DE60123922D1 - Verfahren und Einrichtung zur Netzwerkmessung - Google Patents

Verfahren und Einrichtung zur Netzwerkmessung

Info

Publication number
DE60123922D1
DE60123922D1 DE60123922T DE60123922T DE60123922D1 DE 60123922 D1 DE60123922 D1 DE 60123922D1 DE 60123922 T DE60123922 T DE 60123922T DE 60123922 T DE60123922 T DE 60123922T DE 60123922 D1 DE60123922 D1 DE 60123922D1
Authority
DE
Germany
Prior art keywords
network measurement
measurement
network
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60123922T
Other languages
English (en)
Other versions
DE60123922T2 (de
Inventor
David Finlay Taylor
David Alexander Bisset
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60123922D1 publication Critical patent/DE60123922D1/de
Application granted granted Critical
Publication of DE60123922T2 publication Critical patent/DE60123922T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L7/00—Arrangements for synchronising receiver with transmitter
    • H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
    • H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Dc Digital Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
DE60123922T 2001-03-20 2001-03-20 Verfahren und Einrichtung zur Netzwerkmessung Expired - Fee Related DE60123922T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01302553A EP1244241B1 (de) 2001-03-20 2001-03-20 Verfahren und Einrichtung zur Netzwerkmessung

Publications (2)

Publication Number Publication Date
DE60123922D1 true DE60123922D1 (de) 2006-11-30
DE60123922T2 DE60123922T2 (de) 2007-09-06

Family

ID=8181806

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60123922T Expired - Fee Related DE60123922T2 (de) 2001-03-20 2001-03-20 Verfahren und Einrichtung zur Netzwerkmessung

Country Status (4)

Country Link
US (1) US7260168B2 (de)
EP (1) EP1244241B1 (de)
JP (1) JP2003004782A (de)
DE (1) DE60123922T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7437624B2 (en) 2002-09-30 2008-10-14 Lecroy Corporation Method and apparatus for analyzing serial data streams
US7519874B2 (en) 2002-09-30 2009-04-14 Lecroy Corporation Method and apparatus for bit error rate analysis
US7434113B2 (en) 2002-09-30 2008-10-07 Lecroy Corporation Method of analyzing serial data streams
US7100132B2 (en) * 2004-03-01 2006-08-29 Agilent Technologies, Inc. Source synchronous timing extraction, cyclization and sampling
KR100724895B1 (ko) * 2005-06-17 2007-06-04 삼성전자주식회사 위상고정루프와 위상고정루프에서의 위상 검출방법 및 그를이용하는 수신기
JP2011254122A (ja) * 2009-03-23 2011-12-15 Nec Corp 回路、制御システム、制御方法及びプログラム
US8254515B2 (en) * 2009-03-24 2012-08-28 Integrated Device Technology, Inc. Method for measuring phase locked loop bandwidth parameters for high-speed serial links
US8907706B2 (en) * 2013-04-29 2014-12-09 Microsemi Semiconductor Ulc Phase locked loop with simultaneous locking to low and high frequency clocks

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5187719A (en) * 1989-01-13 1993-02-16 Hewlett-Packard Company Method and apparatus for measuring modulation accuracy
US5425060A (en) * 1993-01-25 1995-06-13 Harris Corporation Mechanism for reducing timing jitter in clock recovery scheme for blind acquisition of full duplex signals
US5832043A (en) * 1995-04-03 1998-11-03 Motorola, Inc. System and method for maintaining continuous phase during up/down conversion of near-zero hertz intermediate frequencies
JP3286885B2 (ja) * 1995-11-07 2002-05-27 三菱電機株式会社 タイミング再生手段及びダイバーシティ通信装置
EP1657846A3 (de) * 1996-07-22 2008-03-12 Nippon Telegraph And Telephone Corporation Verfahren und Schaltungen zur Taktrückgewinnung
US5754437A (en) * 1996-09-10 1998-05-19 Tektronix, Inc. Phase measurement apparatus and method
JP3286907B2 (ja) * 1997-10-30 2002-05-27 三菱電機株式会社 タイミング位相同期検出回路及び復調器
US6151076A (en) * 1998-02-10 2000-11-21 Tektronix, Inc. System for phase-locking a clock to a digital audio signal embedded in a digital video signal
GB9911750D0 (en) * 1999-05-21 1999-07-21 Hewlett Packard Co Method and apparatus for measuring parameters of an electrical system
JP3908033B2 (ja) * 1999-06-04 2007-04-25 三菱電機株式会社 位相検出装置、これを用いたタイミング再生装置、および、これを用いた復調装置
EP1152562A1 (de) 2000-05-02 2001-11-07 Agilent Technologies, Inc. (a Delaware corporation) Verfahren und Vorrichtung zur Messung von Parametern eines Elektroniksystems, beispielsweise MTIE
KR100342521B1 (ko) * 2000-09-05 2002-06-28 윤종용 광 수신기의 전송속도 인식 장치 및 방법

Also Published As

Publication number Publication date
EP1244241B1 (de) 2006-10-18
EP1244241A1 (de) 2002-09-25
US7260168B2 (en) 2007-08-21
US20020136330A1 (en) 2002-09-26
DE60123922T2 (de) 2007-09-06
JP2003004782A (ja) 2003-01-08

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee