DE3125048C2 - - Google Patents
Info
- Publication number
- DE3125048C2 DE3125048C2 DE3125048A DE3125048A DE3125048C2 DE 3125048 C2 DE3125048 C2 DE 3125048C2 DE 3125048 A DE3125048 A DE 3125048A DE 3125048 A DE3125048 A DE 3125048A DE 3125048 C2 DE3125048 C2 DE 3125048C2
- Authority
- DE
- Germany
- Prior art keywords
- bits
- code
- data word
- error correction
- parity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Detection And Correction Of Errors (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/164,211 US4345328A (en) | 1980-06-30 | 1980-06-30 | ECC Check bit generation using through checking parity bits |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3125048A1 DE3125048A1 (de) | 1982-03-11 |
DE3125048C2 true DE3125048C2 (US07968547-20110628-C00004.png) | 1987-09-03 |
Family
ID=22593461
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813125048 Granted DE3125048A1 (de) | 1980-06-30 | 1981-06-26 | Erzeugung von fehlerkorrekturpruefbits unter benutzung von paritaetsbits zur durchlaufkontrolle |
Country Status (3)
Country | Link |
---|---|
US (1) | US4345328A (US07968547-20110628-C00004.png) |
JP (1) | JPS5745100U (US07968547-20110628-C00004.png) |
DE (1) | DE3125048A1 (US07968547-20110628-C00004.png) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4417339A (en) * | 1981-06-22 | 1983-11-22 | Burroughs Corporation | Fault tolerant error correction circuit |
JPS58139399A (ja) * | 1982-02-15 | 1983-08-18 | Hitachi Ltd | 半導体記憶装置 |
US4943967A (en) * | 1982-02-15 | 1990-07-24 | Hitachi, Ltd. | Semiconductor memory with an improved dummy cell arrangement and with a built-in error correction code circuit |
US5177743A (en) * | 1982-02-15 | 1993-01-05 | Hitachi, Ltd. | Semiconductor memory |
US4531213A (en) * | 1982-03-03 | 1985-07-23 | Sperry Corporation | Memory through checking system with comparison of data word parity before and after ECC processing |
US4561095A (en) * | 1982-07-19 | 1985-12-24 | Fairchild Camera & Instrument Corporation | High-speed error correcting random access memory system |
US4523314A (en) * | 1983-02-07 | 1985-06-11 | Sperry Corporation | Read error occurrence detector for error checking and correcting system |
US4617664A (en) * | 1984-06-29 | 1986-10-14 | International Business Machines Corporation | Error correction for multiple bit output chips |
US4646312A (en) * | 1984-12-13 | 1987-02-24 | Ncr Corporation | Error detection and correction system |
US4649540A (en) * | 1984-12-26 | 1987-03-10 | Thomson Components-Mostek Corp. | Error-correcting circuit having a reduced syndrome word |
US4759020A (en) * | 1985-09-25 | 1988-07-19 | Unisys Corporation | Self-healing bubble memories |
US5146607A (en) * | 1986-06-30 | 1992-09-08 | Encore Computer Corporation | Method and apparatus for sharing information between a plurality of processing units |
DE3625271A1 (de) * | 1986-07-25 | 1988-01-28 | Rwth Aachen | Ueberwachungseinrichtung fuer einen digitalrechner |
US4805173A (en) * | 1986-09-15 | 1989-02-14 | Thinking Machines Corporation | Error control method and apparatus |
US4791641A (en) * | 1986-09-15 | 1988-12-13 | Thinking Machines Corporation | Parallel processor error checking |
US4993028A (en) * | 1988-09-07 | 1991-02-12 | Thinking Machines Corporation | Error detection and correction coding |
US5099484A (en) * | 1989-06-09 | 1992-03-24 | Digital Equipment Corporation | Multiple bit error detection and correction system employing a modified Reed-Solomon code incorporating address parity and catastrophic failure detection |
US5598422A (en) * | 1990-04-30 | 1997-01-28 | Dell Usa, L.P. | Digital computer having an error correction code (ECC) system with comparator integrated into re-encoder |
JPH05225798A (ja) * | 1991-08-14 | 1993-09-03 | Internatl Business Mach Corp <Ibm> | メモリシステム |
US5313475A (en) * | 1991-10-31 | 1994-05-17 | International Business Machines Corporation | ECC function with self-contained high performance partial write or read/modify/write and parity look-ahead interface scheme |
WO1994003901A1 (en) * | 1992-08-10 | 1994-02-17 | Monolithic System Technology, Inc. | Fault-tolerant, high-speed bus system and bus interface for wafer-scale integration |
US6367046B1 (en) * | 1992-09-23 | 2002-04-02 | International Business Machines Corporation | Multi-bit error correction system |
US5537425A (en) * | 1992-09-29 | 1996-07-16 | International Business Machines Corporation | Parity-based error detection in a memory controller |
US5588010A (en) * | 1994-07-29 | 1996-12-24 | International Business Machines Corporation | Parallel architecture error correction and conversion system |
US5771247A (en) * | 1994-10-03 | 1998-06-23 | International Business Machines Corporation | Low latency error reporting for high performance bus |
JPH08203278A (ja) * | 1995-01-25 | 1996-08-09 | Sony Corp | 半導体メモリ |
US5996113A (en) * | 1996-11-26 | 1999-11-30 | Intel Corporation | Method and apparatus for generating digital checksum signatures for alteration detection and version confirmation |
SE511114C2 (sv) * | 1997-12-10 | 1999-08-09 | Ericsson Telefon Ab L M | Metod vid processor, samt processor anpassad att verka enligt metoden |
JPH11175362A (ja) * | 1997-12-16 | 1999-07-02 | Toshiba Ave Co Ltd | 誤り訂正装置及びデータ再生装置 |
US6718499B1 (en) * | 1999-07-23 | 2004-04-06 | Hewlett-Packard Development Company, L.P. | Mace code |
US6460157B1 (en) * | 1999-11-30 | 2002-10-01 | International Business Machines Corporation | Method system and program products for error correction code conversion |
US6675349B1 (en) | 2000-05-11 | 2004-01-06 | International Business Machines Corporation | Error correction coding of data blocks with included parity bits |
US6536009B1 (en) | 2000-05-17 | 2003-03-18 | Trw Inc. | Technique for generating single-bit error-correcting, two-bit burst error-detecting codes |
US6519734B1 (en) | 2000-05-17 | 2003-02-11 | Trw Inc. | Single bit error correction, double burst error detection technique |
US20030023933A1 (en) * | 2001-07-27 | 2003-01-30 | Sun Microsystems, Inc. | End-to-end disk data checksumming |
US7051264B2 (en) * | 2001-11-14 | 2006-05-23 | Monolithic System Technology, Inc. | Error correcting memory and method of operating same |
US20040205317A1 (en) * | 2003-04-08 | 2004-10-14 | International Business Machines Corporation | Method, apparatus and program storage device for providing data integrity using check data and other metadata on a formatted storage medium |
US7392456B2 (en) * | 2004-11-23 | 2008-06-24 | Mosys, Inc. | Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
US20060242537A1 (en) * | 2005-03-30 | 2006-10-26 | Dang Lich X | Error detection in a logic device without performance impact |
US7460292B2 (en) * | 2005-06-03 | 2008-12-02 | Qualcomm Mems Technologies, Inc. | Interferometric modulator with internal polarization and drive method |
JP5353655B2 (ja) * | 2009-11-18 | 2013-11-27 | 富士通株式会社 | エラー検出・訂正符号生成回路及びその制御方法 |
US9128869B2 (en) * | 2011-09-29 | 2015-09-08 | Micron Technology, Inc. | Systems and methods involving managing a problematic memory cell |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2134529A1 (de) * | 1971-07-10 | 1973-01-25 | Ibm Deutschland | Verfahren zur fehlererkennung und -korrektur in aus dem speicher einer programmgesteuerten datenverarbeitungsanlage ausgelesenen informationswoertern |
US3755779A (en) * | 1971-12-14 | 1973-08-28 | Ibm | Error correction system for single-error correction, related-double-error correction and unrelated-double-error detection |
US4077028A (en) * | 1976-06-14 | 1978-02-28 | Ncr Corporation | Error checking and correcting device |
US4077565A (en) * | 1976-09-29 | 1978-03-07 | Honeywell Information Systems Inc. | Error detection and correction locator circuits |
NL7804674A (nl) * | 1978-05-02 | 1979-11-06 | Philips Nv | Geheugen met detektie en korrektie van fouten. |
-
1980
- 1980-06-30 US US06/164,211 patent/US4345328A/en not_active Expired - Lifetime
-
1981
- 1981-06-26 DE DE19813125048 patent/DE3125048A1/de active Granted
- 1981-06-29 JP JP1981096596U patent/JPS5745100U/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US4345328A (en) | 1982-08-17 |
JPS5745100U (US07968547-20110628-C00004.png) | 1982-03-12 |
DE3125048A1 (de) | 1982-03-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8126 | Change of the secondary classification |
Ipc: ENTFAELLT |
|
D2 | Grant after examination | ||
8364 | No opposition during term of opposition |