DE3585551D1 - Logikanalysator. - Google Patents

Logikanalysator.

Info

Publication number
DE3585551D1
DE3585551D1 DE8585104000T DE3585551T DE3585551D1 DE 3585551 D1 DE3585551 D1 DE 3585551D1 DE 8585104000 T DE8585104000 T DE 8585104000T DE 3585551 T DE3585551 T DE 3585551T DE 3585551 D1 DE3585551 D1 DE 3585551D1
Authority
DE
Germany
Prior art keywords
logic analyzer
analyzer
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585104000T
Other languages
English (en)
Inventor
Kazuo Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of DE3585551D1 publication Critical patent/DE3585551D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8585104000T 1984-04-06 1985-04-02 Logikanalysator. Expired - Fee Related DE3585551D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59069727A JPS60213873A (ja) 1984-04-06 1984-04-06 ロジツクアナライザ

Publications (1)

Publication Number Publication Date
DE3585551D1 true DE3585551D1 (de) 1992-04-16

Family

ID=13411154

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585104000T Expired - Fee Related DE3585551D1 (de) 1984-04-06 1985-04-02 Logikanalysator.

Country Status (4)

Country Link
US (1) US4654848A (de)
EP (1) EP0159588B1 (de)
JP (1) JPS60213873A (de)
DE (1) DE3585551D1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61294375A (ja) * 1985-06-21 1986-12-25 Ando Electric Co Ltd サンプリングデ−タの発生順序判定方法
DE3611872C1 (de) * 1986-04-09 1987-04-30 Rohle & Schwarz Gmbh & Co Kg Logikanalysator
US4835736A (en) * 1986-08-25 1989-05-30 Tektronix, Inc. Data acquisition system for capturing and storing clustered test data occurring before and after an event of interest
JPS63155340A (ja) * 1986-12-19 1988-06-28 Fujitsu Ltd 記憶装置の読出し方式
US4907229A (en) * 1988-06-23 1990-03-06 The United States Of America As Represented By The Secretary Of The Navy Selective multimode/multiconfigurable data acquisition and reduction processor system
US5067130A (en) * 1989-09-29 1991-11-19 Tektronix, Inc. Method for acquiring data in a logic analyzer
EP0426281A3 (en) * 1989-10-30 1992-02-05 Tektronix, Inc. Enhanced counter/timer behavior in a logic analyzer
US5282213A (en) * 1991-01-02 1994-01-25 Compaq Computer Corporation Computer-based logic analyzer timing and analysis system
US5506850A (en) * 1991-04-08 1996-04-09 Osann, Jr.; Robert Logic analyzer for high channel count applications
US5581482A (en) * 1994-04-26 1996-12-03 Unisys Corporation Performance monitor for digital computer system
US6977673B1 (en) 1995-02-23 2005-12-20 Avid Technology, Inc. Portable moving picture recording device including switching control for multiple data flow configurations
US7623754B1 (en) * 1995-02-23 2009-11-24 Avid Technology, Inc. Motion picture recording device using digital, computer-readable non-linear media
US7532807B2 (en) * 1995-04-07 2009-05-12 Avid Technology, Inc. Combined editing system and digital moving picture recording system
US6035367A (en) * 1997-04-04 2000-03-07 Avid Technology, Inc. Computer file system providing looped file structure for post-occurrence data collection of asynchronous events
US6405327B1 (en) 1998-08-19 2002-06-11 Unisys Corporation Apparatus for and method of automatic monitoring of computer performance
US6327544B1 (en) 1999-03-01 2001-12-04 Agilent Technologies, Inc. Automatic storage of a trigger definition in a signal measurement system
US6396517B1 (en) 1999-03-01 2002-05-28 Agilent Technologies, Inc. Integrated trigger function display system and methodology for trigger definition development in a signal measurement system having a graphical user interface
US6542985B1 (en) 1999-09-23 2003-04-01 Unisys Corporation Event counter
US6647479B1 (en) 2000-01-03 2003-11-11 Avid Technology, Inc. Computer file system providing looped file structure for post-occurrence data collection of asynchronous events
US7373557B1 (en) 2003-04-04 2008-05-13 Unisys Corporation Performance monitor for data processing systems
US7409617B2 (en) * 2004-09-30 2008-08-05 Credence Systems Corporation System for measuring characteristics of a digital signal
US7627790B2 (en) * 2003-08-21 2009-12-01 Credence Systems Corporation Apparatus for jitter testing an IC
US8793536B2 (en) * 2012-08-22 2014-07-29 Tektronix, Inc. Test and measurement instrument with auto-sync for bit-error detection
US9063831B1 (en) * 2012-12-21 2015-06-23 Cadence Design Systems, Inc. Method and apparatus for optimizing access to control registers in an emulation chip
CN105116318B (zh) * 2015-09-02 2018-02-02 电子科技大学 一种逻辑分析仪中实现毛刺检测的方法
US10916252B2 (en) 2017-11-10 2021-02-09 Nvidia Corporation Accelerated data transfer for latency reduction and real-time processing
CN118095168A (zh) * 2024-04-16 2024-05-28 苏州元脑智能科技有限公司 一种逻辑分析仪、系统、方法及计算机可读存储介质
CN118150992A (zh) * 2024-05-11 2024-06-07 杭州沃镭智能科技股份有限公司 一种分布式的集成逻辑分析仪及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
GB2070300B (en) * 1980-02-27 1984-01-25 Racal Automation Ltd Electrical testing apparatus and methods
US4434488A (en) * 1981-06-08 1984-02-28 Tektronix, Inc. Logic analyzer for a multiplexed digital bus
US4425643A (en) * 1981-06-08 1984-01-10 Tektronix, Inc. Multi-speed logic analyzer
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
US4481627A (en) * 1981-10-30 1984-11-06 Honeywell Information Systems Inc. Embedded memory testing method and apparatus
US4551838A (en) * 1983-06-20 1985-11-05 At&T Bell Laboratories Self-testing digital circuits

Also Published As

Publication number Publication date
US4654848A (en) 1987-03-31
EP0159588A3 (en) 1988-06-29
EP0159588A2 (de) 1985-10-30
EP0159588B1 (de) 1992-03-11
JPS60213873A (ja) 1985-10-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee