DE3901592A1 - Interferenz-refraktometer - Google Patents

Interferenz-refraktometer

Info

Publication number
DE3901592A1
DE3901592A1 DE19893901592 DE3901592A DE3901592A1 DE 3901592 A1 DE3901592 A1 DE 3901592A1 DE 19893901592 DE19893901592 DE 19893901592 DE 3901592 A DE3901592 A DE 3901592A DE 3901592 A1 DE3901592 A1 DE 3901592A1
Authority
DE
Germany
Prior art keywords
length
vacuum chamber
measurement
measuring
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19893901592
Other languages
German (de)
English (en)
Inventor
Des Erfinders Auf Nennung Verzicht
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KERNER ANNA 2360 BAD SEGEBERG DE
Original Assignee
KERNER ANNA 2360 BAD SEGEBERG DE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KERNER ANNA 2360 BAD SEGEBERG DE filed Critical KERNER ANNA 2360 BAD SEGEBERG DE
Priority to DE19893901592 priority Critical patent/DE3901592A1/de
Priority to CH12390A priority patent/CH679891A5/de
Publication of DE3901592A1 publication Critical patent/DE3901592A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19893901592 1989-01-20 1989-01-20 Interferenz-refraktometer Withdrawn DE3901592A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19893901592 DE3901592A1 (de) 1989-01-20 1989-01-20 Interferenz-refraktometer
CH12390A CH679891A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1989-01-20 1990-01-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893901592 DE3901592A1 (de) 1989-01-20 1989-01-20 Interferenz-refraktometer

Publications (1)

Publication Number Publication Date
DE3901592A1 true DE3901592A1 (de) 1990-07-26

Family

ID=6372454

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19893901592 Withdrawn DE3901592A1 (de) 1989-01-20 1989-01-20 Interferenz-refraktometer

Country Status (2)

Country Link
CH (1) CH679891A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3901592A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2696545A1 (fr) * 1992-10-06 1994-04-08 Suisse Electronique Microtech Interféromètre comprenant un ensemble intégré et une unité réfléchissante séparés l'un de l'autre par une région de mesure.
EP0702205A3 (en) * 1994-09-16 1997-01-08 Queensgate Instr Ltd Interferometer
CN1095542C (zh) * 2000-02-25 2002-12-04 清华大学 双真空室双频测相空气折射率干涉仪

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2696545A1 (fr) * 1992-10-06 1994-04-08 Suisse Electronique Microtech Interféromètre comprenant un ensemble intégré et une unité réfléchissante séparés l'un de l'autre par une région de mesure.
EP0591911A3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1992-10-06 1994-04-27 Suisse Electronique Microtech
EP0702205A3 (en) * 1994-09-16 1997-01-08 Queensgate Instr Ltd Interferometer
CN1095542C (zh) * 2000-02-25 2002-12-04 清华大学 双真空室双频测相空气折射率干涉仪

Also Published As

Publication number Publication date
CH679891A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-04-30

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Legal Events

Date Code Title Description
8122 Nonbinding interest in granting licenses declared
8130 Withdrawal