DE60033723D1 - Verfahren und Vorrichtung zur Abtasten eines Gegenstandes in einem rechnergestützten Tomographen - Google Patents

Verfahren und Vorrichtung zur Abtasten eines Gegenstandes in einem rechnergestützten Tomographen

Info

Publication number
DE60033723D1
DE60033723D1 DE60033723T DE60033723T DE60033723D1 DE 60033723 D1 DE60033723 D1 DE 60033723D1 DE 60033723 T DE60033723 T DE 60033723T DE 60033723 T DE60033723 T DE 60033723T DE 60033723 D1 DE60033723 D1 DE 60033723D1
Authority
DE
Germany
Prior art keywords
scanning
computerized tomograph
tomograph
computerized
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60033723T
Other languages
English (en)
Other versions
DE60033723T2 (de
Inventor
Peter Michael Edic
Armin Horst Pfoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Application granted granted Critical
Publication of DE60033723D1 publication Critical patent/DE60033723D1/de
Publication of DE60033723T2 publication Critical patent/DE60033723T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE60033723T 1999-04-20 2000-04-19 Verfahren und Vorrichtung zur Abtasten eines Gegenstandes in einem rechnergestützten Tomographen Expired - Lifetime DE60033723T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US295481 1999-04-20
US09/295,481 US6175609B1 (en) 1999-04-20 1999-04-20 Methods and apparatus for scanning an object in a computed tomography system

Publications (2)

Publication Number Publication Date
DE60033723D1 true DE60033723D1 (de) 2007-04-19
DE60033723T2 DE60033723T2 (de) 2007-11-29

Family

ID=23137906

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60033723T Expired - Lifetime DE60033723T2 (de) 1999-04-20 2000-04-19 Verfahren und Vorrichtung zur Abtasten eines Gegenstandes in einem rechnergestützten Tomographen

Country Status (6)

Country Link
US (1) US6175609B1 (de)
EP (1) EP1046903B1 (de)
JP (1) JP3377496B2 (de)
BR (1) BR0001638B1 (de)
DE (1) DE60033723T2 (de)
SG (1) SG80094A1 (de)

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US7664223B1 (en) * 2001-02-12 2010-02-16 Sectra Mamea Ab Collimator element
US6687326B1 (en) 2001-04-11 2004-02-03 Analogic Corporation Method of and system for correcting scatter in a computed tomography scanner
DE10201321B4 (de) * 2002-01-15 2011-02-24 Siemens Ag Computertomographie-Gerät und Verfahren mit aktiver Anpassung der Mess-Elektronik
US6879657B2 (en) * 2002-05-10 2005-04-12 Ge Medical Systems Global Technology, Llc Computed tomography system with integrated scatter detectors
US6748047B2 (en) * 2002-05-15 2004-06-08 General Electric Company Scatter correction method for non-stationary X-ray acquisitions
US20040019275A1 (en) * 2002-07-23 2004-01-29 Maria Iatrou Method and apparatus for positioning a CT reconstruction window
US6956926B2 (en) * 2002-07-23 2005-10-18 General Electric Company Method and apparatus for selecting a reconstruction projection set
DE10317679B4 (de) * 2003-04-17 2005-03-31 Bruker Axs Gmbh Röntgen-optische Vorrichtung mit Wobbel-Einrichtung
US6876718B2 (en) * 2003-06-27 2005-04-05 Ge Medical Systems Global Technology Company, Llc Scatter correction methods and apparatus
JP3942178B2 (ja) * 2003-07-29 2007-07-11 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線ｃｔシステム
JP3999179B2 (ja) * 2003-09-09 2007-10-31 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置
JP3961468B2 (ja) * 2003-09-19 2007-08-22 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線計算断層画像装置およびそれに用いる放射線検出器
US8180019B2 (en) * 2003-11-24 2012-05-15 Passport Systems, Inc. Methods and systems for computer tomography of nuclear isotopes using nuclear resonance fluorescence
US7120226B2 (en) * 2003-11-24 2006-10-10 Passport Systems, Inc. Adaptive scanning of materials using nuclear resonance fluorescence imaging
JP3950855B2 (ja) * 2004-01-07 2007-08-01 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 散乱測定方法、散乱補正方法およびｘ線ｃｔ装置
JP5054518B2 (ja) * 2004-07-08 2012-10-24 パスポート システムズ， インク． 物質の平均原子番号及び質量を求めるための方法及びシステム
CA2597731A1 (en) * 2005-02-22 2007-08-02 Passport Systems, Inc. Use of nearly monochromatic and tunable photon sources with nuclear resonance fluorescence in non-intrusive inspection of containers for material detection and imaging
EP1952229A4 (de) * 2005-11-09 2013-04-10 Passport Systems Inc Verfahren und systeme zur aktiven eingriffsfreien untersuchung und verifikation von fracht und waren
JP4586987B2 (ja) * 2005-11-24 2010-11-24 株式会社島津製作所 Ｘ線ｃｔ装置
JP2007333509A (ja) * 2006-06-14 2007-12-27 Hitachi Engineering & Services Co Ltd 放射線を用いた断層撮影装置及び断層撮影方法
US7539283B2 (en) * 2007-01-17 2009-05-26 Ge Homeland Protection, Inc. Combined computed tomography and nuclear resonance fluorescence cargo inspection system and method
US8184767B2 (en) * 2008-12-10 2012-05-22 General Electric Company Imaging system and method with scatter correction
US8121249B2 (en) * 2009-06-04 2012-02-21 Virginia Tech Intellectual Properties, Inc. Multi-parameter X-ray computed tomography
US8483351B2 (en) 2009-10-28 2013-07-09 Virginia Tech Intellectual Properties, Inc. Cardiac computed tomography methods and systems using fast exact/quasi-exact filtered back projection algorithms
EP3517037A1 (de) 2014-05-19 2019-07-31 3Shape A/S Radiographiesystem und verfahren zur verminderung der bewegungsunschärfe und streustrahlung
WO2016141956A1 (en) * 2015-03-06 2016-09-15 Ge Sensing & Inspection Technologies Gmbh Imaging system and method with scatter correction
WO2018112721A1 (en) * 2016-12-20 2018-06-28 Shenzhen Xpectvision Technology Co.,Ltd. Image sensors having x-ray detectors
EP3675741A4 (de) 2017-08-31 2020-09-09 Shanghai United Imaging Healthcare Co., Ltd. Verfahren und system zur bestimmung des ct-fokuspunktes
US10948428B2 (en) 2018-05-25 2021-03-16 Delavan Inc. Reducing scatter for computed tomography
JP7178204B2 (ja) * 2018-08-08 2022-11-25 セメス株式会社 Ｘ線検査装置、ｘ線検査方法
JP7187408B2 (ja) * 2019-09-06 2022-12-12 富士フイルム株式会社 トモシンセシス撮影装置
US11141128B2 (en) 2019-12-13 2021-10-12 General Electric Company Systems and methods for focal spot motion detection and correction
US11698349B2 (en) * 2020-10-09 2023-07-11 Baker Hughes Oilfield Operations Llc Scatter correction for computed tomography imaging
US11662321B2 (en) * 2020-10-09 2023-05-30 Baker Hughes Oilfield Operations Llc Scatter correction for computed tomography imaging
WO2022109870A1 (en) * 2020-11-25 2022-06-02 Shenzhen Xpectvision Technology Co., Ltd. Imaging methods using an image sensor with multiple radiation detectors

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GB1571509A (en) * 1976-03-03 1980-07-16 Emi Ltd Radiography
FR2372618A1 (fr) * 1976-12-02 1978-06-30 Emi Ltd Dispositif de collimation pour rayons penetrants et application a la tomographie axiale
US4691332A (en) * 1983-03-14 1987-09-01 American Science And Engineering, Inc. High energy computed tomography
DE3316003A1 (de) * 1983-05-03 1984-11-08 Philips Patentverwaltung Gmbh, 2000 Hamburg Vorrichtung zur beseitigung von streustrahlung
US4707608A (en) * 1985-04-10 1987-11-17 University Of North Carolina At Chapel Hill Kinestatic charge detection using synchronous displacement of detecting device
JPS61249452A (ja) * 1985-04-30 1986-11-06 株式会社東芝 Ｘ線診断装置
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
JPH0763464B2 (ja) * 1986-05-07 1995-07-12 株式会社東芝 Ｘ線ｃｔ装置
US5144141A (en) 1991-08-19 1992-09-01 General Electric Company Photodetector scintillator radiation imager
US5231654A (en) 1991-12-06 1993-07-27 General Electric Company Radiation imager collimator
US5231655A (en) 1991-12-06 1993-07-27 General Electric Company X-ray collimator
US5430298A (en) 1994-06-21 1995-07-04 General Electric Company CT array with improved photosensor linearity and reduced crosstalk

Also Published As

Publication number Publication date
JP2000321221A (ja) 2000-11-24
DE60033723T2 (de) 2007-11-29
US6175609B1 (en) 2001-01-16
JP3377496B2 (ja) 2003-02-17
SG80094A1 (en) 2001-04-17
EP1046903A3 (de) 2003-01-22
EP1046903A2 (de) 2000-10-25
BR0001638B1 (pt) 2011-11-16
BR0001638A (pt) 2001-01-02
EP1046903B1 (de) 2007-03-07

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