DE60305779D1 - Mikroskop - Google Patents

Mikroskop

Info

Publication number
DE60305779D1
DE60305779D1 DE60305779T DE60305779T DE60305779D1 DE 60305779 D1 DE60305779 D1 DE 60305779D1 DE 60305779 T DE60305779 T DE 60305779T DE 60305779 T DE60305779 T DE 60305779T DE 60305779 D1 DE60305779 D1 DE 60305779D1
Authority
DE
Germany
Prior art keywords
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60305779T
Other languages
English (en)
Other versions
DE60305779T2 (de
Inventor
Nakahiro Yasuda
Yoshihiro Honma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute Of Radiological Sciences Chiba
Seiko Precision Inc
Original Assignee
National Institute of Radiological Sciences
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2002097499A external-priority patent/JP3992182B2/ja
Priority claimed from JP2002097498A external-priority patent/JP2003295063A/ja
Priority claimed from JP2002097497A external-priority patent/JP3990177B2/ja
Application filed by National Institute of Radiological Sciences filed Critical National Institute of Radiological Sciences
Publication of DE60305779D1 publication Critical patent/DE60305779D1/de
Application granted granted Critical
Publication of DE60305779T2 publication Critical patent/DE60305779T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
DE60305779T 2002-03-29 2003-03-31 Mikroskop Expired - Lifetime DE60305779T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2002097499 2002-03-29
JP2002097497 2002-03-29
JP2002097499A JP3992182B2 (ja) 2002-03-29 2002-03-29 顕微鏡装置
JP2002097498 2002-03-29
JP2002097498A JP2003295063A (ja) 2002-03-29 2002-03-29 顕微鏡装置
JP2002097497A JP3990177B2 (ja) 2002-03-29 2002-03-29 顕微鏡装置

Publications (2)

Publication Number Publication Date
DE60305779D1 true DE60305779D1 (de) 2006-07-20
DE60305779T2 DE60305779T2 (de) 2006-10-19

Family

ID=28457609

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60305779T Expired - Lifetime DE60305779T2 (de) 2002-03-29 2003-03-31 Mikroskop

Country Status (3)

Country Link
US (1) US6924929B2 (de)
EP (1) EP1353212B1 (de)
DE (1) DE60305779T2 (de)

Families Citing this family (42)

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US6404906B2 (en) * 1997-03-03 2002-06-11 Bacus Research Laboratories,Inc. Method and apparatus for acquiring and reconstructing magnified specimen images from a computer-controlled microscope
US6272235B1 (en) * 1997-03-03 2001-08-07 Bacus Research Laboratories, Inc. Method and apparatus for creating a virtual microscope slide
JP2004266943A (ja) * 2003-02-28 2004-09-24 Seiko Epson Corp 超音波モータ、稼働装置、光学系切換機構および電気機器
JP4373872B2 (ja) * 2004-07-30 2009-11-25 浜松ホトニクス株式会社 撮像装置及びそれを用いた顕微鏡装置
US7253947B2 (en) * 2004-10-07 2007-08-07 New York University Portable automated confocal microscope
US8339447B2 (en) * 2004-10-21 2012-12-25 Truevision Systems, Inc. Stereoscopic electronic microscope workstation
US20060109525A1 (en) * 2004-11-19 2006-05-25 Evans Charles E Scanning non-flat objects with a 2-D CMOS/CCD sensor
EP1865354B1 (de) * 2005-03-17 2016-03-16 Hamamatsu Photonics K.K. Mikroskopische bilderfassungseinrichtung
JP2006292999A (ja) * 2005-04-11 2006-10-26 Direct Communications:Kk スライド画像データ作成装置およびスライド画像データ
US8358330B2 (en) * 2005-10-21 2013-01-22 True Vision Systems, Inc. Stereoscopic electronic microscope workstation
US20070188603A1 (en) * 2005-10-21 2007-08-16 Riederer Thomas P Stereoscopic display cart and system
DE102007036815B4 (de) * 2007-08-03 2010-03-04 Vistec Semiconductor Systems Gmbh Verfahren zur Bestimmung des durch die Substrattopologie und eine Koordinaten-Messmaschine bedingten systematischen Fehlers bei der Vermesung von Positionen von Kanten von Strukturen eines Substrats
US9168173B2 (en) * 2008-04-04 2015-10-27 Truevision Systems, Inc. Apparatus and methods for performing enhanced visually directed procedures under low ambient light conditions
US9226798B2 (en) 2008-10-10 2016-01-05 Truevision Systems, Inc. Real-time surgical reference indicium apparatus and methods for surgical applications
US10117721B2 (en) 2008-10-10 2018-11-06 Truevision Systems, Inc. Real-time surgical reference guides and methods for surgical applications
US9229207B2 (en) * 2008-11-17 2016-01-05 Femtonics Kft Laser scanning microscope with focus-detecting unit
US9173717B2 (en) 2009-02-20 2015-11-03 Truevision Systems, Inc. Real-time surgical reference indicium apparatus and methods for intraocular lens implantation
JP5390292B2 (ja) * 2009-08-06 2014-01-15 株式会社ミツトヨ 画像測定機
US8784443B2 (en) * 2009-10-20 2014-07-22 Truevision Systems, Inc. Real-time surgical reference indicium apparatus and methods for astigmatism correction
US20110213342A1 (en) * 2010-02-26 2011-09-01 Ashok Burton Tripathi Real-time Virtual Indicium Apparatus and Methods for Guiding an Implant into an Eye
JP2013083925A (ja) * 2011-09-29 2013-05-09 Canon Inc 撮像装置及びその制御方法
ES2813625T3 (es) 2012-08-30 2021-03-24 Alcon Inc Sistema y procedimientos de formación de imágenes que visualizan una imagen reconstruida multidimensional fusionada
JP6276024B2 (ja) * 2013-12-25 2018-02-07 アレイ株式会社 撮影装置、並びに、画像処理装置およびその方法
WO2016055177A1 (de) * 2014-10-06 2016-04-14 Leica Microsystems (Schweiz) Ag Mikroskop
EP3204809B1 (de) * 2014-10-06 2021-04-21 Leica Microsystems (Schweiz) AG Mikroskop
EP3204807B1 (de) 2014-10-06 2021-04-21 Leica Microsystems (Schweiz) AG Mikroskop
JP6562626B2 (ja) * 2014-12-10 2019-08-21 キヤノン株式会社 顕微鏡システム
US10379329B2 (en) 2014-12-15 2019-08-13 Olympus Corporation Microscope system and setting value calculation method
CN104546137A (zh) * 2015-01-01 2015-04-29 蔡虹静 一种记录式显微镜
JP6552041B2 (ja) * 2015-07-16 2019-07-31 オリンパス株式会社 顕微鏡システム、屈折率算出方法、及び、プログラム
JP6555811B2 (ja) 2015-07-16 2019-08-07 オリンパス株式会社 顕微鏡システム、特定方法、及び、プログラム
JP6609174B2 (ja) * 2015-12-10 2019-11-20 キヤノン株式会社 顕微鏡システムおよびその制御方法
JP6643071B2 (ja) * 2015-12-10 2020-02-12 キヤノン株式会社 顕微鏡システム
JP6698421B2 (ja) * 2016-05-17 2020-05-27 富士フイルム株式会社 観察装置および方法並びに観察装置制御プログラム
CN105824113B (zh) * 2016-05-27 2018-04-13 长春理工大学 一种360°观察细胞工厂的装置
JP6619315B2 (ja) 2016-09-28 2019-12-11 富士フイルム株式会社 観察装置および方法並びに観察装置制御プログラム
GB201704770D0 (en) * 2017-01-05 2017-05-10 Illumina Inc Predictive focus tracking apparatus and methods
US10917543B2 (en) 2017-04-24 2021-02-09 Alcon Inc. Stereoscopic visualization camera and integrated robotics platform
US11083537B2 (en) 2017-04-24 2021-08-10 Alcon Inc. Stereoscopic camera with fluorescence visualization
US10299880B2 (en) 2017-04-24 2019-05-28 Truevision Systems, Inc. Stereoscopic visualization camera and platform
KR102318185B1 (ko) * 2017-08-30 2021-10-26 후지필름 가부시키가이샤 관찰 장치 및 방법과 관찰 장치 제어 프로그램
WO2020066503A1 (ja) * 2018-09-27 2020-04-02 富士フイルム株式会社 観察装置および方法並びに観察装置制御プログラム

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Publication number Priority date Publication date Assignee Title
US3584718A (en) * 1969-06-02 1971-06-15 Schiefer Mfg Co Wear surfaces of clutches, flywheels and the like
DE2845855A1 (de) * 1978-10-20 1980-04-30 Luk Lamellen & Kupplungsbau Reibungskupplung, insbesondere fuer kraftfahrzeuge
DE3828381C2 (de) * 1988-08-20 1997-09-11 Zeiss Carl Fa Verfahren und Einrichtung zur automatischen Fokussierung eines optischen Systems
DE4131737C2 (de) * 1991-09-24 1997-05-07 Zeiss Carl Fa Autofokus-Anordnung für ein Stereomikroskop
CA2227177A1 (en) * 1995-07-19 1997-02-06 Morphometrix Technologies Inc. Automated scanning of microscope slides
US6677565B1 (en) * 1998-08-18 2004-01-13 Veeco Tucson Inc. High speed autofocus and tilt for an optical imaging system
US6640014B1 (en) * 1999-01-22 2003-10-28 Jeffrey H. Price Automatic on-the-fly focusing for continuous image acquisition in high-resolution microscopy
JP2000266995A (ja) * 1999-03-18 2000-09-29 Hitachi Denshi Ltd 顕微鏡合焦点検出方法
US6711283B1 (en) * 2000-05-03 2004-03-23 Aperio Technologies, Inc. Fully automatic rapid microscope slide scanner

Also Published As

Publication number Publication date
EP1353212A2 (de) 2003-10-15
EP1353212B1 (de) 2006-06-07
US6924929B2 (en) 2005-08-02
DE60305779T2 (de) 2006-10-19
EP1353212A3 (de) 2004-01-28
US20030184855A1 (en) 2003-10-02

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: SEIKO PRECISION INC., NARASHINO, CHIBA, JP

Owner name: NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES, CHIBA

8364 No opposition during term of opposition