DE60004399D1 - Verfahren und vorrichtung zur prüfung eines externen speichers mit einer eingebautem selbsttest - Google Patents

Verfahren und vorrichtung zur prüfung eines externen speichers mit einer eingebautem selbsttest

Info

Publication number
DE60004399D1
DE60004399D1 DE60004399T DE60004399T DE60004399D1 DE 60004399 D1 DE60004399 D1 DE 60004399D1 DE 60004399 T DE60004399 T DE 60004399T DE 60004399 T DE60004399 T DE 60004399T DE 60004399 D1 DE60004399 D1 DE 60004399D1
Authority
DE
Germany
Prior art keywords
testing
built
self
test
external memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60004399T
Other languages
English (en)
Other versions
DE60004399T2 (de
Inventor
Sie Boo Chiang
Beng Chew Khou
Jacques Wong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Micro Devices Inc
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of DE60004399D1 publication Critical patent/DE60004399D1/de
Application granted granted Critical
Publication of DE60004399T2 publication Critical patent/DE60004399T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60004399T 1999-12-29 2000-06-05 Verfahren und vorrichtung zur prüfung eines externen speichers mit einer eingebautem selbsttest Expired - Lifetime DE60004399T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US17348899P 1999-12-29 1999-12-29
US173488P 1999-12-29
US09/517,517 US6675335B1 (en) 1999-12-29 2000-03-02 Method and apparatus for exercising external memory with a memory built-in self-test
US517517 2000-03-02
PCT/US2000/015476 WO2001050474A1 (en) 1999-12-29 2000-06-05 Method and apparatus for exercising external memory with a memory built-in self-test

Publications (2)

Publication Number Publication Date
DE60004399D1 true DE60004399D1 (de) 2003-09-11
DE60004399T2 DE60004399T2 (de) 2004-06-09

Family

ID=26869204

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60004399T Expired - Lifetime DE60004399T2 (de) 1999-12-29 2000-06-05 Verfahren und vorrichtung zur prüfung eines externen speichers mit einer eingebautem selbsttest

Country Status (6)

Country Link
US (1) US6675335B1 (de)
EP (1) EP1242998B1 (de)
JP (1) JP4630514B2 (de)
KR (1) KR100776399B1 (de)
DE (1) DE60004399T2 (de)
WO (1) WO2001050474A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6912202B1 (en) * 2001-01-25 2005-06-28 Advanced Micro Device, Inc. Arrangement for testing network switch expansion port using external logic to emulate connected expansion port
US7096393B2 (en) * 2002-12-20 2006-08-22 Sun Microsystems, Inc. Built-in self-test (BIST) of memory interconnect
US7526692B2 (en) * 2004-09-30 2009-04-28 International Business Machines Corporation Diagnostic interface architecture for memory device
JP6503889B2 (ja) * 2015-05-25 2019-04-24 富士通株式会社 演算処理装置、情報処理装置および演算処理装置の制御方法
KR102649318B1 (ko) 2016-12-29 2024-03-20 삼성전자주식회사 상태 회로를 포함하는 메모리 장치와 그것의 동작 방법
US10663515B2 (en) 2017-11-01 2020-05-26 Nvidia Corp. Method and apparatus to access high volume test data over high speed interfaces

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2745669B2 (ja) 1989-04-27 1998-04-28 ブラザー工業株式会社 プリンタ
US5588115A (en) * 1993-01-29 1996-12-24 Teradyne, Inc. Redundancy analyzer for automatic memory tester
US5423028A (en) 1993-03-17 1995-06-06 Dell Usa, L.P. Diagnostic procedure for identifying presence of computer memory
US5410544A (en) * 1993-06-30 1995-04-25 Intel Corporation External tester control for flash memory
JPH07160570A (ja) * 1993-12-03 1995-06-23 Canon Inc 記憶制御装置
US5675545A (en) * 1995-09-08 1997-10-07 Ambit Design Systems, Inc. Method of forming a database that defines an integrated circuit memory with built in test circuitry
US5835502A (en) * 1996-06-28 1998-11-10 International Business Machines Corporation Method and apparatus for handling variable data word widths and array depths in a serial shared abist scheme
US5958072A (en) * 1997-01-13 1999-09-28 Hewlett-Packard Company Computer-system processor-to-memory-bus interface having repeating-test-event generation hardware
US5812472A (en) 1997-07-16 1998-09-22 Tanisys Technology, Inc. Nested loop method of identifying synchronous memories
US6080203A (en) * 1997-12-18 2000-06-27 Advanced Micro Devices, Inc. Apparatus and method for designing a test and modeling system for a network switch device
US6345371B1 (en) * 1999-05-05 2002-02-05 Advanced Micro Devices Inc. Method of performing diagnostic procedures on a queue structure

Also Published As

Publication number Publication date
KR20020065628A (ko) 2002-08-13
JP2003519851A (ja) 2003-06-24
KR100776399B1 (ko) 2007-11-16
DE60004399T2 (de) 2004-06-09
EP1242998B1 (de) 2003-08-06
WO2001050474A1 (en) 2001-07-12
JP4630514B2 (ja) 2011-02-09
US6675335B1 (en) 2004-01-06
EP1242998A1 (de) 2002-09-25

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