DE3587620D1 - Logikanalysator. - Google Patents

Logikanalysator.

Info

Publication number
DE3587620D1
DE3587620D1 DE85106364T DE3587620T DE3587620D1 DE 3587620 D1 DE3587620 D1 DE 3587620D1 DE 85106364 T DE85106364 T DE 85106364T DE 3587620 T DE3587620 T DE 3587620T DE 3587620 D1 DE3587620 D1 DE 3587620D1
Authority
DE
Germany
Prior art keywords
logic analyzer
analyzer
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE85106364T
Other languages
English (en)
Other versions
DE3587620T2 (de
Inventor
Takayuki Nakajima
Tetsuo Aoki
Katsumi Kobayashi
Noboru Akiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59108919A external-priority patent/JPS60252278A/ja
Priority claimed from JP59108920A external-priority patent/JPH0614102B2/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE3587620D1 publication Critical patent/DE3587620D1/de
Application granted granted Critical
Publication of DE3587620T2 publication Critical patent/DE3587620T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
DE85106364T 1984-05-28 1985-05-23 Logikanalysator. Expired - Fee Related DE3587620T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP59108919A JPS60252278A (ja) 1984-05-28 1984-05-28 ロジツクアナライザ
JP59108920A JPH0614102B2 (ja) 1984-05-28 1984-05-28 回路試験装置

Publications (2)

Publication Number Publication Date
DE3587620D1 true DE3587620D1 (de) 1993-11-18
DE3587620T2 DE3587620T2 (de) 1994-03-24

Family

ID=26448742

Family Applications (1)

Application Number Title Priority Date Filing Date
DE85106364T Expired - Fee Related DE3587620T2 (de) 1984-05-28 1985-05-23 Logikanalysator.

Country Status (3)

Country Link
US (1) US4701918A (de)
EP (1) EP0163267B1 (de)
DE (1) DE3587620T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193962A (ja) * 1984-10-15 1986-05-12 Anritsu Corp パタ−ントリガ付オシロスコ−プ
JPS62140299A (ja) * 1985-12-13 1987-06-23 Advantest Corp パタ−ン発生装置
DE3611872C1 (de) * 1986-04-09 1987-04-30 Rohle & Schwarz Gmbh & Co Kg Logikanalysator
US4777616A (en) * 1986-05-12 1988-10-11 Outlook Technology, Inc. Increased resolution logic analyzer using asynchronous sampling
US4860291A (en) * 1987-12-28 1989-08-22 Tektronix, Inc. Test vector definition system employing template concept
US5282213A (en) * 1991-01-02 1994-01-25 Compaq Computer Corporation Computer-based logic analyzer timing and analysis system
JP2882426B2 (ja) * 1991-03-29 1999-04-12 株式会社アドバンテスト アドレス発生装置
US5327076A (en) * 1992-09-17 1994-07-05 Micro Control Company Glitchless test signal generator
US6594789B2 (en) * 1997-09-16 2003-07-15 Texas Instruments Incorporated Input data capture boundary cell connected to target circuit output
US6381506B1 (en) * 1996-11-27 2002-04-30 Victor Grappone Fail-safe microprocessor-based control and monitoring of electrical devices
DE19711097C2 (de) * 1997-03-17 2000-04-06 Siemens Ag Integrierte Schaltung mit einem Speicher und einer Prüfschaltung
US6202186B1 (en) * 1999-01-29 2001-03-13 Credence Systems Corporation Integrated circuit tester having pattern generator controlled data bus
US6396517B1 (en) 1999-03-01 2002-05-28 Agilent Technologies, Inc. Integrated trigger function display system and methodology for trigger definition development in a signal measurement system having a graphical user interface
US6535999B1 (en) * 1999-07-13 2003-03-18 Micron Technology, Inc. Test and observe mode for embedded memory

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3750135A (en) * 1971-10-15 1973-07-31 Lektromedia Ltd Low resolution graphics for crt displays
US3909792A (en) * 1973-02-26 1975-09-30 American Optical Corp Electrocardiographic review system
US4216374A (en) * 1978-08-11 1980-08-05 John Fluke Mfg. Co., Inc. Hybrid signature test method and apparatus
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
US4467324A (en) * 1980-06-27 1984-08-21 Del Mar Avionics Apparatus and method for printing annotated electrocardial data
JPS6020755B2 (ja) * 1980-12-26 1985-05-23 松下電器産業株式会社 画面表示装置
US4425643A (en) * 1981-06-08 1984-01-10 Tektronix, Inc. Multi-speed logic analyzer
US4434488A (en) * 1981-06-08 1984-02-28 Tektronix, Inc. Logic analyzer for a multiplexed digital bus
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4503536A (en) * 1982-09-13 1985-03-05 General Dynamics Digital circuit unit testing system utilizing signature analysis
JPS5997065A (ja) * 1982-11-25 1984-06-04 Advantest Corp 論理回路試験装置の試験パタ−ン発生装置
US4601033A (en) * 1984-01-16 1986-07-15 Siemens Corporate Research & Suppport, Inc. Circuit testing apparatus employing signature analysis

Also Published As

Publication number Publication date
EP0163267B1 (de) 1993-10-13
EP0163267A3 (en) 1988-10-05
EP0163267A2 (de) 1985-12-04
DE3587620T2 (de) 1994-03-24
US4701918A (en) 1987-10-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee