DE60115951D1 - Verfahren und vorrichtung zur herstellung einer siliziumschmelze von einem polykristallinen siliziumchargiergut - Google Patents
Verfahren und vorrichtung zur herstellung einer siliziumschmelze von einem polykristallinen siliziumchargiergutInfo
- Publication number
- DE60115951D1 DE60115951D1 DE60115951T DE60115951T DE60115951D1 DE 60115951 D1 DE60115951 D1 DE 60115951D1 DE 60115951 T DE60115951 T DE 60115951T DE 60115951 T DE60115951 T DE 60115951T DE 60115951 D1 DE60115951 D1 DE 60115951D1
- Authority
- DE
- Germany
- Prior art keywords
- preparing
- polycrystalline silicon
- charging agent
- silicon charging
- silicone melt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
- C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Silicon Compounds (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/711,198 US6454851B1 (en) | 2000-11-09 | 2000-11-09 | Method for preparing molten silicon melt from polycrystalline silicon charge |
PCT/US2001/051653 WO2002081786A1 (en) | 2000-11-09 | 2001-10-23 | Method and apparatus for preparing molten silicon melt from polycrystalline silicon charge |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60115951D1 true DE60115951D1 (de) | 2006-01-19 |
DE60115951T2 DE60115951T2 (de) | 2006-06-14 |
Family
ID=24857143
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60115951T Expired - Lifetime DE60115951T2 (de) | 2000-11-09 | 2001-10-23 | Verfahren und vorrichtung zur herstellung einer siliziumschmelze von einem polykristallinen siliziumchargiergut |
Country Status (8)
Country | Link |
---|---|
US (1) | US6454851B1 (de) |
EP (1) | EP1337697B1 (de) |
JP (1) | JP4287657B2 (de) |
KR (1) | KR100669300B1 (de) |
CN (1) | CN1473212A (de) |
DE (1) | DE60115951T2 (de) |
TW (1) | TW527450B (de) |
WO (1) | WO2002081786A1 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030101924A1 (en) * | 2001-11-15 | 2003-06-05 | Memc Electronic Materials, Inc. | Intermittent feeding technique for increasing the melting rate of polycrystalline silicon |
JP4908730B2 (ja) * | 2003-04-21 | 2012-04-04 | 株式会社Sumco | 高抵抗シリコン単結晶の製造方法 |
US7691199B2 (en) * | 2004-06-18 | 2010-04-06 | Memc Electronic Materials, Inc. | Melter assembly and method for charging a crystal forming apparatus with molten source material |
US7465351B2 (en) * | 2004-06-18 | 2008-12-16 | Memc Electronic Materials, Inc. | Melter assembly and method for charging a crystal forming apparatus with molten source material |
US7344594B2 (en) * | 2004-06-18 | 2008-03-18 | Memc Electronic Materials, Inc. | Melter assembly and method for charging a crystal forming apparatus with molten source material |
JP4784401B2 (ja) * | 2006-05-30 | 2011-10-05 | 株式会社Sumco | シリコン単結晶の育成プロセスにおける融液の液面位置監視装置 |
US8057598B2 (en) * | 2006-06-13 | 2011-11-15 | Young Sang Cho | Manufacturing equipment for polysilicon ingot |
US20130263772A1 (en) * | 2007-12-04 | 2013-10-10 | David L. Bender | Method and apparatus for controlling melt temperature in a Czochralski grower |
ATE544884T1 (de) * | 2007-12-19 | 2012-02-15 | Schott Ag | Verfahren zur herstellung eines monokristallinen oder polykristallinen halbleitermaterials |
DE102007061704A1 (de) | 2007-12-19 | 2009-09-10 | Schott Ag | Verfahren zur Herstellung eines ein- oder polykristallinen Materials |
US7573587B1 (en) * | 2008-08-25 | 2009-08-11 | Memc Electronic Materials, Inc. | Method and device for continuously measuring silicon island elevation |
CN103787336B (zh) * | 2008-09-16 | 2016-09-14 | 储晞 | 生产高纯颗粒硅的方法 |
JP2014508710A (ja) * | 2011-03-15 | 2014-04-10 | ジーティーエイティー・コーポレーション | 結晶成長装置のための自動化視覚システム |
KR101481442B1 (ko) * | 2013-10-02 | 2015-01-13 | 한국생산기술연구원 | 단결정잉곳 성장로의 아일랜드 위치검출장치 및 아일랜드 위치검출방법 |
EP2886519B1 (de) * | 2013-12-18 | 2016-05-25 | Heraeus Quarzglas GmbH & Co. KG | Vertikal-tiegelziehverfahren zur herstellung eines glaskörpers mit hohem kieselsäuregehalt |
CN103882516B (zh) * | 2014-03-25 | 2016-05-11 | 山西中电科新能源技术有限公司 | 多晶硅铸锭炉在线补料方法 |
WO2017043826A1 (ko) * | 2015-09-07 | 2017-03-16 | 한국생산기술연구원 | 용융로의 아일랜드 위치검출 장치 및 방법 |
CN107604446A (zh) * | 2017-10-25 | 2018-01-19 | 宁晋晶兴电子材料有限公司 | 一种新型的熔融表皮料结构及其熔融方法 |
JP6935790B2 (ja) * | 2018-10-15 | 2021-09-15 | 株式会社Sumco | 石英るつぼ内周面の評価方法及び石英るつぼ内周面の評価装置 |
CN112095141B (zh) * | 2019-06-17 | 2022-05-03 | 宁夏隆基硅材料有限公司 | 一种拉晶方法、一种单晶炉、一种计算机可读存储介质 |
CN113428671B (zh) * | 2020-11-23 | 2022-04-26 | 眉山博雅新材料股份有限公司 | 一种加料控制方法和系统 |
CN114318509B (zh) | 2021-12-28 | 2023-07-28 | 西安奕斯伟材料科技有限公司 | 一种硅料处理装置、硅棒生产设备和硅料处理方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5653799A (en) | 1995-06-02 | 1997-08-05 | Memc Electronic Materials, Inc. | Method for controlling growth of a silicon crystal |
US5588993A (en) | 1995-07-25 | 1996-12-31 | Memc Electronic Materials, Inc. | Method for preparing molten silicon melt from polycrystalline silicon charge |
US5762491A (en) * | 1995-10-31 | 1998-06-09 | Memc Electronic Materials, Inc. | Solid material delivery system for a furnace |
US5656078A (en) | 1995-11-14 | 1997-08-12 | Memc Electronic Materials, Inc. | Non-distorting video camera for use with a system for controlling growth of a silicon crystal |
US6077345A (en) * | 1996-04-10 | 2000-06-20 | Ebara Solar, Inc. | Silicon crystal growth melt level control system and method |
US5997234A (en) * | 1997-04-29 | 1999-12-07 | Ebara Solar, Inc. | Silicon feed system |
US5846318A (en) | 1997-07-17 | 1998-12-08 | Memc Electric Materials, Inc. | Method and system for controlling growth of a silicon crystal |
US5882402A (en) | 1997-09-30 | 1999-03-16 | Memc Electronic Materials, Inc. | Method for controlling growth of a silicon crystal |
US5919303A (en) * | 1997-10-16 | 1999-07-06 | Memc Electronic Materials, Inc. | Process for preparing a silicon melt from a polysilicon charge |
US6106612A (en) * | 1998-06-04 | 2000-08-22 | Seh America Inc. | Level detector and method for detecting a surface level of a material in a container |
-
2000
- 2000-11-09 US US09/711,198 patent/US6454851B1/en not_active Expired - Fee Related
-
2001
- 2001-10-23 DE DE60115951T patent/DE60115951T2/de not_active Expired - Lifetime
- 2001-10-23 CN CNA018185371A patent/CN1473212A/zh active Pending
- 2001-10-23 KR KR1020037006272A patent/KR100669300B1/ko not_active IP Right Cessation
- 2001-10-23 WO PCT/US2001/051653 patent/WO2002081786A1/en active IP Right Grant
- 2001-10-23 EP EP01273548A patent/EP1337697B1/de not_active Expired - Lifetime
- 2001-10-23 JP JP2002579545A patent/JP4287657B2/ja not_active Expired - Fee Related
- 2001-10-31 TW TW090127030A patent/TW527450B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1337697A1 (de) | 2003-08-27 |
KR20030081328A (ko) | 2003-10-17 |
US6454851B1 (en) | 2002-09-24 |
WO2002081786A1 (en) | 2002-10-17 |
JP4287657B2 (ja) | 2009-07-01 |
KR100669300B1 (ko) | 2007-01-16 |
TW527450B (en) | 2003-04-11 |
DE60115951T2 (de) | 2006-06-14 |
JP2004531446A (ja) | 2004-10-14 |
EP1337697B1 (de) | 2005-12-14 |
CN1473212A (zh) | 2004-02-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
R082 | Change of representative |
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