DE2964883D1 - Apparatus for focussing and analyzing a charged particle beam - Google Patents
Apparatus for focussing and analyzing a charged particle beamInfo
- Publication number
- DE2964883D1 DE2964883D1 DE7979100669T DE2964883T DE2964883D1 DE 2964883 D1 DE2964883 D1 DE 2964883D1 DE 7979100669 T DE7979100669 T DE 7979100669T DE 2964883 T DE2964883 T DE 2964883T DE 2964883 D1 DE2964883 D1 DE 2964883D1
- Authority
- DE
- Germany
- Prior art keywords
- focussing
- analyzing
- charged particle
- particle beam
- charged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT162178A AT376044B (en) | 1978-03-07 | 1978-03-07 | DEVICE FOR FOCUSING AND ANALYZING A CHARGED BODY RAY |
Publications (1)
Publication Number | Publication Date |
---|---|
DE2964883D1 true DE2964883D1 (en) | 1983-03-31 |
Family
ID=3517373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE7979100669T Expired DE2964883D1 (en) | 1978-03-07 | 1979-03-06 | Apparatus for focussing and analyzing a charged particle beam |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0004065B1 (en) |
AT (1) | AT376044B (en) |
DE (1) | DE2964883D1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111982945B (en) * | 2019-05-24 | 2023-04-28 | 北京纳米能源与系统研究所 | Method for acquiring time resolution dark field image based on ultra-fast transmission electron microscope system and application |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3679896A (en) * | 1969-12-23 | 1972-07-25 | Ibm | Electrostatic prism |
US4058724A (en) * | 1975-06-27 | 1977-11-15 | Minnesota Mining And Manufacturing Company | Ion Scattering spectrometer with two analyzers preferably in tandem |
-
1978
- 1978-03-07 AT AT162178A patent/AT376044B/en not_active IP Right Cessation
-
1979
- 1979-03-06 DE DE7979100669T patent/DE2964883D1/en not_active Expired
- 1979-03-06 EP EP19790100669 patent/EP0004065B1/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
EP0004065A3 (en) | 1979-10-03 |
AT376044B (en) | 1984-10-10 |
EP0004065A2 (en) | 1979-09-19 |
EP0004065B1 (en) | 1983-02-23 |
ATA162178A (en) | 1984-02-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8330 | Complete disclaimer |