DE3034903A1 - System zur erfassung von defekten - Google Patents

System zur erfassung von defekten

Info

Publication number
DE3034903A1
DE3034903A1 DE19803034903 DE3034903A DE3034903A1 DE 3034903 A1 DE3034903 A1 DE 3034903A1 DE 19803034903 DE19803034903 DE 19803034903 DE 3034903 A DE3034903 A DE 3034903A DE 3034903 A1 DE3034903 A1 DE 3034903A1
Authority
DE
Germany
Prior art keywords
laser
defects
scanning
light
sources
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19803034903
Other languages
German (de)
English (en)
Other versions
DE3034903C2 (cg-RX-API-DMAC10.html
Inventor
Frank Arthur Norwalk Conn. Slaker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intec Corp
Original Assignee
Intec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intec Corp filed Critical Intec Corp
Publication of DE3034903A1 publication Critical patent/DE3034903A1/de
Application granted granted Critical
Publication of DE3034903C2 publication Critical patent/DE3034903C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE19803034903 1979-07-27 1980-09-16 System zur erfassung von defekten Granted DE3034903A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/061,451 US4265545A (en) 1979-07-27 1979-07-27 Multiple source laser scanning inspection system

Publications (2)

Publication Number Publication Date
DE3034903A1 true DE3034903A1 (de) 1982-04-29
DE3034903C2 DE3034903C2 (cg-RX-API-DMAC10.html) 1990-04-19

Family

ID=22035865

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803034903 Granted DE3034903A1 (de) 1979-07-27 1980-09-16 System zur erfassung von defekten

Country Status (3)

Country Link
US (1) US4265545A (cg-RX-API-DMAC10.html)
DE (1) DE3034903A1 (cg-RX-API-DMAC10.html)
SE (1) SE450602B (cg-RX-API-DMAC10.html)

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DE3418283A1 (de) * 1984-05-17 1985-12-12 Schott Glaswerke, 6500 Mainz Verfahren zum nachweis von fehlstellen in transparenten materialien
US4719061A (en) * 1985-08-12 1988-01-12 Essex Group, Inc. System and method for in-process detection of contamination in electrical conductor insulation
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DE60014956T2 (de) 1999-08-17 2006-02-09 Eastman Kodak Co. Verfahren und System für die Verwendung von Eichzonen in der Elektronischen Filmentwicklung
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JP2003519410A (ja) 1999-12-30 2003-06-17 アプライド、サイエンス、フィクシャン、インク 可視光を使用してデジタルフィルムを現像するための改良されたシステムおよび方法
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US6707557B2 (en) 1999-12-30 2004-03-16 Eastman Kodak Company Method and system for estimating sensor dark current drift and sensor/illumination non-uniformities
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US6864973B2 (en) * 1999-12-30 2005-03-08 Eastman Kodak Company Method and apparatus to pre-scan and pre-treat film for improved digital film processing handling
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US20010030685A1 (en) * 1999-12-30 2001-10-18 Darbin Stephen P. Method and apparatus for digital film processing using a scanning station having a single sensor
US6788335B2 (en) 1999-12-30 2004-09-07 Eastman Kodak Company Pulsed illumination signal modulation control & adjustment method and system
US20010048817A1 (en) * 1999-12-30 2001-12-06 Mooty George G. Method and apparatus for digital film processing using a single scanning station
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US6475711B1 (en) 1999-12-31 2002-11-05 Applied Science Fiction, Inc. Photographic element and digital film processing method using same
US20010040701A1 (en) * 2000-02-03 2001-11-15 Edgar Albert D. Photographic film having time resolved sensitivity distinction
WO2001057797A2 (en) * 2000-02-03 2001-08-09 Applied Science Fiction Method, system and software for signal processing using sheep and shepherd artifacts
US6786655B2 (en) 2000-02-03 2004-09-07 Eastman Kodak Company Method and system for self-service film processing
US6943920B2 (en) 2000-02-03 2005-09-13 Eastman Kodak Company Method, system, and software for signal processing using pyramidal decomposition
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US20020146171A1 (en) * 2000-10-01 2002-10-10 Applied Science Fiction, Inc. Method, apparatus and system for black segment detection
US6888997B2 (en) * 2000-12-05 2005-05-03 Eastman Kodak Company Waveguide device and optical transfer system for directing light to an image plane
US6733960B2 (en) 2001-02-09 2004-05-11 Eastman Kodak Company Digital film processing solutions and method of digital film processing
US6551750B2 (en) * 2001-03-16 2003-04-22 Numerical Technologies, Inc. Self-aligned fabrication technique for tri-tone attenuated phase-shifting masks
US6509964B2 (en) 2001-05-15 2003-01-21 Amt Inc. Multi-beam apparatus for measuring surface quality
US6805501B2 (en) * 2001-07-16 2004-10-19 Eastman Kodak Company System and method for digital film development using visible light
US7263240B2 (en) * 2002-01-14 2007-08-28 Eastman Kodak Company Method, system, and software for improving signal quality using pyramidal decomposition
US6934029B1 (en) * 2002-04-22 2005-08-23 Eugene Matzan Dual laser web defect scanner
CA2446368C (en) * 2002-10-29 2014-10-14 Bayer Healthcare Llc Diffuse reflectance readhead
FR2852533B1 (fr) * 2003-03-20 2006-10-06 Arck Electronique Dispositif de detection de trous dans des materiaux defilant en bandes continues
US7190458B2 (en) * 2003-12-09 2007-03-13 Applied Materials, Inc. Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity
US20050276451A1 (en) * 2004-05-27 2005-12-15 Hunking Maurice J Method and apparatus for sorting
US8958079B2 (en) 2004-06-30 2015-02-17 Georgetown Rail Equipment Company System and method for inspecting railroad ties
US8405837B2 (en) * 2004-06-30 2013-03-26 Georgetown Rail Equipment Company System and method for inspecting surfaces using optical wavelength filtering
US9616524B2 (en) * 2008-06-19 2017-04-11 Utilight Ltd. Light induced patterning
EP2344680A2 (en) * 2008-10-12 2011-07-20 Utilight Ltd. Solar cells and method of manufacturing thereof
WO2012030870A1 (en) * 2010-08-30 2012-03-08 Mks Technology (D/B/A Snowy Range Instruments) Spectroscopic assays and tagging
US20170234728A1 (en) * 2010-12-01 2017-08-17 Mks Technology (D/B/A Snowy Range Instruments) Spectrometer
US9791313B2 (en) * 2010-12-01 2017-10-17 MKS Technology Spectrometer
JP6590793B2 (ja) * 2013-05-31 2019-10-16 エムケイエス・テクノロジー，インコーポレーテッド 分光器、及び分光サンプルの表面全体に分光器の集束入射ビームを移動させる方法
JP5686394B1 (ja) * 2014-04-11 2015-03-18 レーザーテック株式会社 ペリクル検査装置
US9618335B2 (en) 2015-01-19 2017-04-11 Tetra Tech, Inc. Light emission power control apparatus and method
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US10807623B2 (en) 2018-06-01 2020-10-20 Tetra Tech, Inc. Apparatus and method for gathering data from sensors oriented at an oblique angle relative to a railway track
US10730538B2 (en) 2018-06-01 2020-08-04 Tetra Tech, Inc. Apparatus and method for calculating plate cut and rail seat abrasion based on measurements only of rail head elevation and crosstie surface elevation
US11377130B2 (en) 2018-06-01 2022-07-05 Tetra Tech, Inc. Autonomous track assessment system
US10625760B2 (en) 2018-06-01 2020-04-21 Tetra Tech, Inc. Apparatus and method for calculating wooden crosstie plate cut measurements and rail seat abrasion measurements based on rail head height
AU2020273465C8 (en) 2019-05-16 2025-11-13 Tetra Tech, Inc. System and method for generating and interpreting point clouds of a rail corridor along a survey path
EP3800033B1 (en) * 2019-09-30 2024-08-21 Ricoh Company, Ltd. Irradiation target flying apparatus, three-dimensional modeling apparatus, and irradiation target flying method
CN115398214A (zh) * 2020-02-05 2022-11-25 斯玛特克斯欧洲一人有限公司 用于缺陷检测的系统和方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1137878B (de) * 1958-05-09 1962-10-11 Zellweger A G App U Maschinenf Vorrichtung zur Feststellung von spontanen Querschnittsaenderungen in Textilmaterial
US3980891A (en) * 1975-05-16 1976-09-14 Intec Corporation Method and apparatus for a rotary scanner flaw detection system
DE2453028B2 (de) * 1973-11-08 1977-02-24 Toray Industries, Ine, Tokio Verfahren und vorrichtung zum messen der gleichmaessigkeit der farbstoffaufnahme eines zu pruefenden garns

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US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3866054A (en) * 1973-09-28 1975-02-11 Du Pont Defect size discriminator circuit for web inspection system
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system

Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
DE1137878B (de) * 1958-05-09 1962-10-11 Zellweger A G App U Maschinenf Vorrichtung zur Feststellung von spontanen Querschnittsaenderungen in Textilmaterial
DE2453028B2 (de) * 1973-11-08 1977-02-24 Toray Industries, Ine, Tokio Verfahren und vorrichtung zum messen der gleichmaessigkeit der farbstoffaufnahme eines zu pruefenden garns
US3980891A (en) * 1975-05-16 1976-09-14 Intec Corporation Method and apparatus for a rotary scanner flaw detection system

Also Published As

Publication number Publication date
US4265545A (en) 1981-05-05
DE3034903C2 (cg-RX-API-DMAC10.html) 1990-04-19
SE450602B (sv) 1987-07-06
SE8006088L (sv) 1982-03-02

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee