GB2218816B - Improvements in and relating to methods of testing integrated circuits - Google Patents
Improvements in and relating to methods of testing integrated circuitsInfo
- Publication number
- GB2218816B GB2218816B GB8811863A GB8811863A GB2218816B GB 2218816 B GB2218816 B GB 2218816B GB 8811863 A GB8811863 A GB 8811863A GB 8811863 A GB8811863 A GB 8811863A GB 2218816 B GB2218816 B GB 2218816B
- Authority
- GB
- United Kingdom
- Prior art keywords
- relating
- methods
- integrated circuits
- testing integrated
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8811863A GB2218816B (en) | 1988-05-19 | 1988-05-19 | Improvements in and relating to methods of testing integrated circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8811863A GB2218816B (en) | 1988-05-19 | 1988-05-19 | Improvements in and relating to methods of testing integrated circuits |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8811863D0 GB8811863D0 (en) | 1988-06-22 |
GB2218816A GB2218816A (en) | 1989-11-22 |
GB2218816B true GB2218816B (en) | 1992-07-29 |
Family
ID=10637171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8811863A Expired - Fee Related GB2218816B (en) | 1988-05-19 | 1988-05-19 | Improvements in and relating to methods of testing integrated circuits |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2218816B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0599993A (en) * | 1991-04-15 | 1993-04-23 | Internatl Business Mach Corp <Ibm> | Logic circuit with testable scanning string |
US5230000A (en) * | 1991-04-25 | 1993-07-20 | At&T Bell Laboratories | Built-in self-test (bist) circuit |
US5406216A (en) * | 1993-11-29 | 1995-04-11 | Motorola, Inc. | Technique and method for asynchronous scan design |
JP2000513815A (en) * | 1997-04-24 | 2000-10-17 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | A method for making digital circuits scan testable. |
DE19929546C1 (en) * | 1999-06-23 | 2000-09-07 | Michael Goessel | Multi-mode memory element has combination circuit that implements Boolean function for first state of control signal and connects its second input logically to output for second state |
US7113902B2 (en) | 2000-03-02 | 2006-09-26 | Texas Instruments Incorporated | Data processing condition detector with table lookup |
EP1132816B1 (en) * | 2000-03-02 | 2019-03-13 | Texas Instruments Incorporated | Automatic detection of connectivity between an emulator and a target device |
DE10041137A1 (en) * | 2000-08-21 | 2002-03-21 | Philips Corp Intellectual Pty | Arrangement for testing integrated circuits |
-
1988
- 1988-05-19 GB GB8811863A patent/GB2218816B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB2218816A (en) | 1989-11-22 |
GB8811863D0 (en) | 1988-06-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19960519 |