DE60209589D1 - Elektronisches Gerät und Verfahren für Fehlerbeseitigungsberechtigung - Google Patents
Elektronisches Gerät und Verfahren für FehlerbeseitigungsberechtigungInfo
- Publication number
- DE60209589D1 DE60209589D1 DE60209589T DE60209589T DE60209589D1 DE 60209589 D1 DE60209589 D1 DE 60209589D1 DE 60209589 T DE60209589 T DE 60209589T DE 60209589 T DE60209589 T DE 60209589T DE 60209589 D1 DE60209589 D1 DE 60209589D1
- Authority
- DE
- Germany
- Prior art keywords
- electronic device
- debugging authorization
- debugging
- authorization
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Security & Cryptography (AREA)
- Software Systems (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Storage Device Security (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001374649A JP2003177938A (ja) | 2001-12-07 | 2001-12-07 | 電子装置及びそのデバッグ認証方法 |
JP2001374649 | 2001-12-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60209589D1 true DE60209589D1 (de) | 2006-05-04 |
DE60209589T2 DE60209589T2 (de) | 2006-08-10 |
Family
ID=19183183
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60209589T Expired - Fee Related DE60209589T2 (de) | 2001-12-07 | 2002-05-08 | Elektronisches Gerät und Verfahren für Fehlerbeseitigungsberechtigung |
Country Status (4)
Country | Link |
---|---|
US (1) | US20030014643A1 (de) |
EP (1) | EP1318456B1 (de) |
JP (1) | JP2003177938A (de) |
DE (1) | DE60209589T2 (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004213216A (ja) * | 2002-12-27 | 2004-07-29 | Renesas Technology Corp | 情報セキュリティマイクロコンピュータ、そのプログラム開発装置およびそれらを含んだプログラム開発システム |
US7248069B2 (en) * | 2003-08-11 | 2007-07-24 | Freescale Semiconductor, Inc. | Method and apparatus for providing security for debug circuitry |
US7321957B2 (en) * | 2003-10-24 | 2008-01-22 | Intel Corporation | Debugging a trusted component in a system |
JP2007226276A (ja) * | 2004-03-24 | 2007-09-06 | Matsushita Electric Ind Co Ltd | デバッグ許可装置システム |
JP3804670B2 (ja) * | 2004-04-21 | 2006-08-02 | セイコーエプソン株式会社 | 半導体装置、電子機器及び半導体装置のアクセス制御方法 |
JP2005346536A (ja) * | 2004-06-04 | 2005-12-15 | Sanyo Electric Co Ltd | 情報処理システム、情報処理システムのデータ取得方法、マイクロコンピュータ |
JP4559794B2 (ja) | 2004-06-24 | 2010-10-13 | 株式会社東芝 | マイクロプロセッサ |
JP2006259810A (ja) * | 2005-03-15 | 2006-09-28 | Matsushita Electric Ind Co Ltd | デバッグ装置 |
US7509250B2 (en) * | 2005-04-20 | 2009-03-24 | Honeywell International Inc. | Hardware key control of debug interface |
US8011005B2 (en) * | 2005-04-20 | 2011-08-30 | Honeywell International Inc. | Hardware encryption key for use in anti-tamper system |
US7900064B2 (en) * | 2005-04-20 | 2011-03-01 | Honeywell International Inc. | Encrypted debug interface |
US7961885B2 (en) * | 2005-04-20 | 2011-06-14 | Honeywell International Inc. | Encrypted JTAG interface |
US7429915B2 (en) * | 2005-04-20 | 2008-09-30 | Honeywell International Inc. | System and method for detecting unauthorized access to electronic equipment or components |
JP4302078B2 (ja) * | 2005-04-28 | 2009-07-22 | 株式会社東芝 | 電子機器 |
US7719419B2 (en) * | 2005-11-02 | 2010-05-18 | Honeywell International Inc. | Intrusion detection using pseudo-random binary sequences |
WO2007053175A1 (en) * | 2005-11-04 | 2007-05-10 | Honeywell International Inc. | Hardware encryption key for use in anti-tamper system |
JP2007140620A (ja) * | 2005-11-15 | 2007-06-07 | Sophia Systems Co Ltd | マイクロコンピュータ及びそのマイクロコンピュータに接続されるデバッグ装置 |
US7436316B2 (en) * | 2006-01-05 | 2008-10-14 | Honeywell International Inc. | Method and system to detect tampering using light detector |
US7388486B2 (en) * | 2006-01-05 | 2008-06-17 | Honeywell International Inc. | Method and system to detect tampering using light detector |
US20070221117A1 (en) * | 2006-03-23 | 2007-09-27 | Honeywell International Inc. | Active protection for closed systems |
US8965281B2 (en) * | 2006-04-05 | 2015-02-24 | Nokia Corporation | Mobile device with near field communication module and secure chip |
EP2023248B1 (de) * | 2006-04-24 | 2018-10-24 | Panasonic Intellectual Property Management Co., Ltd. | Datenverarbeitungseinrichtung, verfahren, programm, integrierte schaltung und programmerzeugungseinrichtung |
US7671324B2 (en) * | 2006-09-27 | 2010-03-02 | Honeywell International Inc. | Anti-tamper enclosure system comprising a photosensitive sensor and optical medium |
US8380966B2 (en) | 2006-11-15 | 2013-02-19 | Qualcomm Incorporated | Method and system for instruction stuffing operations during non-intrusive digital signal processor debugging |
US8533530B2 (en) | 2006-11-15 | 2013-09-10 | Qualcomm Incorporated | Method and system for trusted/untrusted digital signal processor debugging operations |
US7657791B2 (en) | 2006-11-15 | 2010-02-02 | Qualcomm Incorporated | Method and system for a digital signal processor debugging during power transitions |
US8370806B2 (en) | 2006-11-15 | 2013-02-05 | Qualcomm Incorporated | Non-intrusive, thread-selective, debugging method and system for a multi-thread digital signal processor |
US8341604B2 (en) | 2006-11-15 | 2012-12-25 | Qualcomm Incorporated | Embedded trace macrocell for enhanced digital signal processor debugging operations |
US20080129501A1 (en) * | 2006-11-30 | 2008-06-05 | Honeywell International Inc. | Secure chassis with integrated tamper detection sensor |
US7796036B2 (en) * | 2006-11-30 | 2010-09-14 | Honeywell International Inc. | Secure connector with integrated tamper sensors |
US8279075B2 (en) * | 2006-11-30 | 2012-10-02 | Honeywell International Inc. | Card slot anti-tamper protection system |
JP2008191788A (ja) * | 2007-02-01 | 2008-08-21 | Ricoh Co Ltd | 情報処理装置 |
US8284387B2 (en) * | 2007-02-08 | 2012-10-09 | Honeywell International Inc. | Methods and systems for recognizing tamper events |
GB2446831B (en) * | 2007-02-22 | 2011-06-15 | Advanced Risc Mach Ltd | Selective disabling of diagnostic functions within a data processing system |
WO2008117340A1 (ja) * | 2007-03-27 | 2008-10-02 | Fujitsu Limited | デバッグ対象機器、該認証プログラム、及びデバッグ認証方法 |
US8484516B2 (en) | 2007-04-11 | 2013-07-09 | Qualcomm Incorporated | Inter-thread trace alignment method and system for a multi-threaded processor |
US8738905B2 (en) * | 2007-12-10 | 2014-05-27 | International Business Machines Corporation | Third party secured storage for web services and web applications |
US9141776B2 (en) * | 2008-04-30 | 2015-09-22 | Telefonaktiebolaget Lm Ericsson (Publ) | Method and apparatus for secure hardware analysis |
WO2010011399A2 (en) * | 2008-05-14 | 2010-01-28 | Arizona Board Of Regents For And On Behalf Of Arizona State University | Methods and circuits for thwarting semi-invasive and non-invasive integrated circuit security attacks |
JP2010160765A (ja) * | 2009-01-09 | 2010-07-22 | Oki Semiconductor Co Ltd | システムlsi及びこのデバッグ方法 |
US8484451B2 (en) * | 2010-03-11 | 2013-07-09 | St-Ericsson Sa | Method and apparatus for software boot revocation |
GB2500074B (en) * | 2012-07-09 | 2014-08-20 | Ultrasoc Technologies Ltd | Debug architecture |
TWI615708B (zh) * | 2017-03-17 | 2018-02-21 | 致伸科技股份有限公司 | 嵌入式裝置除錯系統及其方法 |
CN111899443B (zh) * | 2020-08-13 | 2022-08-05 | 深圳大势智能科技有限公司 | 传统pos机在智能pos机上调试的方法及装置 |
CN115118509B (zh) * | 2022-06-29 | 2024-06-18 | 国网河南省电力公司电力科学研究院 | 变电站二次设备调试文件权限检测方法及安全管控装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3713107A (en) * | 1972-04-03 | 1973-01-23 | Ncr | Firmware sort processor system |
US5428769A (en) * | 1992-03-31 | 1995-06-27 | The Dow Chemical Company | Process control interface system having triply redundant remote field units |
JPH0855023A (ja) * | 1994-07-25 | 1996-02-27 | Motorola Inc | データ処理システムおよびその方法 |
CN1279449C (zh) * | 1994-12-28 | 2006-10-11 | 株式会社东芝 | 微处理器 |
US5872917A (en) * | 1995-06-07 | 1999-02-16 | America Online, Inc. | Authentication using random challenges |
DE19835609C2 (de) * | 1998-08-06 | 2000-06-08 | Siemens Ag | Programmgesteuerte Einheit |
JP4260984B2 (ja) * | 1999-06-04 | 2009-04-30 | 株式会社東芝 | 情報処理装置および情報処理方法 |
GB9922665D0 (en) * | 1999-09-25 | 1999-11-24 | Hewlett Packard Co | A method of enforcing trusted functionality in a full function platform |
US6769076B1 (en) * | 2000-02-07 | 2004-07-27 | Freescale Semiconductor, Inc. | Real-time processor debug system |
JP4212224B2 (ja) * | 2000-07-10 | 2009-01-21 | 株式会社東芝 | 半導体集積回路 |
US20050144507A1 (en) * | 2000-09-19 | 2005-06-30 | Kuo-Chun Lee | Method and apparatus for remotely debugging an application program over the internet |
US6829751B1 (en) * | 2000-10-06 | 2004-12-07 | Lsi Logic Corporation | Diagnostic architecture using FPGA core in system on a chip design |
-
2001
- 2001-12-07 JP JP2001374649A patent/JP2003177938A/ja active Pending
-
2002
- 2002-03-26 US US10/105,188 patent/US20030014643A1/en not_active Abandoned
- 2002-05-08 DE DE60209589T patent/DE60209589T2/de not_active Expired - Fee Related
- 2002-05-08 EP EP02010420A patent/EP1318456B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1318456B1 (de) | 2006-03-08 |
EP1318456A2 (de) | 2003-06-11 |
US20030014643A1 (en) | 2003-01-16 |
JP2003177938A (ja) | 2003-06-27 |
EP1318456A3 (de) | 2005-01-12 |
DE60209589T2 (de) | 2006-08-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE |
|
8339 | Ceased/non-payment of the annual fee |