DE3003058A1 - Epitaxiales integriertes e-de festkoerper-detektorteleskop - Google Patents

Epitaxiales integriertes e-de festkoerper-detektorteleskop

Info

Publication number
DE3003058A1
DE3003058A1 DE19803003058 DE3003058A DE3003058A1 DE 3003058 A1 DE3003058 A1 DE 3003058A1 DE 19803003058 DE19803003058 DE 19803003058 DE 3003058 A DE3003058 A DE 3003058A DE 3003058 A1 DE3003058 A1 DE 3003058A1
Authority
DE
Germany
Prior art keywords
epitaxial
integrated
solid
detector
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19803003058
Other languages
German (de)
English (en)
Inventor
Kazuro Hishimi
Chisu Kodaira Tokyo Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKYO NUCTRONICS CO Ltd
Original Assignee
TOKYO NUCTRONICS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP12488579A priority Critical patent/JPS5648180A/ja
Application filed by TOKYO NUCTRONICS CO Ltd filed Critical TOKYO NUCTRONICS CO Ltd
Priority to DE19803003058 priority patent/DE3003058A1/de
Priority to US06/117,352 priority patent/US4340899A/en
Priority to FR8003957A priority patent/FR2476915A1/fr
Publication of DE3003058A1 publication Critical patent/DE3003058A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/38—Particle discrimination and measurement of relative mass, e.g. by measurement of loss of energy with distance (dE/dx)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H10F30/295—Surface barrier or shallow PN junction radiation detectors, e.g. surface barrier alpha-particle detectors
    • H10W90/00—

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Light Receiving Elements (AREA)
  • Pressure Sensors (AREA)
DE19803003058 1979-09-27 1980-01-29 Epitaxiales integriertes e-de festkoerper-detektorteleskop Withdrawn DE3003058A1 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP12488579A JPS5648180A (en) 1979-09-27 1979-09-27 Semiconductor detector
DE19803003058 DE3003058A1 (de) 1980-01-29 1980-01-29 Epitaxiales integriertes e-de festkoerper-detektorteleskop
US06/117,352 US4340899A (en) 1979-09-27 1980-01-31 Epitaxial integrated E-dE solid state detector telescope
FR8003957A FR2476915A1 (fr) 1980-01-29 1980-02-22 Detecteur solide e-de integre epitaxial, notamment pour telescope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19803003058 DE3003058A1 (de) 1980-01-29 1980-01-29 Epitaxiales integriertes e-de festkoerper-detektorteleskop
FR8003957A FR2476915A1 (fr) 1980-01-29 1980-02-22 Detecteur solide e-de integre epitaxial, notamment pour telescope

Publications (1)

Publication Number Publication Date
DE3003058A1 true DE3003058A1 (de) 1981-07-30

Family

ID=25783415

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803003058 Withdrawn DE3003058A1 (de) 1979-09-27 1980-01-29 Epitaxiales integriertes e-de festkoerper-detektorteleskop

Country Status (2)

Country Link
DE (1) DE3003058A1 (enExample)
FR (1) FR2476915A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5187380A (en) * 1992-04-09 1993-02-16 General Electric Company Low capacitance X-ray radiation detector

Also Published As

Publication number Publication date
FR2476915B3 (enExample) 1982-12-17
FR2476915A1 (fr) 1981-08-28

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Legal Events

Date Code Title Description
8141 Disposal/no request for examination