DE60136968D1 - Echtzeit-omnifokus-mikroskopkamera - Google Patents

Echtzeit-omnifokus-mikroskopkamera

Info

Publication number
DE60136968D1
DE60136968D1 DE60136968T DE60136968T DE60136968D1 DE 60136968 D1 DE60136968 D1 DE 60136968D1 DE 60136968 T DE60136968 T DE 60136968T DE 60136968 T DE60136968 T DE 60136968T DE 60136968 D1 DE60136968 D1 DE 60136968D1
Authority
DE
Germany
Prior art keywords
omnifokus
real
time
microscope camera
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60136968T
Other languages
English (en)
Inventor
Kohtaro Ohba
Tomohiko Nagase
Hiroshi Nagai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Photron KK
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Photron KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute of Advanced Industrial Science and Technology AIST, Photron KK filed Critical National Institute of Advanced Industrial Science and Technology AIST
Application granted granted Critical
Publication of DE60136968D1 publication Critical patent/DE60136968D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
    • G02B7/08—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification adapted to co-operate with a remote control mechanism
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/67—Focus control based on electronic image sensor signals
    • H04N23/673—Focus control based on electronic image sensor signals based on contrast or high frequency components of image signals, e.g. hill climbing method
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
  • Studio Devices (AREA)
DE60136968T 2001-03-30 2001-10-29 Echtzeit-omnifokus-mikroskopkamera Expired - Lifetime DE60136968D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001100594 2001-03-30
PCT/JP2001/009481 WO2002082805A1 (fr) 2001-03-30 2001-10-29 Camera de microscope omnifocale en temps reel

Publications (1)

Publication Number Publication Date
DE60136968D1 true DE60136968D1 (de) 2009-01-22

Family

ID=18954025

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60136968T Expired - Lifetime DE60136968D1 (de) 2001-03-30 2001-10-29 Echtzeit-omnifokus-mikroskopkamera

Country Status (6)

Country Link
US (1) US20040131348A1 (de)
EP (1) EP1381229B1 (de)
JP (1) JP3737483B2 (de)
DE (1) DE60136968D1 (de)
HK (1) HK1059523A1 (de)
WO (1) WO2002082805A1 (de)

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US7929801B2 (en) * 2005-08-15 2011-04-19 Sony Corporation Depth information for auto focus using two pictures and two-dimensional Gaussian scale space theory
US7616254B2 (en) 2006-03-16 2009-11-10 Sony Corporation Simple method for calculating camera defocus from an image scene
DE102006030530A1 (de) * 2006-07-01 2008-01-03 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur Detektierung von Lichtsignalen
EP1970668A1 (de) * 2007-03-14 2008-09-17 Alicona Imaging GmbH Verfahren und Apparat zur optischen Messung der Topografie einer Probe
US8280194B2 (en) * 2008-04-29 2012-10-02 Sony Corporation Reduced hardware implementation for a two-picture depth map algorithm
US8194995B2 (en) * 2008-09-30 2012-06-05 Sony Corporation Fast camera auto-focus
US8553093B2 (en) * 2008-09-30 2013-10-08 Sony Corporation Method and apparatus for super-resolution imaging using digital imaging devices
JP5154392B2 (ja) * 2008-12-12 2013-02-27 株式会社キーエンス 撮像装置
JP5096302B2 (ja) * 2008-12-12 2012-12-12 株式会社キーエンス 撮像装置
US8464950B2 (en) * 2008-12-22 2013-06-18 Cognex Corporation Fast vision system
US8111938B2 (en) 2008-12-23 2012-02-07 Mitutoyo Corporation System and method for fast approximate focus
TWI467127B (zh) 2009-05-21 2015-01-01 尼康股份有限公司 Means, observation means and an image processing method for measuring the shape of
JP5487770B2 (ja) * 2009-07-21 2014-05-07 ソニー株式会社 固体撮像装置
US20110090327A1 (en) * 2009-10-15 2011-04-21 General Electric Company System and method for imaging with enhanced depth of field
US20110091125A1 (en) * 2009-10-15 2011-04-21 General Electric Company System and method for imaging with enhanced depth of field
US8314837B2 (en) * 2009-10-15 2012-11-20 General Electric Company System and method for imaging with enhanced depth of field
US8111905B2 (en) 2009-10-29 2012-02-07 Mitutoyo Corporation Autofocus video tool and method for precise dimensional inspection
JP5868183B2 (ja) * 2010-06-15 2016-02-24 パナソニック株式会社 撮像装置及び撮像方法
US9522396B2 (en) 2010-12-29 2016-12-20 S.D. Sight Diagnostics Ltd. Apparatus and method for automatic detection of pathogens
WO2013098821A1 (en) 2011-12-29 2013-07-04 Parasight Ltd. Methods and systems for detecting a pathogen in a biological sample
US8890996B2 (en) 2012-05-17 2014-11-18 Panasonic Corporation Imaging device, semiconductor integrated circuit and imaging method
US8994809B2 (en) * 2012-07-19 2015-03-31 Sony Corporation Method and apparatus for simulating depth of field (DOF) in microscopy
US8988520B2 (en) 2012-07-19 2015-03-24 Sony Corporation Method and apparatus for improving depth of field (DOF) in microscopy
US8818117B2 (en) * 2012-07-19 2014-08-26 Sony Corporation Method and apparatus for compressing Z-stack microscopy images
WO2014188405A1 (en) 2013-05-23 2014-11-27 Parasight Ltd. Method and system for imaging a cell sample
IL227276A0 (en) 2013-07-01 2014-03-06 Parasight Ltd A method and system for obtaining a monolayer of cells, for use specifically for diagnosis
JP6245885B2 (ja) 2013-08-02 2017-12-13 キヤノン株式会社 撮像装置およびその制御方法
WO2015029032A1 (en) 2013-08-26 2015-03-05 Parasight Ltd. Digital microscopy systems, methods and computer program products
US9726876B2 (en) * 2013-11-27 2017-08-08 Mitutoyo Corporation Machine vision inspection system and method for obtaining an image with an extended depth of field
CN103716544B (zh) * 2013-12-27 2017-06-16 豪威科技(上海)有限公司 高像素模组快速连续对焦方法及系统
WO2016030897A1 (en) 2014-08-27 2016-03-03 S.D. Sight Diagnostics Ltd System and method for calculating focus variation for a digital microscope
JP6750194B2 (ja) 2015-06-19 2020-09-02 ソニー株式会社 医療用画像処理装置、医療用画像処理方法、及び、医療用観察システム
US9602715B2 (en) * 2015-07-09 2017-03-21 Mitutoyo Corporation Adaptable operating frequency of a variable focal length lens in an adjustable magnification optical system
AU2016322966B2 (en) 2015-09-17 2021-10-14 S.D. Sight Diagnostics Ltd Methods and apparatus for detecting an entity in a bodily sample
DE102015219709A1 (de) * 2015-10-12 2017-04-13 Carl Zeiss Microscopy Gmbh Bildkorrekturverfahren und Mikroskop
WO2017098587A1 (ja) * 2015-12-08 2017-06-15 オリンパス株式会社 顕微鏡観察システム、顕微鏡観察方法、及び顕微鏡観察プログラム
WO2017168411A1 (en) 2016-03-30 2017-10-05 S.D. Sight Diagnostics Ltd Image processing device for identifying blood parasites
US11307196B2 (en) 2016-05-11 2022-04-19 S.D. Sight Diagnostics Ltd. Sample carrier for optical measurements
JP6942148B2 (ja) 2016-05-11 2021-09-29 エス．ディー．サイト ダイアグノスティクス リミテッド 試料に対する光学測定の実施
JP7214729B2 (ja) 2017-11-14 2023-01-30 エス．ディー．サイト ダイアグノスティクス リミテッド 光学測定用試料収容器
JP7214368B2 (ja) * 2018-05-31 2023-01-30 キヤノン株式会社 画像処理装置、撮像装置、画像処理方法、プログラムおよび記録媒体

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Also Published As

Publication number Publication date
US20040131348A1 (en) 2004-07-08
HK1059523A1 (en) 2004-07-02
WO2002082805A1 (fr) 2002-10-17
EP1381229B1 (de) 2008-12-10
JPWO2002082805A1 (ja) 2004-10-14
EP1381229A4 (de) 2006-05-03
JP3737483B2 (ja) 2006-01-18
EP1381229A1 (de) 2004-01-14

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