Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments IncfiledCriticalSeiko Instruments Inc
Publication of DE3614761A1publicationCriticalpatent/DE3614761A1/de
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
Physics & Mathematics
(AREA)
Electromagnetism
(AREA)
General Physics & Mathematics
(AREA)
Length-Measuring Devices Using Wave Or Particle Radiation
(AREA)
Analysing Materials By The Use Of Radiation
(AREA)
DE198636147611985-05-181986-04-30Einrichtung zur messung der dicke einer beschichtung
WithdrawnDE3614761A1
(de)
Vorrichtung und Verfahren zur berührungslosen Messung der Schichtdicke eines nichtleitenden Materials sowie Verwendung der Vorrichtung zur Messung kunststoffbeschichteter Metallteile
Vorrichtung zur zerstörungsfreien Prüfung längsverschiebbarer ferromagnetischer Körper und Verfahren zur Einstellung der Vorrichtung in einen auf die jeweiligen Prüflinge abgestimmten Ausgangszustand für die Prüfung