DE3674599D1 - Ladungsverschiebeanordnung. - Google Patents

Ladungsverschiebeanordnung.

Info

Publication number
DE3674599D1
DE3674599D1 DE8686300705T DE3674599T DE3674599D1 DE 3674599 D1 DE3674599 D1 DE 3674599D1 DE 8686300705 T DE8686300705 T DE 8686300705T DE 3674599 T DE3674599 T DE 3674599T DE 3674599 D1 DE3674599 D1 DE 3674599D1
Authority
DE
Germany
Prior art keywords
load shifting
shifting arrangement
arrangement
load
shifting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686300705T
Other languages
German (de)
English (en)
Inventor
Junya C O Sony Corporat Suzuki
Kaneyoshi C O Sony C Takeshita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Application granted granted Critical
Publication of DE3674599D1 publication Critical patent/DE3674599D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00—Charge transfer devices
    • H10D44/40—Charge-coupled devices [CCD]
    • H10D44/45—Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • H10D44/454—Output structures
DE8686300705T 1985-02-06 1986-02-03 Ladungsverschiebeanordnung. Expired - Lifetime DE3674599D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985015536U JPS61131854U (en:Method) 1985-02-06 1985-02-06

Publications (1)

Publication Number Publication Date
DE3674599D1 true DE3674599D1 (de) 1990-11-08

Family

ID=11891525

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686300705T Expired - Lifetime DE3674599D1 (de) 1985-02-06 1986-02-03 Ladungsverschiebeanordnung.

Country Status (4)

Country Link
US (1) US4974240A (en:Method)
EP (1) EP0191583B1 (en:Method)
JP (1) JPS61131854U (en:Method)
DE (1) DE3674599D1 (en:Method)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5247554A (en) * 1987-01-16 1993-09-21 Kabushiki Kaisha Toshiba Charge detection circuit
EP0292895B1 (en) * 1987-05-21 1993-09-22 Kabushiki Kaisha Toshiba Charge transfer device
JPH03245504A (ja) * 1990-02-23 1991-11-01 Sumitomo Heavy Ind Ltd 臨界磁場測定装置用磁石
JP2707784B2 (ja) * 1990-03-10 1998-02-04 日本電気株式会社 電荷転送装置
KR920007353B1 (ko) * 1990-03-19 1992-08-31 삼성전자 주식회사 일시화면정지기능을 가지는 고체영상소자
EP0766455B1 (en) * 1991-07-12 1999-03-31 Sony Corporation Method of driving a charge transfer device
US5369047A (en) * 1993-07-01 1994-11-29 Texas Instruments Incorporated Method of making a BCD low noise high sensitivity charge detection amplifier for high performance image sensors
CN100429509C (zh) * 2001-11-16 2008-10-29 株式会社Bio-X Fet型传感器
JP4641166B2 (ja) * 2004-09-15 2011-03-02 ルネサスエレクトロニクス株式会社 固体撮像装置の電荷転送デバイスおよび固体撮像装置の電荷転送デバイスの駆動方法
US7826980B2 (en) * 2005-03-11 2010-11-02 National University Corporation Toyohashi University Of Technology Cumulative chemical/physical phenomenon detecting apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2501934C2 (de) * 1974-01-25 1982-11-11 Hughes Aircraft Co., Culver City, Calif. Verfahren zum Betrieb eines ladungsgekoppelten Halbleiter-Bauelementes und ladungsgekoppeltes Halbleiter-Bauelement zur Durchführung dieses Verfahrens
US4118795A (en) * 1976-08-27 1978-10-03 Texas Instruments Incorporated Two-phase CCD regenerator - I/O circuits
JPS5632764A (en) * 1979-08-27 1981-04-02 Nec Corp Charge coupled device
JPS5713764A (en) * 1980-06-27 1982-01-23 Fujitsu Ltd Charge detector
JPS5769777A (en) * 1980-10-17 1982-04-28 Toshiba Corp Manufacture of charge transfer device
JPS57172766A (en) * 1981-04-16 1982-10-23 Matsushita Electric Ind Co Ltd Charge transfer device
JPS5911680A (ja) * 1982-07-12 1984-01-21 Hitachi Ltd 電荷転送装置

Also Published As

Publication number Publication date
US4974240A (en) 1990-11-27
JPS61131854U (en:Method) 1986-08-18
EP0191583B1 (en) 1990-10-03
EP0191583A1 (en) 1986-08-20

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Free format text: MITSCHERLICH, H., DIPL.-ING. GUNSCHMANN, K., DIPL.-ING. KOERBER, W., DIPL.-ING. DR.RER.NAT. SCHMIDT-EVERS, J., DIPL.-ING. MELZER, W., DIPL.-ING., PAT.-ANWAELTE SCHULZ, R., DIPL.-PHYS. DR.RER.NAT., PAT.- U. RECHTSANW., 8000 MUENCHEN

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee