DE60026178D1 - Modellierung und prüfung einer integrierten schaltung - Google Patents

Modellierung und prüfung einer integrierten schaltung

Info

Publication number
DE60026178D1
DE60026178D1 DE60026178T DE60026178T DE60026178D1 DE 60026178 D1 DE60026178 D1 DE 60026178D1 DE 60026178 T DE60026178 T DE 60026178T DE 60026178 T DE60026178 T DE 60026178T DE 60026178 D1 DE60026178 D1 DE 60026178D1
Authority
DE
Germany
Prior art keywords
modeling
inspection
integrated circuit
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60026178T
Other languages
English (en)
Other versions
DE60026178T2 (de
Inventor
Frederic Hayem
Patrick Arnould
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE60026178D1 publication Critical patent/DE60026178D1/de
Publication of DE60026178T2 publication Critical patent/DE60026178T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE60026178T 1999-12-13 2000-12-07 Modellierung und prüfung einer integrierten schaltung Expired - Lifetime DE60026178T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/460,254 US6546514B1 (en) 1999-12-13 1999-12-13 Integrated circuit analysis and design involving defective circuit element replacement on a netlist
US460254 1999-12-13
PCT/US2000/042680 WO2001045565A2 (en) 1999-12-13 2000-12-07 Modeling and testing of an integrated circuit

Publications (2)

Publication Number Publication Date
DE60026178D1 true DE60026178D1 (de) 2006-04-27
DE60026178T2 DE60026178T2 (de) 2006-11-09

Family

ID=23827962

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60026178T Expired - Lifetime DE60026178T2 (de) 1999-12-13 2000-12-07 Modellierung und prüfung einer integrierten schaltung

Country Status (5)

Country Link
US (1) US6546514B1 (de)
EP (1) EP1259165B1 (de)
JP (1) JP2003523001A (de)
DE (1) DE60026178T2 (de)
WO (1) WO2001045565A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001201543A (ja) * 2000-01-18 2001-07-27 Rooran:Kk スキャン・パス構築用プログラムを記録した記録媒体とスキャン・パスの構築方法及びこのスキャン・パスを組み込んだ演算処理システム
US20040098646A1 (en) * 2002-11-20 2004-05-20 Fisher Rory L. Method and apparatus to check the integrity of scan chain connectivity by traversing the test logic of the device
US7194706B2 (en) * 2004-07-27 2007-03-20 International Business Machines Corporation Designing scan chains with specific parameter sensitivities to identify process defects
US20070011544A1 (en) * 2005-06-15 2007-01-11 Hsiu-Huan Shen Reprogramming of tester resource assignments
US9310433B2 (en) 2014-04-18 2016-04-12 Breker Verification Systems Testing SOC with portable scenario models and at different levels

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS647400A (en) * 1987-06-29 1989-01-11 Hitachi Ltd Ic tester
US5111413A (en) * 1989-03-24 1992-05-05 Vantage Analysis Systems, Inc. Computer-aided engineering
US5629860A (en) * 1994-05-16 1997-05-13 Motorola, Inc. Method for determining timing delays associated with placement and routing of an integrated circuit
US5754826A (en) * 1995-08-04 1998-05-19 Synopsys, Inc. CAD and simulation system for targeting IC designs to multiple fabrication processes
US5938782A (en) 1996-09-24 1999-08-17 Vlsi Technology, Inc. Scan flip-flop and methods for controlling the entry of data therein
US6219813B1 (en) * 1998-06-29 2001-04-17 International Business Machines Corporation Programmable timing circuit for testing the cycle time of functional circuits on an integrated circuit chip
US6308309B1 (en) * 1999-08-13 2001-10-23 Xilinx, Inc. Place-holding library elements for defining routing paths

Also Published As

Publication number Publication date
EP1259165A2 (de) 2002-11-27
WO2001045565A3 (en) 2002-09-12
JP2003523001A (ja) 2003-07-29
DE60026178T2 (de) 2006-11-09
EP1259165B1 (de) 2006-02-22
WO2001045565A2 (en) 2001-06-28
US6546514B1 (en) 2003-04-08

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Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8328 Change in the person/name/address of the agent

Representative=s name: VOLMER, G., DIPL.-ING., PAT.-ANW., 52066 AACHEN

8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL