DE602004024894D1 - Messverfahren für dreidimensionale form und messvorrichtung dafür - Google Patents

Messverfahren für dreidimensionale form und messvorrichtung dafür

Info

Publication number
DE602004024894D1
DE602004024894D1 DE602004024894T DE602004024894T DE602004024894D1 DE 602004024894 D1 DE602004024894 D1 DE 602004024894D1 DE 602004024894 T DE602004024894 T DE 602004024894T DE 602004024894 T DE602004024894 T DE 602004024894T DE 602004024894 D1 DE602004024894 D1 DE 602004024894D1
Authority
DE
Germany
Prior art keywords
measuring
device therefor
dimensional form
measuring device
measuring process
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004024894T
Other languages
English (en)
Inventor
Kensaku Kaneyasu
Eisaku Hasegawa
Toshiyuki Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honda Motor Co Ltd
Original Assignee
Honda Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honda Motor Co Ltd filed Critical Honda Motor Co Ltd
Publication of DE602004024894D1 publication Critical patent/DE602004024894D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE602004024894T 2003-06-30 2004-06-24 Messverfahren für dreidimensionale form und messvorrichtung dafür Active DE602004024894D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003187247A JP3817530B2 (ja) 2003-06-30 2003-06-30 ３次元形状測定方法及びその測定装置
PCT/JP2004/008890 WO2005001375A1 (ja) 2003-06-30 2004-06-24 ３次元形状測定方法及びその測定装置

Publications (1)

Publication Number Publication Date
DE602004024894D1 true DE602004024894D1 (de) 2010-02-11

Family

ID=33549717

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004024894T Active DE602004024894D1 (de) 2003-06-30 2004-06-24 Messverfahren für dreidimensionale form und messvorrichtung dafür

Country Status (7)

Country Link
US (1) US7321841B2 (de)
EP (1) EP1650530B8 (de)
JP (1) JP3817530B2 (de)
KR (1) KR100752998B1 (de)
CN (1) CN100375888C (de)
DE (1) DE602004024894D1 (de)
WO (1) WO2005001375A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4595042B2 (ja) * 2005-09-30 2010-12-08 コニカミノルタセンシング株式会社 ３次元測定方法およびシステム並びにマニピュレータの制御方法および装置
US7773218B2 (en) * 2006-04-17 2010-08-10 Duke University Spatially-registered wavelength coding
TW200813233A (en) * 2006-09-12 2008-03-16 China Steel Corp Method for measuring blast furnace material surface shape and material flow track by laser ranging technology
EP2097711A2 (de) * 2006-11-30 2009-09-09 Faro Technologies, Inc. Tragbare koordinatenmessmaschine
ITBG20070005A1 (it) * 2007-01-18 2008-07-19 Costanzo Perico Gruppo per l'analisi di una superficie tridimensionale di un manufatto e macchina comprendente tale gruppo.
US7512457B2 (en) * 2007-03-06 2009-03-31 The Boeing Company In-process non-contact measuring systems and methods for automated lapping systems
CN100540235C (zh) * 2007-06-29 2009-09-16 于复生 轴承外径尺寸挑选机器人
CN101685005B (zh) * 2008-09-23 2011-08-10 廊坊市威达科技发展有限公司 汽车轮廓尺寸测量机
JP4705142B2 (ja) * 2008-10-10 2011-06-22 パナソニック株式会社 ３次元形状測定方法
US7908757B2 (en) 2008-10-16 2011-03-22 Hexagon Metrology, Inc. Articulating measuring arm with laser scanner
US8903547B2 (en) * 2009-03-11 2014-12-02 Honda Motor Co., Ltd. Working device and working method
JP6052956B2 (ja) 2012-07-02 2016-12-27 株式会社ミツトヨ 形状解析方法および形状解析プログラム
EP2705935A1 (de) 2012-09-11 2014-03-12 Hexagon Technology Center GmbH Koordinatenmessmaschine
KR102007772B1 (ko) 2012-12-28 2019-08-06 엘지전자 주식회사 3차원 공간 측정 장치 및 동작 방법
EP3054265B1 (de) 2015-02-04 2022-04-20 Hexagon Technology Center GmbH Koordinatenmessmaschine
US9575183B2 (en) * 2015-03-31 2017-02-21 The Boeing Company Tracking measurement system and method
JP6514041B2 (ja) * 2015-06-02 2019-05-15 株式会社ミツトヨ 形状測定装置の制御方法
EP3710778A1 (de) 2017-11-13 2020-09-23 Hexagon Metrology, Inc Thermische verwaltung einer optischen abtastvorrichtung
CN108132647A (zh) * 2017-11-29 2018-06-08 杭州亘元汽轮机叶片有限公司 一种汽轮机弧形叶片的加工方法
CN108195336B (zh) * 2017-12-26 2020-10-09 深圳市宇恒互动科技开发有限公司 物体三维外形的感测方法、装置及系统
CN110145318A (zh) * 2019-05-17 2019-08-20 中国铁建重工集团股份有限公司 一种盾构机上盾体变形检测及在线矫正的方法
CN111521153B (zh) * 2020-07-02 2022-09-13 上海雄程海洋工程股份有限公司 沉桩过程中的桩参数的测量方法
CN112923889B (zh) * 2021-01-26 2023-03-14 杭州思锐迪科技有限公司 扫描方法、装置、三维扫描系统、电子装置和存储介质
KR102557540B1 (ko) 2023-04-14 2023-07-21 에프이시스템주식회사 제염대상체 형상 측정장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6198406A (ja) * 1984-10-19 1986-05-16 Tokico Ltd 工業用ロボツト
GB2174216B (en) 1985-03-19 1988-10-26 Mitutoyo Mfg Co Ltd Method of operating a coordinate measuring instrument
JPH06274221A (ja) * 1993-03-18 1994-09-30 Shin Meiwa Ind Co Ltd 産業用ロボットにおけるプログラムデータコピー方法
JPH08338717A (ja) * 1995-06-14 1996-12-24 Nikon Corp 三次元座標測定装置
JP4038334B2 (ja) * 1998-08-28 2008-01-23 株式会社ミツトヨ 座標及び表面性状測定におけるパートプログラムの解析及びパートプログラムの作成に関する装置及び方法
NO313113B1 (no) 1999-07-13 2002-08-12 Metronor Asa System for scanning av store objekters geometri
CN1230660C (zh) * 2000-09-22 2005-12-07 沃思测量技术股份有限公司 借助坐标测量仪测量物体几何形状的方法
US6651029B2 (en) * 2000-12-05 2003-11-18 Kabushiki Kaisha Sankyo Seiki Seisakusho Apparatus and method for measuring surface shape

Also Published As

Publication number Publication date
JP2005024292A (ja) 2005-01-27
US20060161382A1 (en) 2006-07-20
CN100375888C (zh) 2008-03-19
JP3817530B2 (ja) 2006-09-06
CN1816729A (zh) 2006-08-09
EP1650530A1 (de) 2006-04-26
KR20060030068A (ko) 2006-04-07
EP1650530B8 (de) 2010-03-10
US7321841B2 (en) 2008-01-22
KR100752998B1 (ko) 2007-08-30
EP1650530B1 (de) 2009-12-30
EP1650530A4 (de) 2006-12-06
WO2005001375A1 (ja) 2005-01-06

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Legal Events

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