DE60144049D1 - Verfahren zur ablagerung einer fluordotierten siliziumdioxidschicht - Google Patents

Verfahren zur ablagerung einer fluordotierten siliziumdioxidschicht

Info

Publication number
DE60144049D1
DE60144049D1 DE60144049T DE60144049T DE60144049D1 DE 60144049 D1 DE60144049 D1 DE 60144049D1 DE 60144049 T DE60144049 T DE 60144049T DE 60144049 T DE60144049 T DE 60144049T DE 60144049 D1 DE60144049 D1 DE 60144049D1
Authority
DE
Germany
Prior art keywords
silicon
fluorotoded
depositing
silicon dioxide
dioxide layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60144049T
Other languages
English (en)
Inventor
Karin Scherer
Pascale Lacan
Richard Bosmans
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EssilorLuxottica SA
Original Assignee
Essilor International Compagnie Generale dOptique SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Essilor International Compagnie Generale dOptique SA filed Critical Essilor International Compagnie Generale dOptique SA
Application granted granted Critical
Publication of DE60144049D1 publication Critical patent/DE60144049D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/10—Glass or silica

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physical Vapour Deposition (AREA)
  • Surface Treatment Of Optical Elements (AREA)
  • Silicon Compounds (AREA)
  • Glass Compositions (AREA)
  • Laminated Bodies (AREA)
  • Photovoltaic Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
DE60144049T 2000-08-01 2001-07-31 Verfahren zur ablagerung einer fluordotierten siliziumdioxidschicht Expired - Lifetime DE60144049D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0010149A FR2812664B1 (fr) 2000-08-01 2000-08-01 Procede de depot d'une couche de silice dopee au fluor et son application en optique ophtalmique
PCT/FR2001/002505 WO2002011195A1 (fr) 2000-08-01 2001-07-31 Procede de depot d'une couche de silice dopee au fluor

Publications (1)

Publication Number Publication Date
DE60144049D1 true DE60144049D1 (de) 2011-03-31

Family

ID=8853198

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60144049T Expired - Lifetime DE60144049D1 (de) 2000-08-01 2001-07-31 Verfahren zur ablagerung einer fluordotierten siliziumdioxidschicht

Country Status (8)

Country Link
US (1) US6797649B2 (de)
EP (1) EP1307907B1 (de)
JP (1) JP5027980B2 (de)
AT (1) ATE498903T1 (de)
AU (1) AU2001284090A1 (de)
DE (1) DE60144049D1 (de)
FR (1) FR2812664B1 (de)
WO (1) WO2002011195A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6355580B1 (en) * 1998-09-03 2002-03-12 Micron Technology, Inc. Ion-assisted oxidation methods and the resulting structures
FR2843407B1 (fr) * 2002-08-08 2005-04-22 Procede d'obtention d'une couche mince, stabilisee, de silice dopee au fluor, couche mince obtenue et leur application en optique ophtalmique
FR2843406A1 (fr) * 2002-08-08 2004-02-13 Essilor Int Procede d'obtention d'une couche mince, stabilisee, de silice dopee au fluor, couche mince obtenue et leur application en optique ophtalmique
KR101151813B1 (ko) * 2002-08-08 2012-06-01 에실러에떼르나쇼날(꽁빠니제네랄돕띠끄) 안정화된 플루오르 도핑 실리카 박층 형성 방법, 동 형성 방법에 의해 형성된 박층, 및 그의 안경 광학에 대한 용도
US6872479B2 (en) * 2003-04-11 2005-03-29 Corning Incorporated Coated optics to improve durability
FR2859487B1 (fr) * 2003-09-04 2006-12-15 Essilor Int Procede de depot d'une couche amorphe contenant majoritairement du fluor et du carbone et dispositif convenant a sa mise en oeuvre
DE102007004844B4 (de) * 2007-01-31 2011-05-05 Infineon Technologies Ag Verfahren zur Herstellung eines Bauteils und Bauteil
WO2013152031A1 (en) * 2012-04-04 2013-10-10 Kla-Tencor Corporation Protective fluorine-doped silicon oxide film for optical components
CN113439222B (zh) 2019-02-05 2023-10-13 蒙特利尔综合理工学院公司 涂覆有基于氟化有机硅化合物的低折射率层的制品
US20220049345A1 (en) * 2020-08-17 2022-02-17 Kla Corporation Fluorine-doped optical materials for optical components
DE102021200747A1 (de) * 2021-01-28 2022-07-28 Carl Zeiss Smt Gmbh Verfahren zum Bilden einer Schicht, optisches Element und optisches System

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4008383A1 (de) * 1989-03-16 1990-09-20 Tosoh Corp Achromat fuer ultraviolettstrahlen
JPH03202461A (ja) * 1989-12-29 1991-09-04 Nissin Electric Co Ltd 高絶縁酸化ケイ素薄膜の形成方法
JP3152829B2 (ja) * 1994-01-18 2001-04-03 株式会社東芝 半導体装置の製造方法
JPH08337435A (ja) * 1995-06-14 1996-12-24 Hitachi Cable Ltd 石英系ガラス膜の製造方法
US6042901A (en) * 1996-02-20 2000-03-28 Lam Research Corporation Method for depositing fluorine doped silicon dioxide films
US6001728A (en) * 1996-03-15 1999-12-14 Applied Materials, Inc. Method and apparatus for improving film stability of halogen-doped silicon oxide films
JPH11326185A (ja) 1998-05-12 1999-11-26 Nippon Sheet Glass Co Ltd 液滴検出装置

Also Published As

Publication number Publication date
FR2812664B1 (fr) 2002-11-08
ATE498903T1 (de) 2011-03-15
US20040092131A1 (en) 2004-05-13
EP1307907A1 (de) 2003-05-07
WO2002011195A1 (fr) 2002-02-07
FR2812664A1 (fr) 2002-02-08
US6797649B2 (en) 2004-09-28
JP2004505179A (ja) 2004-02-19
JP5027980B2 (ja) 2012-09-19
AU2001284090A1 (en) 2002-02-13
EP1307907B1 (de) 2011-02-16

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