DE60139219D1 - Dynamisch konfigurierbare Debug-Schnittstelle mit gleichzeitiger Verwendung von Fehlerbeseitigung von mehreren Prozessorkernen - Google Patents
Dynamisch konfigurierbare Debug-Schnittstelle mit gleichzeitiger Verwendung von Fehlerbeseitigung von mehreren ProzessorkernenInfo
- Publication number
- DE60139219D1 DE60139219D1 DE60139219T DE60139219T DE60139219D1 DE 60139219 D1 DE60139219 D1 DE 60139219D1 DE 60139219 T DE60139219 T DE 60139219T DE 60139219 T DE60139219 T DE 60139219T DE 60139219 D1 DE60139219 D1 DE 60139219D1
- Authority
- DE
- Germany
- Prior art keywords
- pin
- data processing
- integrated circuit
- processing core
- multiple cores
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/22—Means for limiting or controlling the pin/gate ratio
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
- G06F11/3466—Performance evaluation by tracing or monitoring
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Debugging And Monitoring (AREA)
- Time-Division Multiplex Systems (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US21934000P | 2000-03-02 | 2000-03-02 | |
US51509300A | 2000-03-02 | 2000-03-02 | |
US18632600P | 2000-03-02 | 2000-03-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60139219D1 true DE60139219D1 (de) | 2009-08-27 |
Family
ID=27392080
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60118089T Expired - Lifetime DE60118089T2 (de) | 2000-03-02 | 2001-03-02 | Abtastschnittstelle mit Zeitmultiplexmerkmal zur Signalüberlagerung |
DE60139219T Expired - Lifetime DE60139219D1 (de) | 2000-03-02 | 2001-03-02 | Dynamisch konfigurierbare Debug-Schnittstelle mit gleichzeitiger Verwendung von Fehlerbeseitigung von mehreren Prozessorkernen |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60118089T Expired - Lifetime DE60118089T2 (de) | 2000-03-02 | 2001-03-02 | Abtastschnittstelle mit Zeitmultiplexmerkmal zur Signalüberlagerung |
Country Status (2)
Country | Link |
---|---|
EP (4) | EP1139220B1 (de) |
DE (2) | DE60118089T2 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7702964B2 (en) * | 2004-05-11 | 2010-04-20 | Qualcomm Incorporated | Compression of data traces for an integrated circuit with multiple memories |
DE502005001065D1 (de) * | 2005-05-02 | 2007-08-30 | Accemic Gmbh & Co Kg | Verfahren und Vorrichtung zur Emulation einer programmierbaren Einheit |
DE102007017865A1 (de) | 2007-04-13 | 2008-11-13 | Dspace Digital Signal Processing And Control Engineering Gmbh | Adaptions-Element und Testanordnung sowie Verfahren zum Betrieb derselben |
CN103136138B (zh) * | 2011-11-24 | 2015-07-01 | 炬力集成电路设计有限公司 | 一种芯片、芯片调试方法以及芯片与外部设备通信的方法 |
GB2501333B (en) | 2012-07-09 | 2014-03-05 | Ultrasoc Technologies Ltd | Debug architecture |
US9400704B2 (en) | 2013-06-12 | 2016-07-26 | Globalfoundries Inc. | Implementing distributed debug data collection and analysis for a shared adapter in a virtualized system |
US9111046B2 (en) | 2013-06-12 | 2015-08-18 | International Business Machines Corporation | Implementing capacity and user-based resource allocation for a shared adapter in a virtualized system |
US9720775B2 (en) | 2013-06-12 | 2017-08-01 | International Business Machines Corporation | Implementing concurrent adapter firmware update for an SRIOV adapter in a virtualized system |
US9323620B2 (en) | 2013-06-12 | 2016-04-26 | International Business Machines Corporation | Implementing shared adapter configuration updates concurrent with maintenance actions in a virtualized system |
US9317317B2 (en) | 2013-06-12 | 2016-04-19 | International Business Machines Corporation | Implementing concurrent device driver maintenance and recovery for an SRIOV adapter in a virtualized system |
US9304849B2 (en) | 2013-06-12 | 2016-04-05 | International Business Machines Corporation | Implementing enhanced error handling of a shared adapter in a virtualized system |
WO2016080969A1 (en) * | 2014-11-18 | 2016-05-26 | Hewlett Packard Enterprise Development Lp | User interface overlay |
US10073137B2 (en) | 2016-08-02 | 2018-09-11 | Qualcomm Incorporated | Soundwire-based embedded debugging in an electronic device |
CN111209193B (zh) * | 2019-12-30 | 2023-09-22 | 北京水滴科技集团有限公司 | 程序的调试方法及装置 |
CN114062896A (zh) * | 2021-11-11 | 2022-02-18 | 深圳市慧邦电子科技有限公司 | 一种集成电路的成品测试方法和存储介质 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4703484A (en) * | 1985-12-19 | 1987-10-27 | Harris Corporation | Programmable integrated circuit fault detection apparatus |
JPH01259274A (ja) * | 1988-04-08 | 1989-10-16 | Fujitsu Ltd | 集積回路の試験方式 |
GB2218816B (en) * | 1988-05-19 | 1992-07-29 | Plessey Co Plc | Improvements in and relating to methods of testing integrated circuits |
US5369645A (en) * | 1991-07-02 | 1994-11-29 | Hewlett-Packard Company | Testing integrated circuit pad input and output structures |
JPH06214821A (ja) * | 1992-03-02 | 1994-08-05 | Motorola Inc | 逐次自己アドレス解読機能を有するデ−タ処理システムとその動作方法 |
US5513186A (en) * | 1993-12-07 | 1996-04-30 | Sun Microsystems, Inc. | Method and apparatus for interconnect testing without speed degradation |
CN1122226C (zh) * | 1994-12-28 | 2003-09-24 | 株式会社东芝 | 微处理器与调试系统 |
US5615357A (en) * | 1994-12-29 | 1997-03-25 | Sun Microsystems, Inc. | System and method for verifying processor performance |
US5729726A (en) * | 1995-10-02 | 1998-03-17 | International Business Machines Corporation | Method and system for performance monitoring efficiency of branch unit operation in a processing system |
US5832490A (en) * | 1996-05-31 | 1998-11-03 | Siemens Medical Systems, Inc. | Lossless data compression technique that also facilitates signal analysis |
US5848264A (en) * | 1996-10-25 | 1998-12-08 | S3 Incorporated | Debug and video queue for multi-processor chip |
US6154857A (en) * | 1997-04-08 | 2000-11-28 | Advanced Micro Devices, Inc. | Microprocessor-based device incorporating a cache for capturing software performance profiling data |
US5978902A (en) * | 1997-04-08 | 1999-11-02 | Advanced Micro Devices, Inc. | Debug interface including operating system access of a serial/parallel debug port |
US5943490A (en) * | 1997-05-30 | 1999-08-24 | Quickturn Design Systems, Inc. | Distributed logic analyzer for use in a hardware logic emulation system |
GB9805479D0 (en) | 1998-03-13 | 1998-05-13 | Sgs Thomson Microelectronics | Microcomputer |
EP1088239B1 (de) | 1998-06-16 | 2006-05-31 | Infineon Technologies AG | Einrichtung zur vermessung und analyse von elektrischen signalen eines integrierten schaltungsbausteins |
-
2001
- 2001-03-02 EP EP01200792.8A patent/EP1139220B1/de not_active Expired - Lifetime
- 2001-03-02 DE DE60118089T patent/DE60118089T2/de not_active Expired - Lifetime
- 2001-03-02 EP EP01000035A patent/EP1130501B1/de not_active Expired - Lifetime
- 2001-03-02 DE DE60139219T patent/DE60139219D1/de not_active Expired - Lifetime
- 2001-03-02 EP EP01200793.6A patent/EP1132816B1/de not_active Expired - Lifetime
- 2001-03-02 EP EP01200790A patent/EP1139108B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1130501B1 (de) | 2009-07-15 |
EP1130501A1 (de) | 2001-09-05 |
EP1139108A3 (de) | 2004-01-02 |
EP1139220A3 (de) | 2009-10-28 |
EP1132816A2 (de) | 2001-09-12 |
EP1139220B1 (de) | 2017-10-25 |
EP1139108B1 (de) | 2006-03-22 |
DE60118089T2 (de) | 2006-10-05 |
EP1132816B1 (de) | 2019-03-13 |
EP1139108A2 (de) | 2001-10-04 |
DE60118089D1 (de) | 2006-05-11 |
EP1132816A3 (de) | 2005-09-07 |
EP1139220A2 (de) | 2001-10-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |