DE60106780D1 - Schaltungsanordnung zur Steuerung eines Referenzknotens in einem Leseverstärker - Google Patents
Schaltungsanordnung zur Steuerung eines Referenzknotens in einem LeseverstärkerInfo
- Publication number
- DE60106780D1 DE60106780D1 DE60106780T DE60106780T DE60106780D1 DE 60106780 D1 DE60106780 D1 DE 60106780D1 DE 60106780 T DE60106780 T DE 60106780T DE 60106780 T DE60106780 T DE 60106780T DE 60106780 D1 DE60106780 D1 DE 60106780D1
- Authority
- DE
- Germany
- Prior art keywords
- controlling
- sense amplifier
- circuit arrangement
- reference node
- node
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/067—Single-ended amplifiers
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01830817A EP1324347B1 (de) | 2001-12-28 | 2001-12-28 | Schaltungsanordnung zur Steuerung eines Referenzknotens in einem Leseverstärker |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60106780D1 true DE60106780D1 (de) | 2004-12-02 |
Family
ID=8184845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60106780T Expired - Lifetime DE60106780D1 (de) | 2001-12-28 | 2001-12-28 | Schaltungsanordnung zur Steuerung eines Referenzknotens in einem Leseverstärker |
Country Status (3)
Country | Link |
---|---|
US (1) | US6801466B2 (de) |
EP (1) | EP1324347B1 (de) |
DE (1) | DE60106780D1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3913704B2 (ja) * | 2003-04-22 | 2007-05-09 | 株式会社東芝 | 不揮発性半導体記憶装置及びこれを用いた電子装置 |
ITVA20040019A1 (it) * | 2004-05-04 | 2004-08-04 | St Microelectronics Srl | Metodo e circuito di verifica ed eventuale sostituzione di celle di riferimento difettose di una memoria |
US7345512B2 (en) * | 2004-05-04 | 2008-03-18 | Silicon Storage Technology, Inc. | Sense amplifier for low voltage high speed sensing |
KR100618840B1 (ko) * | 2004-06-29 | 2006-09-01 | 삼성전자주식회사 | 저 전원전압 플래쉬 메모리장치의 감지회로 |
US7221605B2 (en) * | 2004-08-31 | 2007-05-22 | Micron Technology, Inc. | Switched capacitor DRAM sense amplifier with immunity to mismatch and offsets |
US7236415B2 (en) * | 2004-09-01 | 2007-06-26 | Micron Technology, Inc. | Sample and hold memory sense amplifier |
JP4329658B2 (ja) * | 2004-09-17 | 2009-09-09 | 株式会社デンソー | センスアンプ回路 |
US7466613B2 (en) * | 2005-04-15 | 2008-12-16 | Atmel Corporation | Sense amplifier for flash memory device |
US7369450B2 (en) | 2006-05-26 | 2008-05-06 | Freescale Semiconductor, Inc. | Nonvolatile memory having latching sense amplifier and method of operation |
US7583107B2 (en) * | 2006-09-27 | 2009-09-01 | Atmel Corporation | Sense amplifier circuit for low voltage applications |
KR20090028193A (ko) * | 2007-09-14 | 2009-03-18 | 삼성전자주식회사 | 전압강하 측정회로, 이를 포함하는 반도체 장치, 시스템 및반도체 장치의 전압강하 측정방법 |
US20090129185A1 (en) * | 2007-11-19 | 2009-05-21 | Cassels John J | Semiconductor circuits capable of self detecting defects |
TWI386656B (zh) * | 2009-07-02 | 2013-02-21 | Novatek Microelectronics Corp | 電容值測量電路與方法 |
EP3562019B1 (de) * | 2018-04-26 | 2021-03-03 | ams AG | Inverter-schaltungsanordnung |
US11092988B2 (en) | 2018-09-25 | 2021-08-17 | Invensense, Inc. | Start-up speed enhancement circuit and method for lower-power regulators |
US10978111B1 (en) * | 2019-12-05 | 2021-04-13 | Winbond Electronics Corp. | Sense amplifier circuit with reference voltage holding circuit for maintaining sense amplifier reference voltage when the sense amplifier operates under standby mode |
CN113160859B (zh) * | 2021-03-31 | 2021-12-14 | 珠海博雅科技有限公司 | 灵敏放大器及存储器 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6052307A (en) * | 1998-08-11 | 2000-04-18 | Texas Instruments Incorporated | Leakage tolerant sense amplifier |
JP2001184881A (ja) * | 1999-12-28 | 2001-07-06 | Toshiba Corp | 不揮発性半導体メモリの読み出し回路 |
US6507523B2 (en) * | 2000-12-20 | 2003-01-14 | Micron Technology, Inc. | Non-volatile memory with power standby |
-
2001
- 2001-12-28 EP EP01830817A patent/EP1324347B1/de not_active Expired - Lifetime
- 2001-12-28 DE DE60106780T patent/DE60106780D1/de not_active Expired - Lifetime
-
2002
- 2002-12-27 US US10/331,147 patent/US6801466B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1324347B1 (de) | 2004-10-27 |
US6801466B2 (en) | 2004-10-05 |
US20030142568A1 (en) | 2003-07-31 |
EP1324347A1 (de) | 2003-07-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |