DE2620707B2 - Vorrichtung zur Herstellung eines Überzuges auf einer integrierten Halbleiterschaltung - Google Patents
Vorrichtung zur Herstellung eines Überzuges auf einer integrierten HalbleiterschaltungInfo
- Publication number
- DE2620707B2 DE2620707B2 DE2620707A DE2620707A DE2620707B2 DE 2620707 B2 DE2620707 B2 DE 2620707B2 DE 2620707 A DE2620707 A DE 2620707A DE 2620707 A DE2620707 A DE 2620707A DE 2620707 B2 DE2620707 B2 DE 2620707B2
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor circuit
- coating
- producing
- tubes
- integrated semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 238000000576 coating method Methods 0.000 title claims description 7
- 239000011248 coating agent Substances 0.000 title claims description 4
- 238000001816 cooling Methods 0.000 claims description 7
- 239000007789 gas Substances 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
- C23C16/042—Coating on selected surface areas, e.g. using masks using masks
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Description
Die Erfindung betrifft eine Vorrichtung zur Herstellung eines Überzuges auf einer integrierten Halbleiterschaltung
mit einer Maskenanordnung zum Abdecken von nicht zu beschichtenden Bereichen.
Allgemein bekannte Verfahren zur Erzeugung von Überzügen enthalten häufig einen Herstellungsschritt,
bei dem eine Halbleitervorrichtung in einer gasförmigen Atmosphäre aufgeheizt wird, um eine Schicht aus
festem anorganischen Material, z. B. aus Siliciumdioxid oder Siliciumnitrid, auf der Oberfläche einer Halbleitervorrichtung
aufzubringen. Dies geschieht entweder durch Reaktion des Gases mit der Materialoberfläche
(Silicium) oder durch Reaktion zweier Komponenten eines Gasgemisches, z. B. aus Silan und Sauerstoff, auf
der beheizten Oberfläche.
Aus der Zeitschrift »Elektronik«, 17. Jahrgang (1968), Heft 5, Seiten 143 bis 146 ist es bereits bekannt,
bewegliche Masken auf Substraten anzuordnen, die auf bestimmten Bereichen mit Beschichtungen versehen
werden sollen. Diese Masken weisen den Nachteil auf, daß zusätzliche Mittel und Geräte zum Abtransport von
gasförmigen Substanzen erforderlich sind.
Es ist deshalb die Aufgabe der Erfindung, eine Vorrichtung aufzuzeigen, mit der auf einfache und
exakte Weise eine Beschichtung ausgewählter Bereiche möglich ist und die gleichzeitig Mittel zum Absaugen
von Gasen aufweist.
Diese Aufgabe wird dadurch gelöst, daß die Maskenanordnung aus zwei im Abstand ineinanderliegende
Röhren besteht, von denen die eine, innere Röhre in der anderen, äußeren Röhre angeordnet ist, wobei die
innere Röhre der Zuführung der gasförmigen Atmosphäre, die äußere, auf die Oberfläche der integrierten
Halbleiterschaltung aufzusetzende Röhre der Abdekkung der nicht zu beschichtenden Bereiche und der
Raum zwischen den Röhren der Abführung der gasförmigen Atmosphäre dient.
Im folgenden wird ein erfindungsgemäßes Ausführungsbeispiel beschrieben, wobei auf die Zeichnung
Bezug genommen wird.
Die Zeichnung nach der Figur zeigt im Schnitt eine vergrößerte Darstellung eines Teils einer Halbleiterschaltung
und einer Maskenanordnung.
Auf einer Heizplatte 10 in der Figur ist eine Halbleiterschaltung 11 angeordnet, die Chips 14 und 15
enthält. Die Chips 14 und 15 sind jeweils auf einem Trägersubstratbereich 17 und 18 angeordnet Mit den
Chips 14 und 15 sind elektrische Zuleitungen in Form von Leiterbahnen 32,37,42 und 47 über Leitungsdrähte
94, 98, 100, 101 und 95, 99, 102, 103 verbunden. Die Vorrichtung enthält Gaszuführungs- und -ableitungsröhren,
die jeweils allgemein mit 85 und 86 bezeichnet werden, und die jeweils über einem der Chips 14 bzw. 15
angeordnet sind. Die Gaszuführungs- und -ableitungsröhren 85 bestehen aus einer äußeren Röhre 90, die ein
erweitertes Ende 92 aufweist, das über die ausgewählten, mit einem Überzug zu versehenen Teile, aufgesetzt
ist Eine innere, konzentrisch in der äußeren Röhre 90 angeordnete Röhre 96 ist von der äußeren Röhre 90
beabstandet, so daß zwischen den beiden Röhren 90 und 96 ein Abführungsweg für die gasförmige Atmosphäre
entsteht Ähnlich sind die Gaszuführungs- und -ableitungsröhren
86 angeordnet, die aus einer äußeren Röhre 91 mit einem erweiterten Ende 93 und einer in dieser
konzentrisch angeordneten inneren Röhre 97 bestehen.
Die Gaszuführungs- und -ableitungsröhren 86 sind mit; dem erweiteren Ende 93 auf einen ausgewählten
Bereich der Halbleiterschaltung 11 aufgesetzt.
Nachdem jeweils die Halbleiterschaltung 11 auf der Heizplatte 10 und die Gaszuführungs- und -ableitungsröhren
85 und 86 über den Chips 14 und 15 positioniert sind, wird die gesamte Anordnung auf mindestens 35O0C
erhitzt und anschließend eine Mischung aus Sauerstoff, Silan und einem Trägergas, z. B. Stickstoff, durch die
inneren Röhren 96 und 97 auf die ausgewählten Bereiche, die durch die Enden 92 und 93 abgedeckt sind,
geleitet. Schichten aus Siliciumdioxid 98 und 99 werden dann über den Chips 14 und 15 und über den
entsprechenden diesen zugeordneten Verbindungsdräh-
ten abgelagert. Die Dicke der Siliciumdioxidschicht beträgt etwa 1 μίτι. Das abgesaugte Gas einschließlich
anderer Produkte, die durch die chemische Ablagerung der Siliciumdioxidschicht entstanden, werden durch den
zwischen den inneren Röhren 96 bzw. 97 und den äußeren Röhren 90 bzw. 91 gebildeten Raum abgesaugt.
Die Enden 92 und 93 dienen zur Abdeckung jener Bereiche der Vorrichtung, die außerhalb der nicht zu
beschichtenden Bereiche liegen, so daß das Gasgemisch nur auf die ausgewählten Bereiche gelangt und somit
verhindert wird, daß unerwünschte Beschichtungen entstehen. Eine Kühlvorrichtung 105 ist um die äußere
Röhre 90 und eine Kühlvorrichtung 106 um die äußere Röhre 91 zur Kühlung des abgesaugten Gases
angeordnet Diese Kühlvorrichtungen 105 und 106 können jeweils aus schraubenförmiggewundenen Kühlröhren
bestehen.
Hierzu 1 Blatt Zeichnungen
Claims (2)
1. Vorrichtung zur Herstellung eines Überzuges auf einer integrierten Halbleiterschaltung mit einer
Maskenanordnung zum Abdecken von nicht zu beschichtenden Bereichen, dadurch gekennzeichnet,
daß die Maskenanordnung aus zwei mit Abstand ineinanderliegenden Röhren (90,91,96,
97) besteht, von denen die eine, innere Röhre (96,97)
in der anderen, äußeren Röhre (90, 91) angeordnet ist, wobei die innere Röhre (96, 97) der Zuführung
der gasförmigen Atmosphäre, die äußere, auf die Oberfläche der integrierten Halbleiterschaltung
aufzusetzende Röhre (90, 91) der Abdeckung der nicht zu beschichtenden Bereiche und der Raum
zwischen den Röhren (90,91; 96,97) der Abführung
der gasförmigen Atmosphäre dient.
2. Vorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß die äußere Röhre (90, 91) eine
Kühlvorrichtung (105, 106) zur Kühlung des abgesaugten Gases enthält.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/576,517 US4041896A (en) | 1975-05-12 | 1975-05-12 | Microelectronic circuit coating system |
Publications (3)
Publication Number | Publication Date |
---|---|
DE2620707A1 DE2620707A1 (de) | 1976-11-18 |
DE2620707B2 true DE2620707B2 (de) | 1978-09-21 |
DE2620707C3 DE2620707C3 (de) | 1979-05-23 |
Family
ID=24304755
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE2620707A Expired DE2620707C3 (de) | 1975-05-12 | 1976-05-11 | Vorrichtung zur Herstellung eines Überzuges auf einer integrierten Halbleiterschaltung |
Country Status (8)
Country | Link |
---|---|
US (1) | US4041896A (de) |
JP (1) | JPS51135471A (de) |
CA (1) | CA1059648A (de) |
DE (1) | DE2620707C3 (de) |
FR (1) | FR2311404A1 (de) |
GB (1) | GB1519251A (de) |
IT (1) | IT1060415B (de) |
NL (1) | NL7604980A (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4401053A (en) * | 1981-07-17 | 1983-08-30 | Riley Thomas J | Coating fixture |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2704992A (en) * | 1951-12-28 | 1955-03-29 | Erie Resistor Corp | Gas plating apparatus |
US2879188A (en) * | 1956-03-05 | 1959-03-24 | Westinghouse Electric Corp | Processes for making transistors |
US3117025A (en) * | 1961-08-31 | 1964-01-07 | Space Technology Lab Inc | Thin filming apparatus |
BE623233A (de) * | 1961-10-12 | 1900-01-01 | ||
US3207126A (en) * | 1961-11-14 | 1965-09-21 | Byron Ernest | Mask changer means for vacuum deposition device |
US3312572A (en) * | 1963-06-07 | 1967-04-04 | Barnes Eng Co | Process of preparing thin film semiconductor thermistor bolometers and articles |
US3276423A (en) * | 1963-10-04 | 1966-10-04 | David P Triller | Pattern mask for use in making thin film circuitry |
US3465209A (en) * | 1966-07-07 | 1969-09-02 | Rca Corp | Semiconductor devices and methods of manufacture thereof |
FR1518843A (fr) * | 1967-02-13 | 1968-03-29 | Radiotechnique Coprim Rtc | Dispositif pour le dépôt de couches minces sur des supports semi-conducteurs |
US3597834A (en) * | 1968-02-14 | 1971-08-10 | Texas Instruments Inc | Method in forming electrically continuous circuit through insulating layer |
US3621812A (en) * | 1969-06-18 | 1971-11-23 | Texas Instruments Inc | Epitaxial deposition reactor |
US3647533A (en) * | 1969-08-08 | 1972-03-07 | Us Navy | Substrate bonding bumps for large scale arrays |
US3785046A (en) * | 1970-03-06 | 1974-01-15 | Hull Corp | Thin film coils and method and apparatus for making the same |
US3678892A (en) * | 1970-05-19 | 1972-07-25 | Western Electric Co | Pallet and mask for substrates |
-
1975
- 1975-05-12 US US05/576,517 patent/US4041896A/en not_active Expired - Lifetime
-
1976
- 1976-04-15 GB GB15576/76A patent/GB1519251A/en not_active Expired
- 1976-04-21 CA CA250,654A patent/CA1059648A/en not_active Expired
- 1976-05-07 IT IT23115/76A patent/IT1060415B/it active
- 1976-05-10 NL NL7604980A patent/NL7604980A/xx not_active Application Discontinuation
- 1976-05-11 FR FR7614041A patent/FR2311404A1/fr active Granted
- 1976-05-11 DE DE2620707A patent/DE2620707C3/de not_active Expired
- 1976-05-11 JP JP51053756A patent/JPS51135471A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US4041896A (en) | 1977-08-16 |
NL7604980A (nl) | 1976-11-16 |
FR2311404A1 (fr) | 1976-12-10 |
GB1519251A (en) | 1978-07-26 |
JPS51135471A (en) | 1976-11-24 |
CA1059648A (en) | 1979-07-31 |
DE2620707A1 (de) | 1976-11-18 |
DE2620707C3 (de) | 1979-05-23 |
IT1060415B (it) | 1982-08-20 |
FR2311404B1 (de) | 1979-03-02 |
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