DE3810312A1 - Geraet zum erfassen von agglomerationsbildung - Google Patents

Geraet zum erfassen von agglomerationsbildung

Info

Publication number
DE3810312A1
DE3810312A1 DE3810312A DE3810312A DE3810312A1 DE 3810312 A1 DE3810312 A1 DE 3810312A1 DE 3810312 A DE3810312 A DE 3810312A DE 3810312 A DE3810312 A DE 3810312A DE 3810312 A1 DE3810312 A1 DE 3810312A1
Authority
DE
Germany
Prior art keywords
agglomeration
luminescence
crucible
detecting
agglomerations
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE3810312A
Other languages
German (de)
English (en)
Other versions
DE3810312C2 (enrdf_load_stackoverflow
Inventor
Toshinori Prof Takagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Futaba Corp
Original Assignee
Futaba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Futaba Corp filed Critical Futaba Corp
Publication of DE3810312A1 publication Critical patent/DE3810312A1/de
Application granted granted Critical
Publication of DE3810312C2 publication Critical patent/DE3810312C2/de
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/221Ion beam deposition
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/52Means for observation of the coating process
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Physical Vapour Deposition (AREA)
DE3810312A 1987-03-27 1988-03-26 Geraet zum erfassen von agglomerationsbildung Granted DE3810312A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62075732A JPH0816265B2 (ja) 1987-03-27 1987-03-27 クラスタ検出装置

Publications (2)

Publication Number Publication Date
DE3810312A1 true DE3810312A1 (de) 1988-10-06
DE3810312C2 DE3810312C2 (enrdf_load_stackoverflow) 1993-07-01

Family

ID=13584736

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3810312A Granted DE3810312A1 (de) 1987-03-27 1988-03-26 Geraet zum erfassen von agglomerationsbildung

Country Status (2)

Country Link
JP (1) JPH0816265B2 (enrdf_load_stackoverflow)
DE (1) DE3810312A1 (enrdf_load_stackoverflow)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3897155A (en) * 1972-08-04 1975-07-29 Unisearch Ltd Atomic fluorescence spectrometer
DE2540911A1 (de) * 1974-10-09 1976-04-29 Balzers Hochvakuum Verfahren zur bestimmung des teilchenflusses in einer vakuumbeschichtungsanlage und vorrichtung zur durchfuehrung des verfahrens
JPS566333B2 (enrdf_load_stackoverflow) * 1977-07-04 1981-02-10
JPS5641165B2 (enrdf_load_stackoverflow) * 1977-02-12 1981-09-26

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62230974A (ja) * 1986-04-01 1987-10-09 Canon Inc 結晶成長装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3897155A (en) * 1972-08-04 1975-07-29 Unisearch Ltd Atomic fluorescence spectrometer
DE2540911A1 (de) * 1974-10-09 1976-04-29 Balzers Hochvakuum Verfahren zur bestimmung des teilchenflusses in einer vakuumbeschichtungsanlage und vorrichtung zur durchfuehrung des verfahrens
JPS5641165B2 (enrdf_load_stackoverflow) * 1977-02-12 1981-09-26
JPS566333B2 (enrdf_load_stackoverflow) * 1977-07-04 1981-02-10

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Messen-Prüfen-Automatisieren, Jan/Feb 1986, S. 58-60 *
Proceedings of the Sixth Symposium on Ion Sources and Ion Assisted Technology, 1982, S. 47-52 *
Spectrochimica Acta, Vol. 28B, 1973, S. 197-210 *
Z. Phys. D-Atoms, Molecules and Clustors, Bd. 3, 1986, S. 134-142 *

Also Published As

Publication number Publication date
JPS63241163A (ja) 1988-10-06
JPH0816265B2 (ja) 1996-02-21
DE3810312C2 (enrdf_load_stackoverflow) 1993-07-01

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: GROSSE, BOCKHORNI, SCHUMACHER, 81476 MUENCHEN

8339 Ceased/non-payment of the annual fee