DE60037071D1 - Magentischer Energiefilter - Google Patents
Magentischer EnergiefilterInfo
- Publication number
- DE60037071D1 DE60037071D1 DE60037071T DE60037071T DE60037071D1 DE 60037071 D1 DE60037071 D1 DE 60037071D1 DE 60037071 T DE60037071 T DE 60037071T DE 60037071 T DE60037071 T DE 60037071T DE 60037071 D1 DE60037071 D1 DE 60037071D1
- Authority
- DE
- Germany
- Prior art keywords
- energy filter
- magical
- magical energy
- filter
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/463—Static spectrometers using static magnetic fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/05—Arrangements for energy or mass analysis
- H01J2237/055—Arrangements for energy or mass analysis magnetic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/05—Arrangements for energy or mass analysis
- H01J2237/057—Energy or mass filtering
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15373299 | 1999-06-01 | ||
JP15373299 | 1999-06-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60037071D1 true DE60037071D1 (de) | 2007-12-27 |
DE60037071T2 DE60037071T2 (de) | 2008-02-28 |
Family
ID=15568896
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60040250T Expired - Lifetime DE60040250D1 (de) | 1999-06-01 | 2000-05-31 | Magnetenergiefilter |
DE60037071T Expired - Lifetime DE60037071T2 (de) | 1999-06-01 | 2000-05-31 | Magentischer Energiefilter |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60040250T Expired - Lifetime DE60040250D1 (de) | 1999-06-01 | 2000-05-31 | Magnetenergiefilter |
Country Status (3)
Country | Link |
---|---|
US (1) | US6441378B1 (de) |
EP (2) | EP1780762B1 (de) |
DE (2) | DE60040250D1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10005347A1 (de) * | 2000-02-08 | 2001-08-09 | Leo Elektronenmikroskopie Gmbh | Elektronenenergiefilter mit magnetischen Umlenkbereichen |
JP2002025485A (ja) * | 2000-07-06 | 2002-01-25 | Jeol Ltd | エネルギーフィルタ |
ES2264899B1 (es) | 2005-07-12 | 2008-01-01 | Centro De Investigacion De Rotacion Y Torque Aplicada, S.L. | Filtro para capturar emisiones contaminantes. |
US20080116390A1 (en) * | 2006-11-17 | 2008-05-22 | Pyramid Technical Consultants, Inc. | Delivery of a Charged Particle Beam |
US8183526B1 (en) * | 2011-02-11 | 2012-05-22 | Electron Optica | Mirror monochromator for charged particle beam apparatus |
CN109300756A (zh) * | 2018-09-28 | 2019-02-01 | 德淮半导体有限公司 | 磁分析器单元 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51151179A (en) * | 1975-06-20 | 1976-12-25 | Hitachi Ltd | Charge corpuscular ray analyser |
DE3532698A1 (de) | 1985-09-13 | 1987-03-26 | Zeiss Carl Fa | Elektronenenergiefilter vom alpha-typ |
DE3532699A1 (de) | 1985-09-13 | 1987-03-26 | Zeiss Carl Fa | Elektronenenergiefilter vom omega-typ |
JPH01236567A (ja) * | 1987-11-04 | 1989-09-21 | Nissin Electric Co Ltd | 表面解析装置 |
US5097126A (en) * | 1990-09-25 | 1992-03-17 | Gatan, Inc. | High resolution electron energy loss spectrometer |
JP3123850B2 (ja) * | 1993-01-29 | 2001-01-15 | 日本電子株式会社 | 直接写像型反射電子顕微鏡 |
EP0647960B1 (de) * | 1993-05-21 | 1997-03-26 | Koninklijke Philips Electronics N.V. | Energiefilter mit Korrektur von chromatischen Aberrationen zweiter ordnung |
FR2753303B1 (fr) * | 1996-09-12 | 1998-12-04 | Centre Nat Rech Scient | Filtre d'energie, microscope electronique a transmission et procede de filtrage d'energie associe |
JP3518271B2 (ja) * | 1997-08-28 | 2004-04-12 | 株式会社日立製作所 | エネルギーフィルタおよびこれを備えた電子顕微鏡 |
JP3571523B2 (ja) * | 1998-03-09 | 2004-09-29 | 日本電子株式会社 | オメガ型エネルギーフィルタ |
-
2000
- 2000-05-31 EP EP07000577A patent/EP1780762B1/de not_active Expired - Lifetime
- 2000-05-31 DE DE60040250T patent/DE60040250D1/de not_active Expired - Lifetime
- 2000-05-31 EP EP00304593A patent/EP1058287B1/de not_active Expired - Lifetime
- 2000-05-31 DE DE60037071T patent/DE60037071T2/de not_active Expired - Lifetime
- 2000-06-01 US US09/585,852 patent/US6441378B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE60037071T2 (de) | 2008-02-28 |
EP1058287A2 (de) | 2000-12-06 |
DE60040250D1 (de) | 2008-10-23 |
EP1780762A1 (de) | 2007-05-02 |
EP1780762B1 (de) | 2008-09-10 |
EP1058287A3 (de) | 2005-06-15 |
EP1058287B1 (de) | 2007-11-14 |
US6441378B1 (en) | 2002-08-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |