DE602004012031D1 - Detektionseinheit zur Röntgenstreumessung - Google Patents

Detektionseinheit zur Röntgenstreumessung

Info

Publication number
DE602004012031D1
DE602004012031D1 DE602004012031T DE602004012031T DE602004012031D1 DE 602004012031 D1 DE602004012031 D1 DE 602004012031D1 DE 602004012031 T DE602004012031 T DE 602004012031T DE 602004012031 T DE602004012031 T DE 602004012031T DE 602004012031 D1 DE602004012031 D1 DE 602004012031D1
Authority
DE
Germany
Prior art keywords
detection unit
ray scattering
scattering measurement
measurement
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602004012031T
Other languages
English (en)
Other versions
DE602004012031T2 (de
Inventor
Muradin A Kumakhov
Nariman S Ibraimov
Alexander V Lyuttsau
Ekaterina V Likhushina
Alexander E Bulkin
Svetlana V Nikitina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OBSHCHESTVO S OGRANICHENNOJ OT
Original Assignee
OBSHCHESTVO S OGRANICHENNOJ OT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OBSHCHESTVO S OGRANICHENNOJ OT filed Critical OBSHCHESTVO S OGRANICHENNOJ OT
Publication of DE602004012031D1 publication Critical patent/DE602004012031D1/de
Application granted granted Critical
Publication of DE602004012031T2 publication Critical patent/DE602004012031T2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
DE602004012031T 2003-08-19 2004-06-07 Detektionseinheit zur Röntgenstreumessung Expired - Fee Related DE602004012031T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
RU2003125341/28A RU2242748C1 (ru) 2003-08-19 2003-08-19 Детектирующий узел для рентгеновских дифракционных измерений
RU2003125341 2003-08-19

Publications (2)

Publication Number Publication Date
DE602004012031D1 true DE602004012031D1 (de) 2008-04-10
DE602004012031T2 DE602004012031T2 (de) 2009-03-19

Family

ID=34057076

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004012031T Expired - Fee Related DE602004012031T2 (de) 2003-08-19 2004-06-07 Detektionseinheit zur Röntgenstreumessung

Country Status (5)

Country Link
US (1) US7149279B2 (de)
EP (1) EP1508800B1 (de)
CN (1) CN1590992A (de)
DE (1) DE602004012031T2 (de)
RU (1) RU2242748C1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7231017B2 (en) * 2005-07-27 2007-06-12 Physical Optics Corporation Lobster eye X-ray imaging system and method of fabrication thereof
US20080159479A1 (en) * 2006-08-10 2008-07-03 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
US20100329424A1 (en) * 2009-06-30 2010-12-30 Geoffrey Harding X-ray diffraction imaging system and method for operating the same
KR101239765B1 (ko) * 2011-02-09 2013-03-06 삼성전자주식회사 엑스레이 발생장치 및 이를 포함하는 엑스레이 촬영 시스템
JP5492173B2 (ja) * 2011-11-11 2014-05-14 株式会社リガク 回折ｘ線検出方法およびｘ線回折装置
GB2496484B (en) 2011-11-11 2016-04-06 Rigaku Denki Co Ltd X-Ray intensity correction method and x-ray diffractometer
JP5695589B2 (ja) * 2012-03-02 2015-04-08 株式会社リガク Ｘ線強度補正方法およびｘ線回折装置
US9939393B2 (en) 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
JP6155538B2 (ja) * 2015-11-30 2017-07-05 パルステック工業株式会社 Ｘ線回折測定装置及びｘ線回折測定方法
DE102017223228B3 (de) 2017-12-19 2018-12-27 Bruker Axs Gmbh Aufbau zur ortsaufgelösten Messung mit einem wellenlängendispersiven Röntgenspektrometer
CN109374660A (zh) * 2018-11-22 2019-02-22 北京科技大学 用于排笔光束的高通量粉末衍射的装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2635192A (en) * 1949-10-24 1953-04-14 Babcock & Wilcox Co Fluorescent spectral analysis
US3154684A (en) * 1960-06-22 1964-10-27 Lab For Electronics Inc X-ray analysis system with means to detect only the coherently scattered X-rays
AT346629B (de) * 1972-01-28 1978-11-27 Efanov Valery P Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
US4958081A (en) * 1985-08-14 1990-09-18 Siemens Gammasonics, Inc. Focusing collimator and method for making it
US5007072A (en) * 1988-08-03 1991-04-09 Ion Track Instruments X-ray diffraction inspection system
DE4034602A1 (de) * 1990-06-20 1992-05-07 Philips Patentverwaltung Anordnung zur messung des impulsuebertragsspektrums von roentgenquanten
EP0556887B1 (de) * 1992-02-06 1998-07-08 Philips Patentverwaltung GmbH Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
US5373544A (en) * 1992-08-12 1994-12-13 Siemens Aktiengesellschaft X-ray diffractometer
EP0617431B1 (de) * 1993-03-25 1997-05-14 Seiko Instruments Inc. Röntgenstrahlen-Analysegerät
RU2096353C1 (ru) 1994-02-28 1997-11-20 Мурадин Абубекирович Кумахов Способ изготовления поликапиллярной жесткой волоконно-оптической структуры или элемента и устройство для управления рентгеновским и другими видами излучения
WO1996002058A1 (fr) * 1994-07-08 1996-01-25 Muradin Abubekirovich Kumakhov Procede de guidage de faisceaux de particules neutres et chargees et son dispositif de mise en ×uvre
GB9414518D0 (en) * 1994-07-19 1994-09-07 Univ Leicester Microchannel plates
US5747821A (en) * 1995-08-04 1998-05-05 X-Ray Optical Systems, Inc. Radiation focusing monocapillary with constant inner dimension region and varying inner dimension region
CN1069136C (zh) * 1996-02-17 2001-08-01 北京师范大学 整体x光透镜及其制造方法及使用整体x光透镜的设备
US5933473A (en) * 1996-04-04 1999-08-03 Hitachi, Ltd. Non-destructive inspection apparatus and inspection system using it
US6069934A (en) * 1998-04-07 2000-05-30 Osmic, Inc. X-ray diffractometer with adjustable image distance
DE19954663B4 (de) * 1999-11-13 2006-06-08 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Bestimmung eines Materials eines detektierten Gegenstandes

Also Published As

Publication number Publication date
DE602004012031T2 (de) 2009-03-19
EP1508800A1 (de) 2005-02-23
RU2003125341A (ru) 2005-02-20
EP1508800B1 (de) 2008-02-27
US7149279B2 (en) 2006-12-12
US20050041776A1 (en) 2005-02-24
RU2242748C1 (ru) 2004-12-20
CN1590992A (zh) 2005-03-09

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee
8364 No opposition during term of opposition