DE60025510D1 - Messinstrument mit mehreren in mehreren betriebsarten verteilten signalanschlussklemmen. - Google Patents

Messinstrument mit mehreren in mehreren betriebsarten verteilten signalanschlussklemmen.

Info

Publication number
DE60025510D1
DE60025510D1 DE60025510T DE60025510T DE60025510D1 DE 60025510 D1 DE60025510 D1 DE 60025510D1 DE 60025510 T DE60025510 T DE 60025510T DE 60025510 T DE60025510 T DE 60025510T DE 60025510 D1 DE60025510 D1 DE 60025510D1
Authority
DE
Germany
Prior art keywords
several
measuring instrument
operating modes
connecting terminals
signal connecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60025510T
Other languages
English (en)
Other versions
DE60025510T2 (de
Inventor
Jun Kinase
Shunichi Sugita
Yasunori Yamada
Hidekazu Kono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Publication of DE60025510D1 publication Critical patent/DE60025510D1/de
Application granted granted Critical
Publication of DE60025510T2 publication Critical patent/DE60025510T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/342—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Recording Measured Values (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Indicating Measured Values (AREA)
DE60025510T 1999-10-25 2000-10-24 Messinstrument mit mehreren in mehreren betriebsarten verteilten signalanschlussklemmen. Expired - Lifetime DE60025510T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP30239799 1999-10-25
JP30239799A JP3486142B2 (ja) 1999-10-25 1999-10-25 測定装置
PCT/JP2000/007435 WO2001031352A1 (fr) 1999-10-25 2000-10-24 Instruments de mesure a bornes de signal multiples partagees dans des mode de fonctionnement multiples

Publications (2)

Publication Number Publication Date
DE60025510D1 true DE60025510D1 (de) 2006-04-06
DE60025510T2 DE60025510T2 (de) 2006-08-24

Family

ID=17908433

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60025510T Expired - Lifetime DE60025510T2 (de) 1999-10-25 2000-10-24 Messinstrument mit mehreren in mehreren betriebsarten verteilten signalanschlussklemmen.

Country Status (5)

Country Link
US (1) US6816708B1 (de)
EP (1) EP1162471B1 (de)
JP (1) JP3486142B2 (de)
DE (1) DE60025510T2 (de)
WO (1) WO2001031352A1 (de)

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5992357A (ja) * 1982-11-19 1984-05-28 テクトロニクス・インコ−ポレイテツド 遅延掃引オシロスコ−プの制御装置
US4823283A (en) * 1986-10-14 1989-04-18 Tektronix, Inc. Status driven menu system
DE3743543A1 (de) * 1987-12-22 1989-07-06 Asea Brown Boveri Bedien- und anzeigevorrichtung
JPH04291164A (ja) * 1991-03-20 1992-10-15 Yokogawa Electric Corp ロジックアナライザ
US5321420A (en) * 1991-04-26 1994-06-14 Motorola, Inc. Operator interface for an electronic measurement system
US5425076A (en) * 1992-06-30 1995-06-13 Minnesota Mining And Manufacturing Company Cellular communications test system
KR950004878B1 (ko) * 1992-12-29 1995-05-15 재단법인 한국전자통신연구소 미세 주파수 편이 검출방법
FI92966C (fi) * 1993-05-18 1995-01-25 Nokia Telecommunications Oy Menetelmä ja järjestely tukiaseman kunnon mittaamiseksi
US5521904A (en) * 1993-12-07 1996-05-28 Telefonaktiebolaget Lm Ericsson Method and apparatus for testing a base station in a time division multiple access radio communications system
JPH07162379A (ja) * 1993-12-13 1995-06-23 Ricoh Co Ltd 無線通信装置及びその送受信特性測定用アダプタ
US5686903A (en) * 1995-05-19 1997-11-11 Prince Corporation Trainable RF transceiver
JP3382764B2 (ja) * 1995-10-27 2003-03-04 松下電器産業株式会社 無線移動機
JP3017955B2 (ja) 1996-03-27 2000-03-13 アンリツ株式会社 無線機試験装置及び方法
JP3581218B2 (ja) * 1996-07-03 2004-10-27 株式会社東芝 移動通信端末装置とその携帯電話機並びにデータ端末装置
JPH1028088A (ja) * 1996-07-11 1998-01-27 Nec Corp 携帯電話無線基地局の試験用送受信装置
EP0971237A3 (de) * 1998-07-10 2000-09-13 Tektronix, Inc. Einfache Benutzerschnittstelle für ein digitales Speicheroszilloskop

Also Published As

Publication number Publication date
US6816708B1 (en) 2004-11-09
EP1162471A1 (de) 2001-12-12
WO2001031352A1 (fr) 2001-05-03
EP1162471A4 (de) 2005-06-01
JP2001125998A (ja) 2001-05-11
EP1162471B1 (de) 2006-01-11
DE60025510T2 (de) 2006-08-24
JP3486142B2 (ja) 2004-01-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition