DE3416919C2 - - Google Patents

Info

Publication number
DE3416919C2
DE3416919C2 DE19843416919 DE3416919A DE3416919C2 DE 3416919 C2 DE3416919 C2 DE 3416919C2 DE 19843416919 DE19843416919 DE 19843416919 DE 3416919 A DE3416919 A DE 3416919A DE 3416919 C2 DE3416919 C2 DE 3416919C2
Authority
DE
Germany
Prior art keywords
pattern
standard pattern
reflection
standard
areas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19843416919
Other languages
German (de)
English (en)
Other versions
DE3416919A1 (de
Inventor
Tatsunosuke Kyoto Jp Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Publication of DE3416919A1 publication Critical patent/DE3416919A1/de
Application granted granted Critical
Publication of DE3416919C2 publication Critical patent/DE3416919C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process

Landscapes

  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE19843416919 1983-05-11 1984-05-08 Verfahren zum pruefen eines musters Granted DE3416919A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8095483A JPS59206705A (ja) 1983-05-11 1983-05-11 パタ−ン検査方法

Publications (2)

Publication Number Publication Date
DE3416919A1 DE3416919A1 (de) 1984-11-29
DE3416919C2 true DE3416919C2 (US20080138455A1-20080612-C00006.png) 1987-07-02

Family

ID=13732896

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843416919 Granted DE3416919A1 (de) 1983-05-11 1984-05-08 Verfahren zum pruefen eines musters

Country Status (4)

Country Link
JP (1) JPS59206705A (US20080138455A1-20080612-C00006.png)
DE (1) DE3416919A1 (US20080138455A1-20080612-C00006.png)
FR (1) FR2551210A1 (US20080138455A1-20080612-C00006.png)
GB (1) GB2139754B (US20080138455A1-20080612-C00006.png)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61228302A (ja) * 1985-04-01 1986-10-11 Yanmar Diesel Engine Co Ltd 探知装置
JPS62180250A (ja) * 1986-02-05 1987-08-07 Omron Tateisi Electronics Co 部品実装基板の検査方法
JPS63191041A (ja) * 1987-02-03 1988-08-08 Komori Printing Mach Co Ltd 濃度測定位置合わせ方法
FR2676392A1 (fr) * 1991-05-04 1992-11-20 Heidelberger Druckmasch Ag Dispositif et procede pour controler la qualite d'impression de produits imprimes d'une machine d'impression.
US6529621B1 (en) * 1998-12-17 2003-03-04 Kla-Tencor Mechanisms for making and inspecting reticles
GB2485337A (en) * 2010-11-01 2012-05-16 Plastic Logic Ltd Method for providing device-specific markings on devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645626A (en) * 1970-06-15 1972-02-29 Ibm Apparatus for detecting defects by optical scanning
US3969577A (en) * 1974-10-15 1976-07-13 Westinghouse Electric Corporation System for evaluating similar objects
JPS5413750A (en) * 1977-07-02 1979-02-01 Hokuriku Elect Ind Function voltage divider using resistors

Also Published As

Publication number Publication date
GB8411625D0 (en) 1984-06-13
GB2139754B (en) 1986-10-15
JPH033884B2 (US20080138455A1-20080612-C00006.png) 1991-01-21
DE3416919A1 (de) 1984-11-29
GB2139754A (en) 1984-11-14
JPS59206705A (ja) 1984-11-22
FR2551210A1 (fr) 1985-03-01

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee