DE602005018372D1 - Kalibrierung für spektroskopische analysen - Google Patents

Kalibrierung für spektroskopische analysen

Info

Publication number
DE602005018372D1
DE602005018372D1 DE602005018372T DE602005018372T DE602005018372D1 DE 602005018372 D1 DE602005018372 D1 DE 602005018372D1 DE 602005018372 T DE602005018372 T DE 602005018372T DE 602005018372 T DE602005018372 T DE 602005018372T DE 602005018372 D1 DE602005018372 D1 DE 602005018372D1
Authority
DE
Germany
Prior art keywords
calibration
spatial light
manipulation means
light manipulation
subject
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005018372T
Other languages
English (en)
Inventor
Wouter Rensen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE602005018372D1 publication Critical patent/DE602005018372D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • G01J2003/047Configuration of two or more entry or exit slits for predetermined delta-lambda
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J2003/1278Mask with spectral selection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE602005018372T 2004-08-26 2005-08-23 Kalibrierung für spektroskopische analysen Active DE602005018372D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04104086 2004-08-26
PCT/IB2005/052760 WO2006021926A1 (en) 2004-08-26 2005-08-23 Calibration for spectroscopic analysis

Publications (1)

Publication Number Publication Date
DE602005018372D1 true DE602005018372D1 (de) 2010-01-28

Family

ID=35241242

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005018372T Active DE602005018372D1 (de) 2004-08-26 2005-08-23 Kalibrierung für spektroskopische analysen

Country Status (7)

Country Link
US (1) US20080309930A1 (de)
EP (1) EP1784624B1 (de)
JP (1) JP2008510984A (de)
CN (1) CN101010574B (de)
AT (1) ATE452330T1 (de)
DE (1) DE602005018372D1 (de)
WO (1) WO2006021926A1 (de)

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CN1898550A (zh) * 2003-12-22 2007-01-17 皇家飞利浦电子股份有限公司 光学分析系统、血液分析系统以及确定主分量幅值的方法
JP2007523321A (ja) 2003-12-31 2007-08-16 ユニヴァーシティー オブ サウスカロライナ 気体及び他の流体のための薄層多孔光センサ
US20070201136A1 (en) 2004-09-13 2007-08-30 University Of South Carolina Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control
WO2006137902A2 (en) * 2004-10-04 2006-12-28 University Of South Carolina Thermal selectivity multivariate optical computing
US7899636B2 (en) * 2004-12-15 2011-03-01 Koninklijke Philips Electronics N.V. Calibration of optical analysis making use of multivariate optical elements
EP1877756B1 (de) * 2005-04-28 2019-04-17 Koninklijke Philips N.V. Spektroskopisches verfahren zur bestimmung der analytmenge in einem analytgemisch
US20070166245A1 (en) * 2005-11-28 2007-07-19 Leonard Mackles Propellant free foamable toothpaste composition
EP1955046A1 (de) 2005-11-28 2008-08-13 University of South Carolina Verfahren zur beobachtung mit hoher geschwindigkeit aufgrund der verwendung multivariater optischer elemente
WO2007061436A1 (en) 2005-11-28 2007-05-31 University Of South Carolina Self calibration methods for optical analysis system
EP1969326B1 (de) 2005-11-28 2020-06-10 Ometric Corporation Optisches analysesystem und verfahren zur optischen mehrvariablen-berechnung in echtzeit
US7623233B2 (en) * 2006-03-10 2009-11-24 Ometric Corporation Optical analysis systems and methods for dynamic, high-speed detection and real-time multivariate optical computing
US9170154B2 (en) 2006-06-26 2015-10-27 Halliburton Energy Services, Inc. Data validation and classification in optical analysis systems
US9182282B2 (en) 2006-11-02 2015-11-10 Halliburton Energy Services, Inc. Multi-analyte optical computing system
EP2087328B1 (de) 2006-11-02 2014-12-17 Ometric Corporation Eigenständiges multivariates optisches datenverarbeitungs- und analysesystem
WO2008121715A1 (en) 2007-03-30 2008-10-09 Ometric Corporation In-line process measurement systems and methods
US8184295B2 (en) 2007-03-30 2012-05-22 Halliburton Energy Services, Inc. Tablet analysis and measurement system
US8213006B2 (en) * 2007-03-30 2012-07-03 Halliburton Energy Services, Inc. Multi-analyte optical computing system
US8283633B2 (en) 2007-11-30 2012-10-09 Halliburton Energy Services, Inc. Tuning D* with modified thermal detectors
US8212213B2 (en) 2008-04-07 2012-07-03 Halliburton Energy Services, Inc. Chemically-selective detector and methods relating thereto
JP5288912B2 (ja) * 2008-07-04 2013-09-11 花王株式会社 皮膚水分量の測定方法
JP5494351B2 (ja) * 2010-08-24 2014-05-14 ソニー株式会社 蛍光強度補正方法、蛍光強度算出方法及び蛍光強度算出装置並びに蛍光強度補正プログラム
US9395306B2 (en) 2011-08-05 2016-07-19 Halliburton Energy Services, Inc. Methods for monitoring fluids within or produced from a subterranean formation during acidizing operations using opticoanalytical devices
US9222892B2 (en) 2011-08-05 2015-12-29 Halliburton Energy Services, Inc. Systems and methods for monitoring the quality of a fluid
US9464512B2 (en) 2011-08-05 2016-10-11 Halliburton Energy Services, Inc. Methods for fluid monitoring in a subterranean formation using one or more integrated computational elements
US9441149B2 (en) 2011-08-05 2016-09-13 Halliburton Energy Services, Inc. Methods for monitoring the formation and transport of a treatment fluid using opticoanalytical devices
US9222348B2 (en) 2011-08-05 2015-12-29 Halliburton Energy Services, Inc. Methods for monitoring the formation and transport of an acidizing fluid using opticoanalytical devices
US9297254B2 (en) 2011-08-05 2016-03-29 Halliburton Energy Services, Inc. Methods for monitoring fluids within or produced from a subterranean formation using opticoanalytical devices
US9182355B2 (en) 2011-08-05 2015-11-10 Halliburton Energy Services, Inc. Systems and methods for monitoring a flow path
US9206386B2 (en) 2011-08-05 2015-12-08 Halliburton Energy Services, Inc. Systems and methods for analyzing microbiological substances
US9261461B2 (en) 2011-08-05 2016-02-16 Halliburton Energy Services, Inc. Systems and methods for monitoring oil/gas separation processes
US9658149B2 (en) 2012-04-26 2017-05-23 Halliburton Energy Services, Inc. Devices having one or more integrated computational elements and methods for determining a characteristic of a sample by computationally combining signals produced therewith
US9383307B2 (en) * 2012-04-26 2016-07-05 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US9080943B2 (en) 2012-04-26 2015-07-14 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance
US9702811B2 (en) 2012-04-26 2017-07-11 Halliburton Energy Services, Inc. Methods and devices for optically determining a characteristic of a substance using integrated computational elements
AU2012389816A1 (en) * 2012-09-13 2015-04-02 Halliburton Energy Services, Inc. Spatial heterodyne integrated computational element (SH-ICE) spectrometer
DE102013105850B4 (de) * 2013-06-06 2021-05-27 Endress+Hauser Conducta Gmbh+Co. Kg Verfahren und Kalibriereinsatz zum Justieren, Kalibrieren und/oder zur Durchführung einer Funktionsüberprüfung eines photometrischen Sensors
US20160123884A1 (en) * 2013-06-11 2016-05-05 Cirtemo, Lld Fluorescence detection device, system and process
CN103499393B (zh) * 2013-09-06 2015-10-21 清华大学 光谱的测量方法
US20170160189A1 (en) * 2013-11-27 2017-06-08 Cirtemo, Llc Optical analysis system and process
US10702619B2 (en) * 2016-05-18 2020-07-07 Asp Global Manufacturing Gmbh Apparatus and method to measure concentration of disinfectant in medical device reprocessing system
CN110582696A (zh) * 2017-05-11 2019-12-17 尼奥里蒂克斯公司 具有自动漂移控制和高动态范围的自适应光学分析仪

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Also Published As

Publication number Publication date
US20080309930A1 (en) 2008-12-18
EP1784624B1 (de) 2009-12-16
JP2008510984A (ja) 2008-04-10
WO2006021926A1 (en) 2006-03-02
CN101010574B (zh) 2010-12-22
EP1784624A1 (de) 2007-05-16
CN101010574A (zh) 2007-08-01
ATE452330T1 (de) 2010-01-15

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