense amplifier
KR100228529B1 (ko) * 1996-12-20 1999-11-01 윤종용 반도체 메모리 장치용 스케일러블 레벨 시프터
US5977798A (en) * 1997-02-28 1999-11-02 Rambus Incorporated Low-latency small-swing clocked receiver
US5903171A (en) * 1997-05-29 1999-05-11 Winbond Electronics Corporation Sense amplifier with integrated latch and level shift
JP3450649B2 (ja) 1997-06-04 2003-09-29 株式会社東芝 アナログ／デジタル変換装置
US5942919A (en) * 1997-06-25 1999-08-24 Sun Microsystems, Inc. Differential receiver including an enable circuit
US6060912A (en) * 1997-09-19 2000-05-09 National Semiconductor Corporation High speed strobed comparator circuit having a latch circuit
US6037890A (en) * 1997-09-30 2000-03-14 Intel Corporation Ultra high speed, low power, flash A/D converter utilizing a current mode regenerative comparator
US5963060A (en) * 1997-10-07 1999-10-05 Intel Corporation Latching sense amplifier
JP3488612B2 (ja) * 1997-12-11 2004-01-19 株式会社東芝 センス増幅回路
US6069512A (en) * 1997-12-24 2000-05-30 Intel Corporation Dynamic circuits and static latches with low power dissipation
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KR100355222B1 (ko) * 1998-12-28 2003-02-19 삼성전자 주식회사 빠른감지속도와높은전원전압마진을갖는전류감지증폭기
JP4030213B2 (ja) * 1999-02-22 2008-01-09 株式会社ルネサステクノロジ 半導体回路装置
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US6392449B1 (en) * 2001-01-05 2002-05-21 National Semiconductor Corporation High-speed low-power low-offset hybrid comparator
WO2002069497A2 (en) 2001-02-27 2002-09-06 Broadcom Corporation High speed latch comparators
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Also Published As

Publication number Publication date
US20080143391A1 (en) 2008-06-19
US8410820B2 (en) 2013-04-02
US20040041611A1 (en) 2004-03-04
US20020196063A1 (en) 2002-12-26
EP1371137A2 (de) 2003-12-17
US7352215B2 (en) 2008-04-01
WO2002069497A2 (en) 2002-09-06
US6639430B2 (en) 2003-10-28
US7906992B2 (en) 2011-03-15
US20110133967A1 (en) 2011-06-09
EP1371137B1 (de) 2010-10-13
WO2002069497A3 (en) 2003-07-31

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