DE602005018794D1 - Vorrichtung zur gewinnung des abbildes und/oder der spektren eines elektronenenergieverlustes - Google Patents
Vorrichtung zur gewinnung des abbildes und/oder der spektren eines elektronenenergieverlustesInfo
- Publication number
- DE602005018794D1 DE602005018794D1 DE602005018794T DE602005018794T DE602005018794D1 DE 602005018794 D1 DE602005018794 D1 DE 602005018794D1 DE 602005018794 T DE602005018794 T DE 602005018794T DE 602005018794 T DE602005018794 T DE 602005018794T DE 602005018794 D1 DE602005018794 D1 DE 602005018794D1
- Authority
- DE
- Germany
- Prior art keywords
- image
- obtaining
- spectros
- photosensitive part
- power loss
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
- H01J2237/2505—Tubes for localised analysis using electron or ion beams characterised by their application
- H01J2237/2516—Secondary particles mass or energy spectrometry
- H01J2237/2522—Secondary particles mass or energy spectrometry of electrons (ESCA, XPS)
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Electric Double-Layer Capacitors Or The Like (AREA)
- Prostheses (AREA)
- Vehicle Body Suspensions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0408633A FR2874124B1 (fr) | 2004-08-04 | 2004-08-04 | Dispositif pour l'acquisition d'images et/ou de spectres de pertes d'energie |
PCT/EP2005/053745 WO2006013199A1 (fr) | 2004-08-04 | 2005-08-01 | Dispositif pour l’acquisition d'images et/ou de spectres de pertes d’energie d’electrons |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602005018794D1 true DE602005018794D1 (de) | 2010-02-25 |
Family
ID=34947514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005018794T Active DE602005018794D1 (de) | 2004-08-04 | 2005-08-01 | Vorrichtung zur gewinnung des abbildes und/oder der spektren eines elektronenenergieverlustes |
Country Status (7)
Country | Link |
---|---|
US (1) | US7642513B2 (de) |
EP (1) | EP1787309B1 (de) |
JP (1) | JP4829887B2 (de) |
AT (1) | ATE454707T1 (de) |
DE (1) | DE602005018794D1 (de) |
FR (1) | FR2874124B1 (de) |
WO (1) | WO2006013199A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8080791B2 (en) * | 2008-12-12 | 2011-12-20 | Fei Company | X-ray detector for electron microscope |
WO2011071579A2 (en) * | 2009-09-18 | 2011-06-16 | California Institute Of Technology | Photon induced near field electron microscope and biological imaging system |
JP5517584B2 (ja) * | 2009-12-08 | 2014-06-11 | 株式会社日立ハイテクノロジーズ | 電子顕微鏡 |
EP2383769A1 (de) | 2010-04-28 | 2011-11-02 | Fei Company | Verfahren zur Verwendung eines Direktelektrondetektors für ein TEM |
US9343275B1 (en) * | 2012-06-06 | 2016-05-17 | Western Digital (Fremont), Llc | Methods for characterizing carbon overcoat |
EP2993682A1 (de) | 2014-09-04 | 2016-03-09 | Fei Company | Verfahren zur Spektroskopiedurchführung in einem Transmissions-Ladungsträger-Mikroskop |
EP2998979A1 (de) | 2014-09-22 | 2016-03-23 | Fei Company | Verbesserte Spektroskopie in einem Transmissionsmikroskop mit geladenen Partikeln |
EP3070732A1 (de) | 2015-03-18 | 2016-09-21 | Fei Company | Vorrichtung und verfahren zur spektroskopiedurchführung in einem transmissionmikroskop mit geladenen teilchen |
JP2017143060A (ja) * | 2016-01-20 | 2017-08-17 | ガタン インコーポレイテッドGatan,Inc. | 直接検出センサを用いる電子エネルギー損失分光器 |
CN111095473B (zh) * | 2017-08-04 | 2022-11-18 | 加坦公司 | 用于高速光谱采集的方法 |
EP3564982A1 (de) * | 2018-05-02 | 2019-11-06 | FEI Company | Technik zur eels-detektion in einem elektronenmikroskop |
KR20220118393A (ko) * | 2019-07-10 | 2022-08-25 | 인터그레이티드 다이나믹 일렉트론 솔루션즈, 인크. | 높은 프레임 레이트 및 높은 동적 범위 전자 현미경 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4831255A (en) * | 1988-02-24 | 1989-05-16 | Gatan, Inc. | Variable-attenuation parallel detector |
JP2759680B2 (ja) * | 1989-07-19 | 1998-05-28 | 株式会社日立製作所 | 分析システム |
JP3439614B2 (ja) * | 1997-03-03 | 2003-08-25 | 株式会社日立製作所 | 透過型電子顕微鏡及び元素分布観察方法 |
JPH1167138A (ja) * | 1997-08-25 | 1999-03-09 | Hitachi Ltd | 微小領域観察装置 |
JP3534582B2 (ja) * | 1997-10-02 | 2004-06-07 | 株式会社日立製作所 | パターン欠陥検査方法および検査装置 |
JP3269524B2 (ja) * | 1998-10-05 | 2002-03-25 | 日本電気株式会社 | 電子エネルギー損失分光分析装置およびそのスペクトルシフト補正方法 |
JP4045058B2 (ja) * | 1999-11-22 | 2008-02-13 | 株式会社日立製作所 | 多重荷電粒子検出器、及びそれを用いた走査透過電子顕微鏡 |
DE10156275B4 (de) * | 2001-11-16 | 2006-08-03 | Leo Elektronenmikroskopie Gmbh | Detektoranordnung und Detektionsverfahren |
JP3789104B2 (ja) * | 2002-05-13 | 2006-06-21 | 株式会社日立ハイテクノロジーズ | 元素分布観察方法及び装置 |
JP2004214057A (ja) * | 2003-01-06 | 2004-07-29 | Hitachi High-Technologies Corp | 電子線分光器、それを備えた電子顕微鏡及び分析方法 |
-
2004
- 2004-08-04 FR FR0408633A patent/FR2874124B1/fr not_active Expired - Fee Related
-
2005
- 2005-08-01 JP JP2007524336A patent/JP4829887B2/ja not_active Expired - Fee Related
- 2005-08-01 AT AT05776167T patent/ATE454707T1/de not_active IP Right Cessation
- 2005-08-01 US US11/659,354 patent/US7642513B2/en active Active
- 2005-08-01 EP EP05776167A patent/EP1787309B1/de not_active Not-in-force
- 2005-08-01 WO PCT/EP2005/053745 patent/WO2006013199A1/fr active Application Filing
- 2005-08-01 DE DE602005018794T patent/DE602005018794D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
EP1787309A1 (de) | 2007-05-23 |
WO2006013199A1 (fr) | 2006-02-09 |
US20080210863A1 (en) | 2008-09-04 |
FR2874124B1 (fr) | 2006-10-13 |
US7642513B2 (en) | 2010-01-05 |
EP1787309B1 (de) | 2010-01-06 |
JP4829887B2 (ja) | 2011-12-07 |
FR2874124A1 (fr) | 2006-02-10 |
ATE454707T1 (de) | 2010-01-15 |
JP2008509510A (ja) | 2008-03-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE602005018794D1 (de) | Vorrichtung zur gewinnung des abbildes und/oder der spektren eines elektronenenergieverlustes | |
TW200701480A (en) | Method and apparatus for processing image data of a color filter array | |
WO2006078738A3 (en) | Method and apparatus for adding signature information to electronic documents | |
DE602005025385D1 (de) | Erstellung inkrementeller Programmaktualisierungen | |
TWI256597B (en) | Image processing apparatus and image processing method | |
EP1558025A3 (de) | Bildaufnahmevorrichtung, -methode und hiermit benutztes Computerprogramm | |
TW200707408A (en) | Systems, methods, and apparatus for anti-sparseness filtering | |
ATE519180T1 (de) | Verfahren zur steuerung eines bilderfassungssystems, bilderfassungssystem und digitalkamera | |
EP1798834A3 (de) | Verfahren und Vorrichtung zum Beglaubigen einer Stromversorgung | |
ATE550739T1 (de) | Bildverarbeitungsgerät und bildverarbeitungsverfahren | |
SG129369A1 (en) | Stage apparatus, lithographic apparatus and devicemanufacturing method | |
WO2011100322A3 (en) | Laser-driven light source | |
TW200643805A (en) | Board inspection apparatus and method and apparatus for setting inspection logic thereof | |
WO2008099629A1 (ja) | 環境認識装置 | |
WO2007140347A3 (en) | Extraction of light from a light conducting medium in a preferred emanation pattern | |
WO2008058671A8 (de) | Projektions-vorrichtung mit verbesserter projektionseigenschaft | |
PH12019502595A1 (en) | Inspection system and game token | |
HK1098591A1 (en) | Method for regulating an output signal and circuit therefor | |
DE112006003522A5 (de) | Vorrichtung zur Erzeugung von elektrischer Energie | |
TW200734810A (en) | Method and apparatus for evaluating photomask, and method for manufacturing semiconductor device | |
DE602008005535D1 (de) | Bildaufnahmesystem, Bildaufnahmevorrichtung und Programm | |
FI20045511A (fi) | Elektroninen laite ja menetelmä elektronisessa laitteessa kuvadatan prosessoimiseksi | |
ATE385013T1 (de) | Überwachungsvorrichtung | |
TW200735671A (en) | Apparatus and method for adjusting saturation of image | |
TW200615506A (en) | Apparatus and method of inspecting unevenness and recording medium |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |