DE60038033D1 - Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie - Google Patents

Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie

Info

Publication number
DE60038033D1
DE60038033D1 DE60038033T DE60038033T DE60038033D1 DE 60038033 D1 DE60038033 D1 DE 60038033D1 DE 60038033 T DE60038033 T DE 60038033T DE 60038033 T DE60038033 T DE 60038033T DE 60038033 D1 DE60038033 D1 DE 60038033D1
Authority
DE
Germany
Prior art keywords
analyte
ionization
atmospheric pressure
dopant
photoionisation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60038033T
Other languages
English (en)
Other versions
DE60038033T2 (de
Inventor
Damon B Robb
Andries Pieter Bruins
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nordion Inc
Original Assignee
MDS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MDS Inc filed Critical MDS Inc
Publication of DE60038033D1 publication Critical patent/DE60038033D1/de
Application granted granted Critical
Publication of DE60038033T2 publication Critical patent/DE60038033T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Extraction Or Liquid Replacement (AREA)
DE60038033T 1999-10-29 2000-10-26 Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie Expired - Lifetime DE60038033T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16270999P 1999-10-29 1999-10-29
US162709P 1999-10-29
PCT/CA2000/001270 WO2001033605A2 (en) 1999-10-29 2000-10-26 Atmospheric pressure photoionization (appi): a new ionization method for liquid chromatography-mass spectrometry

Publications (2)

Publication Number Publication Date
DE60038033D1 true DE60038033D1 (de) 2008-03-27
DE60038033T2 DE60038033T2 (de) 2009-04-23

Family

ID=22586814

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60038033T Expired - Lifetime DE60038033T2 (de) 1999-10-29 2000-10-26 Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie

Country Status (8)

Country Link
US (1) US6534765B1 (de)
EP (1) EP1226602B1 (de)
JP (1) JP4600909B2 (de)
AT (1) ATE386335T1 (de)
AU (1) AU772052B2 (de)
CA (1) CA2386832C (de)
DE (1) DE60038033T2 (de)
WO (1) WO2001033605A2 (de)

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US20040256550A1 (en) * 2003-01-27 2004-12-23 Finch Jeffrey W. Coaxial atmospheric pressure photoionization source for mass spectrometers
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US7332347B2 (en) 2003-04-14 2008-02-19 Liang Li Apparatus and method for concentrating and collecting analytes from a flowing liquid stream
JP4397396B2 (ja) * 2003-04-29 2010-01-13 ヤスミ・キャピタル，リミテッド・ライアビリティ・カンパニー レーザ光イオン化装置への直接液体注入口
DE102004025841B4 (de) * 2004-05-24 2015-07-09 Bruker Daltonik Gmbh Verfahren und Vorrichtung zur massenspektroskopischen Untersuchung von Analyten
WO2006060130A2 (en) * 2004-11-09 2006-06-08 E.I. Dupont De Nemours And Company Ion source for a mass spectrometer
US20060255261A1 (en) * 2005-04-04 2006-11-16 Craig Whitehouse Atmospheric pressure ion source for mass spectrometry
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
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US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
EP2343545A3 (de) * 2005-07-20 2012-09-05 Smiths Group plc Nachweissysteme
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
FR2896585B1 (fr) * 2006-01-20 2008-12-05 Commissariat Energie Atomique Introduction d'additifs pour une interface d'ionisation a pression atmospherique en entree d'un spectrometre
JP4679389B2 (ja) * 2006-02-20 2011-04-27 株式会社日立ハイテクノロジーズ イオン化エネルギーの低い試料を検出する検出器及び分析装置
US7642510B2 (en) * 2006-08-22 2010-01-05 E.I. Du Pont De Nemours And Company Ion source for a mass spectrometer
US7880140B2 (en) * 2007-05-02 2011-02-01 Dh Technologies Development Pte. Ltd Multipole mass filter having improved mass resolution
KR100902946B1 (ko) * 2007-05-15 2009-06-15 (주)에이치시티 소프트 엑스레이 광이온화 하전기
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
JP5477295B2 (ja) * 2007-12-13 2014-04-23 アカデミア シニカ 電荷監視質量分析を行うためのシステムおよび方法
US8044346B2 (en) * 2007-12-21 2011-10-25 Licentia Oy Method and system for desorbing and ionizing chemical compounds from surfaces
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US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
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US9070542B2 (en) 2012-04-06 2015-06-30 Implant Sciences Corporation Selective ionization using high frequency filtering of reactive ions
CN105074448A (zh) * 2013-01-31 2015-11-18 蒙特利尔史密斯安检仪公司 表面电离源
US9018598B2 (en) * 2013-05-18 2015-04-28 Brechtel Manufacturing, Inc. Aerosol ionizer
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CN107735682B (zh) * 2015-05-05 2020-09-29 密歇根大学董事会 微流体光电离检测器
CN109789420B (zh) 2016-09-02 2021-09-24 得克萨斯大学体系董事会 收集探针及其使用方法
CN110958914A (zh) 2017-08-10 2020-04-03 拉皮斯坎系统股份有限公司 使用热稳定收集装置的物质检测的系统和方法
IT201700115527A1 (it) * 2017-10-13 2019-04-13 Univ Degli Studi Di Urbino Carlo Bo Macchina per analisi chimica comprendente la combinazione della spettrometria di massa a ionizzazione elettronica con la cromatografia liquida
JP2021504703A (ja) 2017-11-27 2021-02-15 ボード・オブ・リージエンツ，ザ・ユニバーシテイ・オブ・テキサス・システム 低侵襲性収集プローブおよびその使用方法
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Also Published As

Publication number Publication date
JP2003515105A (ja) 2003-04-22
CA2386832C (en) 2009-09-29
JP4600909B2 (ja) 2010-12-22
EP1226602A2 (de) 2002-07-31
WO2001033605A2 (en) 2001-05-10
CA2386832A1 (en) 2001-05-10
AU1122101A (en) 2001-05-14
ATE386335T1 (de) 2008-03-15
WO2001033605A3 (en) 2002-01-03
WO2001033605A9 (en) 2002-08-29
US6534765B1 (en) 2003-03-18
AU772052B2 (en) 2004-04-08
EP1226602B1 (de) 2008-02-13
DE60038033T2 (de) 2009-04-23

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