GB1332207A - Apparatus for charged particle spectroscopy - Google Patents

Apparatus for charged particle spectroscopy

Info

Publication number
GB1332207A
GB1332207A GB1332207DA GB1332207A GB 1332207 A GB1332207 A GB 1332207A GB 1332207D A GB1332207D A GB 1332207DA GB 1332207 A GB1332207 A GB 1332207A
Authority
GB
United Kingdom
Prior art keywords
effect
apparatus
described
charged particle
analyser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Ind Ltd
Original Assignee
Associated Electrical Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Ind Ltd filed Critical Associated Electrical Ind Ltd
Priority to GB1384471 priority Critical
Publication of GB1332207A publication Critical patent/GB1332207A/en
Application status is Expired legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/484Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors

Abstract

1332207 Particle spectrometers ASSOCIATED ELECTRICAL INDUSTRIES Ltd 3 May 1972 [7 May 1971] 13844/71 Heading H1D A particle spectrometer generally similar to that described in Specification 1,303,136 has an apertured plate 12 at the entrance to the energy analyser at which an image of an irradiated sample 1 is formed, the effect of the aperture being to permit only those particles from a small region of the sample to enter the analyser, thereby giving a microprobe effect. Various arrangements of the focusing electrodes, 7, 8, 9 in Fig. 1, and the potentials applied thereto are described with reference to Figs. 2 to 5 (not shown).
GB1332207D 1971-05-07 1971-05-07 Apparatus for charged particle spectroscopy Expired GB1332207A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1384471 1971-05-07

Publications (1)

Publication Number Publication Date
GB1332207A true GB1332207A (en) 1973-10-03

Family

ID=10030367

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1332207D Expired GB1332207A (en) 1971-05-07 1971-05-07 Apparatus for charged particle spectroscopy

Country Status (3)

Country Link
US (1) US3766381A (en)
DE (1) DE2222339A1 (en)
GB (1) GB1332207A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4255656A (en) * 1978-05-25 1981-03-10 Kratos Limited Apparatus for charged particle spectroscopy
DE3045013A1 (en) * 1979-11-30 1981-09-03 Kratos Ltd electron spectrometer
US5506414A (en) * 1993-03-26 1996-04-09 Fisons Plc Charged-particle analyzer

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3870882A (en) * 1973-05-23 1975-03-11 Gca Corp Esca x-ray source
DE2331091C3 (en) * 1973-06-19 1980-03-20 Leybold-Heraeus Gmbh, 5000 Koeln
JPS5811569B2 (en) * 1974-01-22 1983-03-03 Nippon Electron Optics Lab
GB8322017D0 (en) * 1983-08-16 1983-09-21 Vg Instr Ltd Charged particle energy spectrometer
GB8609740D0 (en) * 1986-04-22 1986-05-29 Spectros Ltd Charged particle energy analyser
GB8609739D0 (en) * 1986-04-22 1986-05-29 Spectros Ltd Charged particle analyser
US4810880A (en) * 1987-06-05 1989-03-07 The Perkin-Elmer Corporation Direct imaging monochromatic electron microscope
US4806754A (en) * 1987-06-19 1989-02-21 The Perkin-Elmer Corporation High luminosity spherical analyzer for charged particles
DE69027602T2 (en) * 1990-08-08 1997-01-23 Philips Electronics Nv Energy filter for carrier device
US5118941A (en) * 1991-04-23 1992-06-02 The Perkin-Elmer Corporation Apparatus and method for locating target area for electron microanalysis
US5444242A (en) * 1992-09-29 1995-08-22 Physical Electronics Inc. Scanning and high resolution electron spectroscopy and imaging
US5315113A (en) * 1992-09-29 1994-05-24 The Perkin-Elmer Corporation Scanning and high resolution x-ray photoelectron spectroscopy and imaging
GB9306374D0 (en) * 1993-03-26 1993-05-19 Fisons Plc Charged-particle analyser
US5602899A (en) * 1996-01-31 1997-02-11 Physical Electronics Inc. Anode assembly for generating x-rays and instrument with such anode assembly
US7449682B2 (en) * 2001-10-26 2008-11-11 Revera Incorporated System and method for depth profiling and characterization of thin films
US6800852B2 (en) * 2002-12-27 2004-10-05 Revera Incorporated Nondestructive characterization of thin films using measured basis spectra
US6891158B2 (en) * 2002-12-27 2005-05-10 Revera Incorporated Nondestructive characterization of thin films based on acquired spectrum
US7561438B1 (en) 2004-12-22 2009-07-14 Revera Incorporated Electronic device incorporating a multilayered capacitor formed on a printed circuit board
US7411188B2 (en) * 2005-07-11 2008-08-12 Revera Incorporated Method and system for non-destructive distribution profiling of an element in a film
KR101844172B1 (en) 2007-10-02 2018-03-30 테라노스, 인코포레이티드 Modular point-of-care devices and uses thereof
DE102009044989A1 (en) * 2009-09-24 2011-03-31 Funnemann, Dietmar, Dr. Imaging energy filter for electrically charged particles, and with such a spectroscope
TW201802245A (en) 2011-01-21 2018-01-16 Theranos Inc Systems and methods for sample use maximization
US8435738B2 (en) 2011-09-25 2013-05-07 Theranos, Inc. Systems and methods for multi-analysis
US10012664B2 (en) 2011-09-25 2018-07-03 Theranos Ip Company, Llc Systems and methods for fluid and component handling
US8840838B2 (en) 2011-09-25 2014-09-23 Theranos, Inc. Centrifuge configurations
US9250229B2 (en) 2011-09-25 2016-02-02 Theranos, Inc. Systems and methods for multi-analysis
US9268915B2 (en) 2011-09-25 2016-02-23 Theranos, Inc. Systems and methods for diagnosis or treatment
US9632102B2 (en) 2011-09-25 2017-04-25 Theranos, Inc. Systems and methods for multi-purpose analysis
US9664702B2 (en) 2011-09-25 2017-05-30 Theranos, Inc. Fluid handling apparatus and configurations
US8475739B2 (en) 2011-09-25 2013-07-02 Theranos, Inc. Systems and methods for fluid handling
US9619627B2 (en) 2011-09-25 2017-04-11 Theranos, Inc. Systems and methods for collecting and transmitting assay results
US9810704B2 (en) 2013-02-18 2017-11-07 Theranos, Inc. Systems and methods for multi-analysis
US9997346B1 (en) 2017-06-30 2018-06-12 Mb Scientific Ab Electron spectrometer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2243362A (en) * 1938-08-20 1941-05-27 Thomas W Sukumlyn Electron microscope system
US3617741A (en) * 1969-09-02 1971-11-02 Hewlett Packard Co Electron spectroscopy system with a multiple electrode electron lens

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4255656A (en) * 1978-05-25 1981-03-10 Kratos Limited Apparatus for charged particle spectroscopy
DE3045013A1 (en) * 1979-11-30 1981-09-03 Kratos Ltd electron spectrometer
US4358680A (en) * 1979-11-30 1982-11-09 Kratos Limited Charged particle spectrometers
US5506414A (en) * 1993-03-26 1996-04-09 Fisons Plc Charged-particle analyzer

Also Published As

Publication number Publication date
US3766381A (en) 1973-10-16
DE2222339A1 (en) 1972-11-23

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Legal Events

Date Code Title Description
PS Patent sealed
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee