DE3212845C2 - Röntgenfluoreszenz-Meßeinrichtung - Google Patents

Röntgenfluoreszenz-Meßeinrichtung

Info

Publication number
DE3212845C2
DE3212845C2 DE3212845A DE3212845A DE3212845C2 DE 3212845 C2 DE3212845 C2 DE 3212845C2 DE 3212845 A DE3212845 A DE 3212845A DE 3212845 A DE3212845 A DE 3212845A DE 3212845 C2 DE3212845 C2 DE 3212845C2
Authority
DE
Germany
Prior art keywords
detection device
sample
ray fluorescence
measuring device
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3212845A
Other languages
German (de)
English (en)
Other versions
DE3212845A1 (de
Inventor
Hiroshi Ishijima
Toshiyuki Tokio/Tokyo Koga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Publication of DE3212845A1 publication Critical patent/DE3212845A1/de
Application granted granted Critical
Publication of DE3212845C2 publication Critical patent/DE3212845C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DE3212845A 1981-04-07 1982-04-06 Röntgenfluoreszenz-Meßeinrichtung Expired DE3212845C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981049995U JPS6315767Y2 (instruction) 1981-04-07 1981-04-07

Publications (2)

Publication Number Publication Date
DE3212845A1 DE3212845A1 (de) 1982-10-21
DE3212845C2 true DE3212845C2 (de) 1987-05-14

Family

ID=12846586

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3212845A Expired DE3212845C2 (de) 1981-04-07 1982-04-06 Röntgenfluoreszenz-Meßeinrichtung

Country Status (7)

Country Link
US (1) US4442535A (instruction)
JP (1) JPS6315767Y2 (instruction)
CA (1) CA1195438A (instruction)
DE (1) DE3212845C2 (instruction)
FR (1) FR2503351B1 (instruction)
GB (1) GB2098320B (instruction)
NL (1) NL187871C (instruction)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3710789A1 (de) * 1987-03-31 1988-10-20 Messerschmitt Boelkow Blohm Verfahren zur passiven vermessung von fluessigkeitsfilmen und/oder schaumschichten auf wasser
DE102005058783A1 (de) * 2005-12-09 2007-06-14 Zf Friedrichshafen Ag Torsionsschwingungsdämpfer
GB0801307D0 (en) * 2008-01-24 2008-03-05 3Dx Ray Ltd Can seam inspection
CN102284513A (zh) * 2011-05-16 2011-12-21 清华大学 一种凸度仪用准直机构
CN110742630A (zh) * 2019-09-17 2020-02-04 深圳蓝韵医学影像有限公司 一种x射线图像采集的方法和装置
CN111678464B (zh) * 2020-05-21 2022-04-08 原子高科股份有限公司 一种工业仪表测厚源设计与制备工艺
CN117280200A (zh) * 2021-05-06 2023-12-22 株式会社理学 X射线造影剂和x射线图像的取得方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH249401A (de) * 1944-11-01 1947-06-30 Draeger Ges Mbh Verfahren zur zerstörungsfreien Bestimmung der Schichtdicke von Überzügen mit Hilfe von Röntgenstrahlen.
US2890344A (en) * 1955-12-27 1959-06-09 Philips Corp Analysis of materials by x-rays
BE569634A (instruction) * 1957-08-14
US3027459A (en) * 1958-08-09 1962-03-27 Curtiss Wright Corp Thickness measurement apparatus
US3499152A (en) * 1966-03-18 1970-03-03 Industrial Nucleonics Corp Method and apparatus for improving backscatter gauge response
GB1255644A (en) * 1968-05-10 1971-12-01 Rolls Royce Method of determining the value of a mechanical property or properties of a fibre
JPS4720853U (instruction) * 1971-03-15 1972-11-09

Also Published As

Publication number Publication date
DE3212845A1 (de) 1982-10-21
US4442535A (en) 1984-04-10
JPS57162509U (instruction) 1982-10-13
NL187871B (nl) 1991-09-02
FR2503351A1 (fr) 1982-10-08
NL8201472A (nl) 1982-11-01
FR2503351B1 (fr) 1986-08-22
JPS6315767Y2 (instruction) 1988-05-06
GB2098320B (en) 1984-09-12
CA1195438A (en) 1985-10-15
GB2098320A (en) 1982-11-17
NL187871C (nl) 1992-02-03

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Legal Events

Date Code Title Description
8127 New person/name/address of the applicant

Owner name: SEIKO INSTRUMENTS AND ELECTRONICS LTD., TOKIO, JP

8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee