DE3824948A1 - Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung - Google Patents
Wirbelstrom-einrichtung zur zerstoerungsfreien pruefungInfo
- Publication number
- DE3824948A1 DE3824948A1 DE19883824948 DE3824948A DE3824948A1 DE 3824948 A1 DE3824948 A1 DE 3824948A1 DE 19883824948 DE19883824948 DE 19883824948 DE 3824948 A DE3824948 A DE 3824948A DE 3824948 A1 DE3824948 A1 DE 3824948A1
- Authority
- DE
- Germany
- Prior art keywords
- output
- input
- capacitor
- coupled
- eddy current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009659 non-destructive testing Methods 0.000 title claims abstract description 18
- 239000003990 capacitor Substances 0.000 claims description 31
- 238000004804 winding Methods 0.000 claims description 22
- 230000007935 neutral effect Effects 0.000 claims description 7
- 230000005284 excitation Effects 0.000 claims description 5
- XUKUURHRXDUEBC-KAYWLYCHSA-N Atorvastatin Chemical compound C=1C=CC=CC=1C1=C(C=2C=CC(F)=CC=2)N(CC[C@@H](O)C[C@@H](O)CC(O)=O)C(C(C)C)=C1C(=O)NC1=CC=CC=C1 XUKUURHRXDUEBC-KAYWLYCHSA-N 0.000 claims 1
- 238000000576 coating method Methods 0.000 description 20
- 239000002184 metal Substances 0.000 description 19
- 239000011248 coating agent Substances 0.000 description 18
- 238000005259 measurement Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 10
- 238000012360 testing method Methods 0.000 description 10
- 230000001066 destructive effect Effects 0.000 description 5
- 230000001960 triggered effect Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 210000004072 lung Anatomy 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19883824948 DE3824948A1 (de) | 1988-07-22 | 1988-07-22 | Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19883824948 DE3824948A1 (de) | 1988-07-22 | 1988-07-22 | Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3824948A1 true DE3824948A1 (de) | 1990-01-25 |
| DE3824948C2 DE3824948C2 (enrdf_load_stackoverflow) | 1991-01-31 |
Family
ID=6359330
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19883824948 Granted DE3824948A1 (de) | 1988-07-22 | 1988-07-22 | Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3824948A1 (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0459441A3 (en) * | 1990-05-30 | 1993-02-10 | The Furukawa Electric Co., Ltd. | Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibers using method and system |
| WO2001022075A3 (en) * | 1999-09-23 | 2001-11-15 | Apv Ltd | Apparatus and method for detecting cracks in metal articles |
| CN120326199A (zh) * | 2025-06-10 | 2025-07-18 | 苏州星祥益精密制造有限公司 | 一种基于非接触电阻测量的飞秒激光加工测控系统 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19908360A1 (de) * | 1998-12-18 | 2000-06-29 | Micro Epsilon Messtechnik | Verfahren zum Betreiben eines Wirbelstromsensors und Wirbelstromsensor |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU508734A1 (ru) * | 1973-12-04 | 1976-03-30 | Предприятие П/Я А-1857 | Вихретоковый накладной преобразователь |
| SU538213A1 (ru) * | 1975-06-03 | 1976-12-05 | Предприятие П/Я Р-6303 | Электромагнитный толщиномер |
| DE3005915A1 (de) * | 1980-02-16 | 1981-08-27 | Skf Kugellagerfabriken Gmbh, 8720 Schweinfurt | Wirbelstrompruefgeraet fuer oberflaechenfehler |
| SU862063A1 (ru) * | 1978-04-11 | 1981-09-07 | Физико-Энергетический Институт Ан Латвийской Сср | Способ измерени сопротивлени тонких провод щих покрытий и устройство дл его реализации |
-
1988
- 1988-07-22 DE DE19883824948 patent/DE3824948A1/de active Granted
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU508734A1 (ru) * | 1973-12-04 | 1976-03-30 | Предприятие П/Я А-1857 | Вихретоковый накладной преобразователь |
| SU538213A1 (ru) * | 1975-06-03 | 1976-12-05 | Предприятие П/Я Р-6303 | Электромагнитный толщиномер |
| SU862063A1 (ru) * | 1978-04-11 | 1981-09-07 | Физико-Энергетический Институт Ан Латвийской Сср | Способ измерени сопротивлени тонких провод щих покрытий и устройство дл его реализации |
| DE3005915A1 (de) * | 1980-02-16 | 1981-08-27 | Skf Kugellagerfabriken Gmbh, 8720 Schweinfurt | Wirbelstrompruefgeraet fuer oberflaechenfehler |
Non-Patent Citations (3)
| Title |
|---|
| Juni 1977, S. 39-44 * |
| US-Buch: Materials Evaluation * |
| US-Buch: Non destructive Testing Handbook, IV. Volume, 1987, S. 164-171, 287, 288 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0459441A3 (en) * | 1990-05-30 | 1993-02-10 | The Furukawa Electric Co., Ltd. | Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibers using method and system |
| WO2001022075A3 (en) * | 1999-09-23 | 2001-11-15 | Apv Ltd | Apparatus and method for detecting cracks in metal articles |
| CN120326199A (zh) * | 2025-06-10 | 2025-07-18 | 苏州星祥益精密制造有限公司 | 一种基于非接触电阻测量的飞秒激光加工测控系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3824948C2 (enrdf_load_stackoverflow) | 1991-01-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |