DE2722892A1 - Schutzschaltung fuer mos-bauelemente - Google Patents

Schutzschaltung fuer mos-bauelemente

Info

Publication number
DE2722892A1
DE2722892A1 DE19772722892 DE2722892A DE2722892A1 DE 2722892 A1 DE2722892 A1 DE 2722892A1 DE 19772722892 DE19772722892 DE 19772722892 DE 2722892 A DE2722892 A DE 2722892A DE 2722892 A1 DE2722892 A1 DE 2722892A1
Authority
DE
Germany
Prior art keywords
trough
diode
area
region
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19772722892
Other languages
German (de)
English (en)
Inventor
Joel Ollendorf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of DE2722892A1 publication Critical patent/DE2722892A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/611Combinations of BJTs and one or more of diodes, resistors or capacitors
    • H10D84/613Combinations of vertical BJTs and one or more of diodes, resistors or capacitors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Protection Of Static Devices (AREA)
  • Amplifiers (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE19772722892 1976-05-24 1977-05-20 Schutzschaltung fuer mos-bauelemente Withdrawn DE2722892A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/689,269 US4100561A (en) 1976-05-24 1976-05-24 Protective circuit for MOS devices

Publications (1)

Publication Number Publication Date
DE2722892A1 true DE2722892A1 (de) 1977-12-08

Family

ID=24767729

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19772722892 Withdrawn DE2722892A1 (de) 1976-05-24 1977-05-20 Schutzschaltung fuer mos-bauelemente

Country Status (5)

Country Link
US (1) US4100561A (enExample)
JP (1) JPS52144282A (enExample)
DE (1) DE2722892A1 (enExample)
GB (1) GB1555155A (enExample)
SE (1) SE7705500L (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0130412A1 (en) * 1983-06-30 1985-01-09 Fujitsu Limited Semiconductor device having a protection circuit
EP0488340A1 (en) * 1990-11-30 1992-06-03 Kabushiki Kaisha Toshiba Semiconductor device having input protection circuit
US5684321A (en) * 1994-11-10 1997-11-04 Kabushiki Kaisha Toshiba Semiconductor device having an input protection circuit
US5936282A (en) * 1994-04-13 1999-08-10 Kabushiki Kaisha Toshiba Semiconductor device having input protection circuit

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2374742A1 (fr) * 1976-12-20 1978-07-13 Radiotechnique Compelec Transistor multicouche pour tensions elevees et son procede de fabrication
JPS574431Y2 (enExample) * 1977-05-20 1982-01-27
US4276555A (en) * 1978-07-13 1981-06-30 International Business Machines Corporation Controlled avalanche voltage transistor and magnetic sensor
US4264941A (en) * 1979-02-14 1981-04-28 National Semiconductor Corporation Protective circuit for insulated gate field effect transistor integrated circuits
US4295176A (en) * 1979-09-04 1981-10-13 Bell Telephone Laboratories, Incorporated Semiconductor integrated circuit protection arrangement
SE8105041L (sv) * 1981-08-25 1983-02-26 Ericsson Telefon Ab L M Planartransistor med integrerat overspenningsskydd
JPS5967670A (ja) * 1982-10-12 1984-04-17 Toshiba Corp 半導体装置
JPS6068721A (ja) * 1983-09-22 1985-04-19 Fujitsu Ltd Ecl回路
JPS60231356A (ja) * 1984-04-28 1985-11-16 Mitsubishi Electric Corp 相補形金属酸化膜半導体集積回路装置
JPS6153761A (ja) * 1984-08-24 1986-03-17 Hitachi Ltd 半導体装置
US4757363A (en) * 1984-09-14 1988-07-12 Harris Corporation ESD protection network for IGFET circuits with SCR prevention guard rings
GB2185621B (en) * 1985-10-29 1988-12-14 Plessey Co Plc Protection structures
US4990976A (en) * 1987-11-24 1991-02-05 Nec Corporation Semiconductor device including a field effect transistor having a protective diode between source and drain thereof
US5072273A (en) * 1990-05-04 1991-12-10 David Sarnoff Research Center, Inc. Low trigger voltage SCR protection device and structure
US5274262A (en) * 1989-05-17 1993-12-28 David Sarnoff Research Center, Inc. SCR protection structure and circuit with reduced trigger voltage
ES2078343T3 (es) * 1989-05-17 1995-12-16 Sarnoff David Res Center Dispositivo de proteccion scr de bajo voltaje de disparo y estructura.
US5247201A (en) * 1990-02-15 1993-09-21 Siemens Aktiengesellschaft Input protection structure for integrated circuits
US5359211A (en) * 1991-07-18 1994-10-25 Harris Corporation High voltage protection using SCRs
FR2687009B1 (fr) * 1992-01-31 1994-04-29 Sgs Thomson Microelectronics Composant de protection pour circuit automobile.
US5446302A (en) * 1993-12-14 1995-08-29 Analog Devices, Incorporated Integrated circuit with diode-connected transistor for reducing ESD damage
US5607867A (en) * 1994-07-15 1997-03-04 Texas Instruments Incorporated Method of forming a controlled low collector breakdown voltage transistor for ESD protection circuits
US5789785A (en) * 1995-02-28 1998-08-04 Sgs-Thomson Microelectronics S.R.L. Device for the protection of an integrated circuit against electrostatic discharges
US5629544A (en) * 1995-04-25 1997-05-13 International Business Machines Corporation Semiconductor diode with silicide films and trench isolation
US5731941A (en) * 1995-09-08 1998-03-24 International Business Machines Corporation Electrostatic discharge suppression circuit employing trench capacitor
WO1997010615A1 (en) * 1995-09-11 1997-03-20 Analog Devices, Inc. (Adi) Electrostatic discharge protection network and method
US5663860A (en) * 1996-06-28 1997-09-02 Harris Corporation High voltage protection circuits
KR100214566B1 (ko) * 1997-04-22 1999-08-02 구본준 입력 보호회로
TW399337B (en) * 1998-06-09 2000-07-21 Koninkl Philips Electronics Nv Semiconductor device
US20040028675A1 (en) * 2001-12-07 2004-02-12 Zarlink Semiconductor Ab Compositions for the treatment of lupus
GB2388259B (en) * 2002-04-30 2006-03-29 Zarlink Semiconductor Inc Compact high voltage ESD protection diode
DE102004007972B3 (de) * 2004-02-18 2005-09-01 Infineon Technologies Ag Halbleiterstruktur zum Schutz von integrierten Schaltungen vor ESD-Pulsen
US8557657B1 (en) * 2012-05-18 2013-10-15 International Business Machines Corporation Retrograde substrate for deep trench capacitors
US10411086B2 (en) * 2014-04-07 2019-09-10 Semiconductor Components Industries, Llc High voltage capacitor and method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4632972B1 (enExample) * 1967-11-13 1971-09-27
US3739238A (en) * 1969-09-24 1973-06-12 Tokyo Shibaura Electric Co Semiconductor device with a field effect transistor
US3806773A (en) * 1971-07-17 1974-04-23 Sony Corp Field effect transistor having back-to-back diodes connected to the gate electrode and having a protective layer between the source and the diodes to prevent thyristor action
US3787717A (en) * 1971-12-09 1974-01-22 Ibm Over voltage protection circuit lateral bipolar transistor with gated collector junction

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0130412A1 (en) * 1983-06-30 1985-01-09 Fujitsu Limited Semiconductor device having a protection circuit
US4720737A (en) * 1983-06-30 1988-01-19 Fujitsu Limited Semiconductor device having a protection circuit with lateral bipolar transistor
EP0488340A1 (en) * 1990-11-30 1992-06-03 Kabushiki Kaisha Toshiba Semiconductor device having input protection circuit
US5594265A (en) * 1990-11-30 1997-01-14 Kabushiki Kaisha Toshiba Input protection circuit formed in a semiconductor substrate
US5949109A (en) * 1990-11-30 1999-09-07 Kabushiki Kaisha Toshiba Semiconductor device having input protection circuit
US5936282A (en) * 1994-04-13 1999-08-10 Kabushiki Kaisha Toshiba Semiconductor device having input protection circuit
US5684321A (en) * 1994-11-10 1997-11-04 Kabushiki Kaisha Toshiba Semiconductor device having an input protection circuit

Also Published As

Publication number Publication date
US4100561A (en) 1978-07-11
GB1555155A (en) 1979-11-07
JPS5519069B2 (enExample) 1980-05-23
SE7705500L (sv) 1977-11-25
JPS52144282A (en) 1977-12-01

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Legal Events

Date Code Title Description
8130 Withdrawal