DE4001203A1 - Ultraschallmikroskop - Google Patents
UltraschallmikroskopInfo
- Publication number
- DE4001203A1 DE4001203A1 DE4001203A DE4001203A DE4001203A1 DE 4001203 A1 DE4001203 A1 DE 4001203A1 DE 4001203 A DE4001203 A DE 4001203A DE 4001203 A DE4001203 A DE 4001203A DE 4001203 A1 DE4001203 A1 DE 4001203A1
- Authority
- DE
- Germany
- Prior art keywords
- sample
- component
- container
- ultrasonic microscope
- microscope according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007788 liquid Substances 0.000 claims description 43
- 238000002604 ultrasonography Methods 0.000 claims description 13
- 238000006073 displacement reaction Methods 0.000 claims description 10
- 239000012530 fluid Substances 0.000 claims description 9
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 58
- 229910052757 nitrogen Inorganic materials 0.000 description 18
- 239000007789 gas Substances 0.000 description 5
- 239000012212 insulator Substances 0.000 description 5
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 238000004804 winding Methods 0.000 description 4
- 238000006356 dehydrogenation reaction Methods 0.000 description 3
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 239000000696 magnetic material Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 230000002706 hydrostatic effect Effects 0.000 description 1
- 210000003734 kidney Anatomy 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H3/00—Measuring characteristics of vibrations by using a detector in a fluid
- G01H3/10—Amplitude; Power
- G01H3/12—Amplitude; Power by electric means
- G01H3/125—Amplitude; Power by electric means for representing acoustic field distribution
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989003877U JPH0295860U (enExample) | 1989-01-19 | 1989-01-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE4001203A1 true DE4001203A1 (de) | 1990-08-02 |
| DE4001203C2 DE4001203C2 (enExample) | 1991-10-10 |
Family
ID=11569414
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE4001203A Granted DE4001203A1 (de) | 1989-01-19 | 1990-01-17 | Ultraschallmikroskop |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4986125A (enExample) |
| JP (1) | JPH0295860U (enExample) |
| DE (1) | DE4001203A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2150973A4 (en) * | 2007-05-10 | 2012-02-08 | Veeco Instr Inc | DESTRUCTIVE SURFACE ULTRASONIC MICROSCOPY AT WAFER LEVEL USING NAHFELD AFM DETECTION |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3924006A1 (de) * | 1988-07-21 | 1990-01-25 | Olympus Optical Co | Ultraschall-mikroskop |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5753655A (en) * | 1980-09-18 | 1982-03-30 | Olympus Optical Co Ltd | Ultrasonic microscope |
| DE3576752D1 (de) * | 1985-04-26 | 1990-04-26 | Ibm | Abtastendes ultraschallmikroskop. |
| JPS61259170A (ja) * | 1985-05-14 | 1986-11-17 | Olympus Optical Co Ltd | 超音波顕微鏡における試料の傾き調整装置 |
| JPS62231159A (ja) * | 1986-04-01 | 1987-10-09 | Olympus Optical Co Ltd | 超音波顕微鏡装置 |
-
1989
- 1989-01-19 JP JP1989003877U patent/JPH0295860U/ja active Pending
-
1990
- 1990-01-02 US US07/460,274 patent/US4986125A/en not_active Expired - Fee Related
- 1990-01-17 DE DE4001203A patent/DE4001203A1/de active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3924006A1 (de) * | 1988-07-21 | 1990-01-25 | Olympus Optical Co | Ultraschall-mikroskop |
Non-Patent Citations (1)
| Title |
|---|
| Acoustical Imaging, Vol. 12, (Ed.E.A.Ash and C.R. Hill), S. 13 bis 25, Plenum Press, New York * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2150973A4 (en) * | 2007-05-10 | 2012-02-08 | Veeco Instr Inc | DESTRUCTIVE SURFACE ULTRASONIC MICROSCOPY AT WAFER LEVEL USING NAHFELD AFM DETECTION |
Also Published As
| Publication number | Publication date |
|---|---|
| DE4001203C2 (enExample) | 1991-10-10 |
| US4986125A (en) | 1991-01-22 |
| JPH0295860U (enExample) | 1990-07-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |