DE602004024168D1 - Belichtungssystem und belichtungsverfahren - Google Patents
Belichtungssystem und belichtungsverfahrenInfo
- Publication number
- DE602004024168D1 DE602004024168D1 DE602004024168T DE602004024168T DE602004024168D1 DE 602004024168 D1 DE602004024168 D1 DE 602004024168D1 DE 602004024168 T DE602004024168 T DE 602004024168T DE 602004024168 T DE602004024168 T DE 602004024168T DE 602004024168 D1 DE602004024168 D1 DE 602004024168D1
- Authority
- DE
- Germany
- Prior art keywords
- mask
- optical system
- image
- projection
- field stop
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 abstract 4
- 230000002411 adverse Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 abstract 1
- 238000005286 illumination Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/702—Reflective illumination, i.e. reflective optical elements other than folding mirrors, e.g. extreme ultraviolet [EUV] illumination systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Liquid Crystal Substances (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003003868 | 2003-01-10 | ||
PCT/JP2004/000129 WO2004064128A1 (ja) | 2003-01-10 | 2004-01-09 | 露光装置および露光方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004024168D1 true DE602004024168D1 (de) | 2009-12-31 |
Family
ID=32708922
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004024168T Expired - Lifetime DE602004024168D1 (de) | 2003-01-10 | 2004-01-09 | Belichtungssystem und belichtungsverfahren |
Country Status (6)
Country | Link |
---|---|
US (1) | US7023523B2 (de) |
EP (1) | EP1585169B1 (de) |
JP (1) | JP4822417B2 (de) |
AT (1) | ATE449417T1 (de) |
DE (1) | DE602004024168D1 (de) |
WO (1) | WO2004064128A1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7312851B2 (en) * | 2004-06-23 | 2007-12-25 | Nikon Corporation | Projection optical system, exposure apparatus, and exposure method in which a reflective projection optical system has a non-circular aperture stop |
JP5007538B2 (ja) * | 2006-08-30 | 2012-08-22 | 株式会社ニコン | 露光装置、デバイスの製造方法及び露光方法 |
DE102008002377A1 (de) * | 2007-07-17 | 2009-01-22 | Carl Zeiss Smt Ag | Beleuchtungssystem sowie Projektionsbelichtungsanlage für die Mikrolithografie mit einem derartigen Beleuchtungssystem |
JP5061063B2 (ja) | 2008-05-20 | 2012-10-31 | ギガフォトン株式会社 | 極端紫外光用ミラーおよび極端紫外光源装置 |
KR20130083833A (ko) * | 2010-04-02 | 2013-07-23 | 가부시키가이샤 니콘 | 광원 장치, 광학 장치, 노광 장치, 디바이스 제조 방법, 조명 방법, 노광 방법, 및 광학 장치의 제조 방법 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5315629A (en) * | 1990-10-10 | 1994-05-24 | At&T Bell Laboratories | Ringfield lithography |
US5583609A (en) * | 1993-04-23 | 1996-12-10 | Nikon Corporation | Projection exposure apparatus |
US5729331A (en) * | 1993-06-30 | 1998-03-17 | Nikon Corporation | Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus |
JP3057998B2 (ja) * | 1994-02-16 | 2000-07-04 | キヤノン株式会社 | 照明装置及びそれを用いた投影露光装置 |
JP3358097B2 (ja) * | 1994-04-12 | 2002-12-16 | 株式会社ニコン | X線投影露光装置 |
JP3624523B2 (ja) * | 1996-03-06 | 2005-03-02 | 株式会社ニコン | X線投影露光装置 |
JPH1092727A (ja) * | 1996-09-11 | 1998-04-10 | Canon Inc | 投影露光装置 |
JP2000091220A (ja) * | 1998-09-08 | 2000-03-31 | Nikon Corp | 投影露光装置及び投影露光方法 |
JP2000286191A (ja) * | 1999-03-31 | 2000-10-13 | Nikon Corp | 露光装置および露光方法ならびにデバイス製造方法 |
JP2000349009A (ja) * | 1999-06-04 | 2000-12-15 | Nikon Corp | 露光方法及び装置 |
JP2000356855A (ja) * | 1999-06-15 | 2000-12-26 | Nikon Corp | 照明領域設定装置および露光装置 |
JP3363882B2 (ja) * | 2000-10-17 | 2003-01-08 | 株式会社日立製作所 | 露光装置 |
-
2004
- 2004-01-09 AT AT04701103T patent/ATE449417T1/de not_active IP Right Cessation
- 2004-01-09 WO PCT/JP2004/000129 patent/WO2004064128A1/ja active Application Filing
- 2004-01-09 JP JP2005507991A patent/JP4822417B2/ja not_active Expired - Lifetime
- 2004-01-09 EP EP04701103A patent/EP1585169B1/de not_active Expired - Lifetime
- 2004-01-09 DE DE602004024168T patent/DE602004024168D1/de not_active Expired - Lifetime
-
2005
- 2005-07-07 US US11/177,141 patent/US7023523B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20050264789A1 (en) | 2005-12-01 |
JPWO2004064128A1 (ja) | 2006-05-18 |
US7023523B2 (en) | 2006-04-04 |
EP1585169A1 (de) | 2005-10-12 |
EP1585169A4 (de) | 2007-07-18 |
JP4822417B2 (ja) | 2011-11-24 |
ATE449417T1 (de) | 2009-12-15 |
WO2004064128A1 (ja) | 2004-07-29 |
EP1585169B1 (de) | 2009-11-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |