DE3851176T3 - Vorrichtung und Verfahren zur Untersuchung von Teilchen. - Google Patents

Vorrichtung und Verfahren zur Untersuchung von Teilchen.

Info

Publication number
DE3851176T3
DE3851176T3 DE3851176T DE3851176T DE3851176T3 DE 3851176 T3 DE3851176 T3 DE 3851176T3 DE 3851176 T DE3851176 T DE 3851176T DE 3851176 T DE3851176 T DE 3851176T DE 3851176 T3 DE3851176 T3 DE 3851176T3
Authority
DE
Germany
Prior art keywords
particles
focal spot
laser diode
electrical signal
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3851176T
Other languages
English (en)
Other versions
DE3851176D1 (de
DE3851176T2 (de
Inventor
Fritz K Preikschat
Ekhard Preikschat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LASER SENSOR TECHNOLOGY, INC., REDMOND, WASH., US
Original Assignee
Laser Sensor Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27230427&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3851176(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from EP87304423A external-priority patent/EP0289677A3/de
Priority claimed from US07/119,797 external-priority patent/US4871251A/en
Application filed by Laser Sensor Tech Inc filed Critical Laser Sensor Tech Inc
Publication of DE3851176D1 publication Critical patent/DE3851176D1/de
Application granted granted Critical
Publication of DE3851176T2 publication Critical patent/DE3851176T2/de
Publication of DE3851176T3 publication Critical patent/DE3851176T3/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N15/1404—Fluid conditioning in flow cytometers, e.g. flow cells; Supply; Control of flow
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N2015/0238—Single particle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1757—Time modulation of light being essential to the method of light modification, e.g. using single detector
    • G01N2021/1759—Jittering, dithering, optical path modulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
DE3851176T 1987-04-27 1988-04-20 Vorrichtung und Verfahren zur Untersuchung von Teilchen. Expired - Fee Related DE3851176T3 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US4322387A 1987-04-27 1987-04-27
EP87304423A EP0289677A3 (de) 1987-04-27 1987-05-19 Einrichtung und Verfahren zum Untersuchen von Teilchen
US07/119,797 US4871251A (en) 1987-04-27 1987-11-12 Apparatus and method for particle analysis

Publications (3)

Publication Number Publication Date
DE3851176D1 DE3851176D1 (de) 1994-09-29
DE3851176T2 DE3851176T2 (de) 1995-01-19
DE3851176T3 true DE3851176T3 (de) 1999-02-11

Family

ID=27230427

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3851176T Expired - Fee Related DE3851176T3 (de) 1987-04-27 1988-04-20 Vorrichtung und Verfahren zur Untersuchung von Teilchen.

Country Status (3)

Country Link
EP (1) EP0289200B2 (de)
AT (1) ATE110467T1 (de)
DE (1) DE3851176T3 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2662803B1 (fr) * 1990-05-31 1992-09-04 Aerospatiale Dispositif et installation de cristallogenese pourvus de moyens d'observation.
US5426501A (en) * 1993-01-06 1995-06-20 Laser Sensor Technology, Inc. Apparatus and method for particle analysis
US5654797A (en) * 1996-02-22 1997-08-05 National Research Council Of Canada Method and apparatus for monitoring the diameter of thermally sprayed particles
DE19623095A1 (de) * 1996-06-10 1997-12-11 S & E Gmbh Service Und Entwick Vorrichtung zur Messung von Partikelabmessungen in Fluiden
EP1017987B1 (de) 1997-01-31 2005-06-15 The Horticulture And Food Research Institute Of New Zealand Limited Optische vorrichtung und methode
DE19723999B4 (de) * 1997-06-06 2008-04-10 Schwartz, Margit Vorrichtung zur Messung von Partikelabmessungen in Fluiden
US6149867A (en) 1997-12-31 2000-11-21 Xy, Inc. Sheath fluids and collection systems for sex-specific cytometer sorting of sperm
US7208265B1 (en) 1999-11-24 2007-04-24 Xy, Inc. Method of cryopreserving selected sperm cells
AU2002237689B2 (en) 2000-11-29 2008-01-10 Xy, Llc. System to separate frozen-thawed spermatozoa into X-chromosome bearing and Y-chromosome bearing populations
US7713687B2 (en) 2000-11-29 2010-05-11 Xy, Inc. System to separate frozen-thawed spermatozoa into x-chromosome bearing and y-chromosome bearing populations
EP1545203B1 (de) 2002-08-01 2016-10-19 Xy, Llc Mit niederdruck arbeitendes spermazellentrennsystem
US8486618B2 (en) 2002-08-01 2013-07-16 Xy, Llc Heterogeneous inseminate system
BRPI0313476B1 (pt) 2002-08-15 2015-06-23 Xy Llc Citômetro de fluxo de alta resolução
US6787633B2 (en) 2002-09-13 2004-09-07 General Electric Company Method and apparatus for preparing a poly(arylene ether)
US7169548B2 (en) 2002-09-13 2007-01-30 Xy, Inc. Sperm cell processing and preservation systems
EP2306174B1 (de) 2003-03-28 2016-05-11 Inguran, LLC Durchflusszytometriedüse zur Orientierung von Partikeln und entsprechendes Verfahren
NZ544103A (en) 2003-05-15 2010-10-29 Xy Llc Efficient haploid cell sorting for flow cytometer systems
WO2005095590A2 (en) 2004-03-29 2005-10-13 Monsanto Technology Llc Sperm suspensions for sorting into x or y chromosome-bearing enriched populations
US7833147B2 (en) 2004-07-22 2010-11-16 Inguran, LLC. Process for enriching a population of sperm cells
DE102005021179A1 (de) * 2005-05-06 2006-11-09 Lt-Research Gmbh Adaptive Signalinterpretation für FBRM-Messgeräte
CN103562708A (zh) 2011-04-08 2014-02-05 Abb研究有限公司 分析仪器及其操作方法
DE102013203109A1 (de) * 2013-02-26 2014-08-28 Siemens Aktiengesellschaft Staubleitung mit optischem Sensor und Verfahren zur Messung der Zusammensetzung von Staub
US10126220B2 (en) 2013-07-22 2018-11-13 National Oilwell Varco, L.P. Systems and methods for determining specific gravity and minerological properties of a particle
US11169086B2 (en) 2015-04-10 2021-11-09 Blaze Metrics, LLC System and method for simultaneously performing multiple optical analyses of liquids and particles in a fluid
DE102015116474A1 (de) 2015-09-29 2017-03-30 Hochschule Reutlingen Verfahren zum Ermitteln von Deskriptoren, welche mit Eigenschaften eines Partikelkollektivs korrelieren
WO2017060105A1 (en) * 2015-10-08 2017-04-13 Koninklijke Philips N.V. Particle sensor for particle detection
DE102017207402A1 (de) 2017-05-03 2018-11-08 Robert Bosch Gmbh Optischer Rußpartikelsensor für Kraftfahrzeuge
US10274410B1 (en) * 2018-01-23 2019-04-30 Cbrn International, Ltd. Bioaerosol particle detector
CN109974583B (zh) * 2019-04-11 2024-03-26 南京信息工程大学 一种非接触光学元件表面面形测量装置及方法
DE102020202332A1 (de) * 2020-02-24 2021-08-26 Robert Bosch Gesellschaft mit beschränkter Haftung Partikelsensorvorrichtung mit einem auswechselbaren transparenten Abdeckelement

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE759821A (fr) * 1969-12-04 1971-05-17 Procedyne Corp Appareil et procede d'analyse de particules materielles
US3781674A (en) * 1971-07-22 1973-12-25 Coulter Electronics Noise discriminating circuitry and method for electronic particle study apparatus
US3858851A (en) * 1973-07-05 1975-01-07 Prototron Ass Apparatus for providing a statistical count of particulate material in a fluid
US4140395A (en) * 1976-12-07 1979-02-20 Environmental Systems Corporation Electro-optical method and system for in situ measurements of particle size and distribution

Also Published As

Publication number Publication date
EP0289200B2 (de) 1998-07-22
DE3851176D1 (de) 1994-09-29
EP0289200A3 (en) 1990-04-04
ATE110467T1 (de) 1994-09-15
EP0289200A2 (de) 1988-11-02
EP0289200B1 (de) 1994-08-24
DE3851176T2 (de) 1995-01-19

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8327 Change in the person/name/address of the patent owner

Owner name: LASER SENSOR TECHNOLOGY, INC., REDMOND, WASH., US

8328 Change in the person/name/address of the agent

Free format text: LEINWEBER & ZIMMERMANN, 80331 MUENCHEN

8381 Inventor (new situation)

Free format text: PREIKSCHAT, FRITZ K., REDMOND, WASH., US PREIKSCHAT, EKHARD, BELLEVUE, WASH., US

8366 Restricted maintained after opposition proceedings
8310 Action for declaration of annulment
8314 Invalidation rejected
8339 Ceased/non-payment of the annual fee