DE3674796D1 - Anordnung und verfahren zur nephelometrischen messung von reaktionen. - Google Patents

Anordnung und verfahren zur nephelometrischen messung von reaktionen.

Info

Publication number
DE3674796D1
DE3674796D1 DE8787900586T DE3674796T DE3674796D1 DE 3674796 D1 DE3674796 D1 DE 3674796D1 DE 8787900586 T DE8787900586 T DE 8787900586T DE 3674796 T DE3674796 T DE 3674796T DE 3674796 D1 DE3674796 D1 DE 3674796D1
Authority
DE
Germany
Prior art keywords
reactions
arrangement
nephelometric measurement
nephelometric
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787900586T
Other languages
English (en)
Inventor
E Theobald
B Seymour
M Okawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beckman Coulter Inc
Original Assignee
Beckman Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beckman Instruments Inc filed Critical Beckman Instruments Inc
Application granted granted Critical
Publication of DE3674796D1 publication Critical patent/DE3674796D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/82—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a precipitate or turbidity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1748—Comparative step being essential in the method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/122—Kinetic analysis; determining reaction rate
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/125—Digital circuitry

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE8787900586T 1985-12-23 1986-12-22 Anordnung und verfahren zur nephelometrischen messung von reaktionen. Expired - Fee Related DE3674796D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US81282485A 1985-12-23 1985-12-23
PCT/US1986/002776 WO1987003960A1 (en) 1985-12-23 1986-12-22 Apparatus and method for nephelometric measurement of reactions

Publications (1)

Publication Number Publication Date
DE3674796D1 true DE3674796D1 (de) 1990-11-08

Family

ID=25210727

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787900586T Expired - Fee Related DE3674796D1 (de) 1985-12-23 1986-12-22 Anordnung und verfahren zur nephelometrischen messung von reaktionen.

Country Status (4)

Country Link
EP (1) EP0252127B1 (de)
JP (1) JPS63502372A (de)
DE (1) DE3674796D1 (de)
WO (1) WO1987003960A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5940178A (en) * 1996-07-03 1999-08-17 Beckman Instruments, Inc. Nephelometer and turbidimeter combination
AU750602B2 (en) * 1996-07-03 2002-07-25 Beckman Coulter, Inc. Nephelometer and turbidimeter combination
DE19640121B4 (de) 1996-09-28 2007-04-26 Dade Behring Marburg Gmbh Verfahren zur Bestimmung einer sich zeitabhängig ändernden Meßgröße
DE10103620C1 (de) * 2001-01-25 2002-08-08 Htk Hamburg Gmbh Verfahren zur Anakyse von Proben mittels einer Streulichtmessung
DE10128978B4 (de) * 2001-06-11 2004-01-22 Htk Hamburg Gmbh Verfahren zur Analyse von Proben mittels einer Streulichtmessung
CN103344643A (zh) * 2013-07-05 2013-10-09 深圳普门科技有限公司 采用比浊法测量特定蛋白的半自动体外检测设备及方法
CN103344642A (zh) * 2013-07-05 2013-10-09 深圳普门科技有限公司 采用比浊法测量特定蛋白的全自动体外检测设备及方法
CN103335983A (zh) * 2013-07-05 2013-10-02 深圳普门科技有限公司 采用比浊法测量特定蛋白的准自动体外检测设备及方法
CN110609139B (zh) * 2018-06-14 2023-06-30 深圳市理邦精密仪器股份有限公司 抗原浓度过量检测方法、装置及存储介质

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4305665A (en) * 1975-01-29 1981-12-15 Baxter Travenol Laboratories, Inc. Nephelometer and nephelometer method for assaying immunochemical complex

Also Published As

Publication number Publication date
JPS63502372A (ja) 1988-09-08
WO1987003960A1 (en) 1987-07-02
EP0252127B1 (de) 1990-10-03
EP0252127A1 (de) 1988-01-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee