DE602005011512D1 - Massenspektrometer - Google Patents

Massenspektrometer

Info

Publication number
DE602005011512D1
DE602005011512D1 DE602005011512T DE602005011512T DE602005011512D1 DE 602005011512 D1 DE602005011512 D1 DE 602005011512D1 DE 602005011512 T DE602005011512 T DE 602005011512T DE 602005011512 T DE602005011512 T DE 602005011512T DE 602005011512 D1 DE602005011512 D1 DE 602005011512D1
Authority
DE
Germany
Prior art keywords
mass spectrometry
spectrometry
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005011512T
Other languages
English (en)
Inventor
Takahiro Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE602005011512D1 publication Critical patent/DE602005011512D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE602005011512T 2004-03-10 2005-03-09 Massenspektrometer Active DE602005011512D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004066605A JP4151592B2 (ja) 2004-03-10 2004-03-10 質量分析装置

Publications (1)

Publication Number Publication Date
DE602005011512D1 true DE602005011512D1 (de) 2009-01-22

Family

ID=34858331

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005011512T Active DE602005011512D1 (de) 2004-03-10 2005-03-09 Massenspektrometer

Country Status (4)

Country Link
US (1) US6989532B2 (de)
EP (1) EP1580792B1 (de)
JP (1) JP4151592B2 (de)
DE (1) DE602005011512D1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8232521B2 (en) * 2007-02-02 2012-07-31 Waters Technologies Corporation Device and method for analyzing a sample
CN103698198B (zh) * 2013-12-31 2016-08-17 中国科学技术大学 一种多孔材料辅助超声波喷雾离子发生装置及方法
CN110504154B (zh) * 2018-11-25 2020-09-22 中国科学院大连化学物理研究所 一种高气密性离子迁移管
JP7466439B2 (ja) 2020-12-28 2024-04-12 株式会社日立ハイテク イオン源、質量分析計及びキャピラリーの挿入方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5428220A (en) * 1993-11-29 1995-06-27 The United States Of America As Represented By The Secretary Of Commerce Aerosol mass spectrometer and method of classifying aerosol particles according to specific mass
US6166379A (en) * 1997-12-30 2000-12-26 George Washington University Direct injection high efficiency nebulizer for analytical spectrometry
US6207955B1 (en) 1998-09-28 2001-03-27 Varian, Inc. Pneumatically assisted electrospray device with alternating pressure gradients for mass spectrometry
JP3954361B2 (ja) * 2001-11-13 2007-08-08 株式会社ナノ・ソリューション マイクロスプレーカラムと質量分析計及び質量分析方法
US6825462B2 (en) * 2002-02-22 2004-11-30 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
JP2003331776A (ja) * 2002-05-10 2003-11-21 Hitachi Ltd イオン源および質量分析装置および質量分析方法

Also Published As

Publication number Publication date
JP2005259400A (ja) 2005-09-22
US6989532B2 (en) 2006-01-24
JP4151592B2 (ja) 2008-09-17
EP1580792A3 (de) 2006-08-02
US20050199800A1 (en) 2005-09-15
EP1580792A2 (de) 2005-09-28
EP1580792B1 (de) 2008-12-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition