DE3833486C1 - - Google Patents

Info

Publication number
DE3833486C1
DE3833486C1 DE3833486A DE3833486A DE3833486C1 DE 3833486 C1 DE3833486 C1 DE 3833486C1 DE 3833486 A DE3833486 A DE 3833486A DE 3833486 A DE3833486 A DE 3833486A DE 3833486 C1 DE3833486 C1 DE 3833486C1
Authority
DE
Germany
Prior art keywords
signal
pulse
phase
ramp
digital signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3833486A
Other languages
German (de)
English (en)
Inventor
Dieter Dipl.-Ing. 7412 Eningen De Brandt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wandel & Goltermann & Co 7412 Eningen De GmbH
Original Assignee
Wandel & Goltermann & Co 7412 Eningen De GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wandel & Goltermann & Co 7412 Eningen De GmbH filed Critical Wandel & Goltermann & Co 7412 Eningen De GmbH
Priority to DE3833486A priority Critical patent/DE3833486C1/de
Priority to EP89112533A priority patent/EP0362491B1/de
Application granted granted Critical
Publication of DE3833486C1 publication Critical patent/DE3833486C1/de
Priority to DK471789A priority patent/DK471789A/da
Priority to JP1255371A priority patent/JPH0677041B2/ja
Priority to US07/416,246 priority patent/US4974234A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/06—Measuring depth of modulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Manipulation Of Pulses (AREA)
  • Measuring Phase Differences (AREA)
  • Dc Digital Transmission (AREA)
DE3833486A 1988-10-01 1988-10-01 Expired DE3833486C1 (US08088816-20120103-C00036.png)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE3833486A DE3833486C1 (US08088816-20120103-C00036.png) 1988-10-01 1988-10-01
EP89112533A EP0362491B1 (de) 1988-10-01 1989-07-08 Verfahren und Schaltungsanordnung zum Messen der Jittermodulation von nullenbehafteten Digitalsignalen
DK471789A DK471789A (da) 1988-10-01 1989-09-26 Fremgangsmaade og kobling til maaling af modulation
JP1255371A JPH0677041B2 (ja) 1988-10-01 1989-10-02 デジタル信号のジツタ変調の測定方法及び回路装置
US07/416,246 US4974234A (en) 1988-10-01 1989-10-02 Method of and circuit for the measurement of jitter modulation of zero-related digital signals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3833486A DE3833486C1 (US08088816-20120103-C00036.png) 1988-10-01 1988-10-01

Publications (1)

Publication Number Publication Date
DE3833486C1 true DE3833486C1 (US08088816-20120103-C00036.png) 1989-08-03

Family

ID=6364221

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3833486A Expired DE3833486C1 (US08088816-20120103-C00036.png) 1988-10-01 1988-10-01

Country Status (5)

Country Link
US (1) US4974234A (US08088816-20120103-C00036.png)
EP (1) EP0362491B1 (US08088816-20120103-C00036.png)
JP (1) JPH0677041B2 (US08088816-20120103-C00036.png)
DE (1) DE3833486C1 (US08088816-20120103-C00036.png)
DK (1) DK471789A (US08088816-20120103-C00036.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996003659A1 (de) * 1994-07-21 1996-02-08 Siemens Aktiengesellschaft Verfahren zum messen des phasenjitters eines datensignals

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9102936D0 (en) * 1991-02-12 1991-03-27 Shaye Communications Ltd Digital communications systems
ES2048095B1 (es) * 1992-02-28 1997-01-01 Alcatel Standard Electrica Sistema para medir la funcion de transferencia de la fluctuacion de fase en sistemas de transmision digitales.
WO2004077079A1 (ja) * 1993-08-25 2004-09-10 Hitoshi Ujiie ジッタ解析装置
FR2716592B1 (fr) * 1994-02-21 1996-04-26 Audio Visuel Systemes Procédé et dispositif pour mesurer la gigue d'un signal numérique.
US5481563A (en) * 1994-03-14 1996-01-02 Network Systems Corporation Jitter measurement using a statistically locked loop
JPH10325854A (ja) * 1997-05-26 1998-12-08 Sony Corp 半導体装置
GB9809450D0 (en) 1998-05-01 1998-07-01 Wandel & Goltermann Limited Jitter measurement
JP3703997B2 (ja) * 1999-07-06 2005-10-05 沖電気工業株式会社 映像信号制御回路
US6956422B2 (en) * 2003-03-17 2005-10-18 Indiana University Research And Technology Corporation Generation and measurement of timing delays by digital phase error compensation
JP5143341B2 (ja) * 2004-02-18 2013-02-13 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法およびプログラム
US7389449B2 (en) * 2004-09-30 2008-06-17 Credence Systems Corporation Edge selecting triggering circuit
JP2007040742A (ja) * 2005-08-01 2007-02-15 Yokogawa Electric Corp ジッタ測定装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3496536A (en) * 1966-05-02 1970-02-17 Xerox Corp Data link test apparatus
US3771059A (en) * 1972-03-27 1973-11-06 Rca Corp Universal data quality monitor
DE2358296B2 (de) * 1973-11-22 1977-05-26 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zum messen der verzerrung von datensignalen
US3916307A (en) * 1974-02-14 1975-10-28 Hekimian Laboratories Inc Time jitter meter
DE2846271C2 (de) * 1978-10-24 1981-01-08 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltung zur Ermittlung des Phasenjitters von Digitalsignalen
DE2921573A1 (de) * 1979-05-28 1980-12-04 Siemens Ag Messung des jitters von taktsignalen in digitalen uebertragungssystemen hoher bitrate
EP0166839B1 (fr) * 1984-06-29 1989-05-17 International Business Machines Corporation Procédé et dispositif de mesure de la gigue de phase d'un canal de transmission
US4694468A (en) * 1986-04-25 1987-09-15 Eastman Kodak Company Apparatus useful in channel equalization adjustment
US4800571A (en) * 1988-01-11 1989-01-24 Tektronix, Inc. Timing jitter measurement display

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
TIETZE, SCHENK: Halbleiter-Schaltungstechnik, 7.Aufl. 1985, Springer-Verlag, S.819-822 und S.824-827 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996003659A1 (de) * 1994-07-21 1996-02-08 Siemens Aktiengesellschaft Verfahren zum messen des phasenjitters eines datensignals

Also Published As

Publication number Publication date
JPH0677041B2 (ja) 1994-09-28
EP0362491A2 (de) 1990-04-11
EP0362491A3 (de) 1991-10-09
EP0362491B1 (de) 1994-12-14
DK471789A (da) 1990-04-02
DK471789D0 (da) 1989-09-26
JPH02147866A (ja) 1990-06-06
US4974234A (en) 1990-11-27

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Legal Events

Date Code Title Description
8100 Publication of patent without earlier publication of application
D1 Grant (no unexamined application published) patent law 81
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee