DE602006002117D1 - Verfahren und system zur physikochemischen analyse mittels lasergepulster ablation - Google Patents

Verfahren und system zur physikochemischen analyse mittels lasergepulster ablation

Info

Publication number
DE602006002117D1
DE602006002117D1 DE602006002117T DE602006002117T DE602006002117D1 DE 602006002117 D1 DE602006002117 D1 DE 602006002117D1 DE 602006002117 T DE602006002117 T DE 602006002117T DE 602006002117 T DE602006002117 T DE 602006002117T DE 602006002117 D1 DE602006002117 D1 DE 602006002117D1
Authority
DE
Germany
Prior art keywords
ablation
laser
physico
plasma
concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006002117T
Other languages
English (en)
Inventor
Hermite Daniel L
Patrick Mauchien
Jean-Luc Lacour
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of DE602006002117D1 publication Critical patent/DE602006002117D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Laser Surgery Devices (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE602006002117T 2005-02-28 2006-02-22 Verfahren und system zur physikochemischen analyse mittels lasergepulster ablation Active DE602006002117D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0550533A FR2882593B1 (fr) 2005-02-28 2005-02-28 Procede et systeme d'analyse physicochimique a l'aide d'une ablation par pulse laser
PCT/FR2006/050158 WO2006092520A1 (fr) 2005-02-28 2006-02-22 Procédé et système d'analyse physicochimique à l'aide d'une ablation par pulse laser

Publications (1)

Publication Number Publication Date
DE602006002117D1 true DE602006002117D1 (de) 2008-09-18

Family

ID=35169703

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006002117T Active DE602006002117D1 (de) 2005-02-28 2006-02-22 Verfahren und system zur physikochemischen analyse mittels lasergepulster ablation

Country Status (8)

Country Link
US (1) US7944558B2 (de)
EP (1) EP1853898B1 (de)
JP (1) JP4838270B2 (de)
AT (1) ATE403858T1 (de)
DE (1) DE602006002117D1 (de)
ES (1) ES2313640T3 (de)
FR (1) FR2882593B1 (de)
WO (1) WO2006092520A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101084766B1 (ko) 2009-12-30 2011-11-22 광주과학기술원 중금속 분석방법
JP6095901B2 (ja) * 2012-05-24 2017-03-15 株式会社Ihi 物質特定装置および物質特定方法
WO2015037640A1 (ja) * 2013-09-10 2015-03-19 株式会社Ihi 物質特定装置および物質特定方法
FI20155546A (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Menetelmä optisen tien tilan valvomiseksi näytteen optisessa säteilyspektroskooppiassa ja tietokoneohjelma prosessointilaitetta varten
WO2020163963A1 (en) * 2019-02-14 2020-08-20 6684327 Canada Inc. Artificial intelligence-based robotized smart laser ablating systems for multi-dimensional objects
WO2024068925A1 (en) * 2022-09-30 2024-04-04 Advanced Osteotomy Tools - Aot Ag Biological tissue analysis device and method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4690558A (en) * 1984-12-18 1987-09-01 Kawasaki Steel Corporation Method of laser emission spectroscopical analysis and apparatus therefor
US5715053A (en) * 1995-10-23 1998-02-03 Loge; Gary W. Method for determining the concentration of atomic species in gases and solids
JP3377699B2 (ja) * 1996-11-05 2003-02-17 三菱重工業株式会社 レーザを用いた微量成分計測手法及びその装置
IT1306112B1 (it) 1998-03-20 2001-05-29 Consiglio Nazionale Ricerche Metodo per l'analisi quantitativa dei componenti atomici di materialimediante misure di spettroscopia libs senza calibrazione
US6008896A (en) * 1998-07-01 1999-12-28 National Research Council Of Canada Method and apparatus for spectroscopic analysis of heterogeneous materials
JP3160622B2 (ja) * 1998-08-31 2001-04-25 科学技術庁金属材料技術研究所長 プラズマ温度分布測定方法および装置
US6075593A (en) * 1999-08-03 2000-06-13 General Electric Company Method for monitoring and controlling laser shock peening using temporal light spectrum analysis
JP3510561B2 (ja) * 2000-04-28 2004-03-29 三菱重工業株式会社 冷却材金属の漏洩検出方法および漏洩検出器
JP4095360B2 (ja) * 2002-07-10 2008-06-04 Ｔｄｋ株式会社 元素分析方法及び元素分析装置

Also Published As

Publication number Publication date
WO2006092520A1 (fr) 2006-09-08
FR2882593A1 (fr) 2006-09-01
JP2008532030A (ja) 2008-08-14
ES2313640T3 (es) 2009-03-01
ATE403858T1 (de) 2008-08-15
US7944558B2 (en) 2011-05-17
FR2882593B1 (fr) 2007-05-04
JP4838270B2 (ja) 2011-12-14
EP1853898B1 (de) 2008-08-06
EP1853898A1 (de) 2007-11-14
US20080160618A1 (en) 2008-07-03

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