DE3774164D1 - Energieanalysator fuer geladene teilchen. - Google Patents
Energieanalysator fuer geladene teilchen.Info
- Publication number
- DE3774164D1 DE3774164D1 DE8787303197T DE3774164T DE3774164D1 DE 3774164 D1 DE3774164 D1 DE 3774164D1 DE 8787303197 T DE8787303197 T DE 8787303197T DE 3774164 T DE3774164 T DE 3774164T DE 3774164 D1 DE3774164 D1 DE 3774164D1
- Authority
- DE
- Germany
- Prior art keywords
- charged particles
- energy analyzer
- analyzer
- energy
- charged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/285—Emission microscopes, e.g. field-emission microscopes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/05—Arrangements for energy or mass analysis
- H01J2237/053—Arrangements for energy or mass analysis electrostatic
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868609740A GB8609740D0 (en) | 1986-04-22 | 1986-04-22 | Charged particle energy analyser |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3774164D1 true DE3774164D1 (de) | 1991-12-05 |
Family
ID=10596586
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787303197T Expired - Lifetime DE3774164D1 (de) | 1986-04-22 | 1987-04-13 | Energieanalysator fuer geladene teilchen. |
DE198787303197T Pending DE243060T1 (de) | 1986-04-22 | 1987-04-13 | Energieanalysator fuer geladene teilchen. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE198787303197T Pending DE243060T1 (de) | 1986-04-22 | 1987-04-13 | Energieanalysator fuer geladene teilchen. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4810879A (de) |
EP (1) | EP0243060B1 (de) |
JP (1) | JPH0727556Y2 (de) |
DE (2) | DE3774164D1 (de) |
GB (1) | GB8609740D0 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8801163A (nl) * | 1988-05-04 | 1989-12-01 | Philips Nv | Auger spectrometrie. |
US5089699A (en) * | 1989-03-14 | 1992-02-18 | Hitachi, Ltd. | Secondary charged particle analyzing apparatus and secondary charged particle extracting section |
GB2244369A (en) * | 1990-05-22 | 1991-11-27 | Kratos Analytical Ltd | Charged particle energy analysers |
GB9122161D0 (en) * | 1991-10-18 | 1991-11-27 | Kratos Analytical Ltd | Charged particle energy analysers |
US5315113A (en) * | 1992-09-29 | 1994-05-24 | The Perkin-Elmer Corporation | Scanning and high resolution x-ray photoelectron spectroscopy and imaging |
US5444242A (en) * | 1992-09-29 | 1995-08-22 | Physical Electronics Inc. | Scanning and high resolution electron spectroscopy and imaging |
GB9306374D0 (en) * | 1993-03-26 | 1993-05-19 | Fisons Plc | Charged-particle analyser |
US5506414A (en) * | 1993-03-26 | 1996-04-09 | Fisons Plc | Charged-particle analyzer |
US5353321A (en) * | 1993-06-21 | 1994-10-04 | Aleksandr Rybnikov | Plasma thermoelement |
US6051839A (en) * | 1996-06-07 | 2000-04-18 | Arch Development Corporation | Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes |
JP3441955B2 (ja) * | 1998-02-23 | 2003-09-02 | 株式会社日立製作所 | 投射方式の荷電粒子顕微鏡および基板検査システム |
JP3805565B2 (ja) * | 1999-06-11 | 2006-08-02 | 株式会社日立製作所 | 電子線画像に基づく検査または計測方法およびその装置 |
WO2001082327A2 (en) * | 2000-04-24 | 2001-11-01 | Fei Company | Collection of secondary electrons through the objective lens of a scanning electron microscope |
JP4178741B2 (ja) * | 2000-11-02 | 2008-11-12 | 株式会社日立製作所 | 荷電粒子線装置および試料作製装置 |
GB2428868B (en) * | 2005-10-28 | 2008-11-19 | Thermo Electron Corp | Spectrometer for surface analysis and method therefor |
US7718961B1 (en) | 2007-01-15 | 2010-05-18 | Raymond Browning | Photoelectron microscope |
US7608838B1 (en) | 2007-01-15 | 2009-10-27 | Raymond Browning | Electron optical component |
US7569816B1 (en) | 2007-01-15 | 2009-08-04 | Raymond Browning | Electron spectrometer |
US20110006205A1 (en) * | 2009-07-12 | 2011-01-13 | Raymond Browning | Ambient pressure photoelectron microscope |
US8183526B1 (en) * | 2011-02-11 | 2012-05-22 | Electron Optica | Mirror monochromator for charged particle beam apparatus |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5129437B1 (de) * | 1970-08-19 | 1976-08-25 | ||
GB1332207A (en) * | 1971-05-07 | 1973-10-03 | Ass Elect Ind | Apparatus for charged particle spectroscopy |
US3822382A (en) * | 1971-08-17 | 1974-07-02 | Jeol Ltd | Apparatus for analyzing electron energy |
FR2193253B1 (de) * | 1972-07-21 | 1975-03-07 | Cameca | |
JPS5811569B2 (ja) * | 1974-01-22 | 1983-03-03 | 日本電子株式会社 | デンシブンコウソウチ |
DE2538521C2 (de) * | 1975-08-28 | 1977-09-08 | Siemens AG, 1000 Berlin und 8000 München | Korpuskularstrahl-Transmissionsmikroskop mit einem hinter dem Präparat liegenden Ablenksystem |
FR2363882A1 (fr) * | 1976-09-01 | 1978-03-31 | Commissariat Energie Atomique | Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants |
US4358680A (en) * | 1979-11-30 | 1982-11-09 | Kratos Limited | Charged particle spectrometers |
JPS6071064U (ja) * | 1983-10-21 | 1985-05-20 | 日本電子株式会社 | 分析電子顕微鏡 |
US4680467A (en) * | 1986-04-08 | 1987-07-14 | Kevex Corporation | Electron spectroscopy system for chemical analysis of electrically isolated specimens |
-
1986
- 1986-04-22 GB GB868609740A patent/GB8609740D0/en active Pending
-
1987
- 1987-04-10 US US07/036,899 patent/US4810879A/en not_active Expired - Lifetime
- 1987-04-13 DE DE8787303197T patent/DE3774164D1/de not_active Expired - Lifetime
- 1987-04-13 EP EP87303197A patent/EP0243060B1/de not_active Expired
- 1987-04-13 DE DE198787303197T patent/DE243060T1/de active Pending
- 1987-04-22 JP JP1987059984U patent/JPH0727556Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0243060B1 (de) | 1991-10-30 |
US4810879A (en) | 1989-03-07 |
GB8609740D0 (en) | 1986-05-29 |
JPS62176959U (de) | 1987-11-10 |
JPH0727556Y2 (ja) | 1995-06-21 |
EP0243060A3 (en) | 1988-07-20 |
DE243060T1 (de) | 1988-02-25 |
EP0243060A2 (de) | 1987-10-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |