DE2538123A1 - Anordnung zum massenspektrometrischen nachweis von ionen - Google Patents

Anordnung zum massenspektrometrischen nachweis von ionen

Info

Publication number
DE2538123A1
DE2538123A1 DE19752538123 DE2538123A DE2538123A1 DE 2538123 A1 DE2538123 A1 DE 2538123A1 DE 19752538123 DE19752538123 DE 19752538123 DE 2538123 A DE2538123 A DE 2538123A DE 2538123 A1 DE2538123 A1 DE 2538123A1
Authority
DE
Germany
Prior art keywords
ions
arrangement
lens
electrodes
mass spectrometric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19752538123
Other languages
German (de)
English (en)
Inventor
Ernst Dipl Phys Dr Loebach
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OC Oerlikon Balzers AG
Original Assignee
Balzers AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Balzers AG filed Critical Balzers AG
Publication of DE2538123A1 publication Critical patent/DE2538123A1/de
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
    • G21K1/087—Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE19752538123 1974-09-30 1975-08-27 Anordnung zum massenspektrometrischen nachweis von ionen Pending DE2538123A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1313974A CH583460A5 (https=) 1974-09-30 1974-09-30

Publications (1)

Publication Number Publication Date
DE2538123A1 true DE2538123A1 (de) 1976-04-08

Family

ID=4389658

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752538123 Pending DE2538123A1 (de) 1974-09-30 1975-08-27 Anordnung zum massenspektrometrischen nachweis von ionen

Country Status (6)

Country Link
US (1) US4047030A (https=)
CH (1) CH583460A5 (https=)
DE (1) DE2538123A1 (https=)
FR (1) FR2286501A1 (https=)
GB (1) GB1473054A (https=)
NL (1) NL161918B (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3037258A1 (de) * 1980-10-02 1982-05-19 Leybold-Heraeus GmbH, 5000 Köln Energie- oder massendispersiver analysator fuer elektrisch geladene teilchen
DE102015109047B4 (de) 2014-06-20 2018-05-30 Korea Research Institute Of Standards And Science Monochromator und Vorrichtung mit geladenen Partikeln, die diesen enthält

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3997846A (en) * 1975-06-30 1976-12-14 International Business Machines Corporation Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus
EP0107320A3 (en) * 1982-09-17 1986-11-20 Dubilier Scientific Limited Improvements relating to ion-beam apparatus
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
SE461549B (sv) * 1988-06-13 1990-02-26 Sefors Ab Anordning vid ett straalningsdetekteringssystem med ett gasurladdningsroer
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5464975A (en) * 1993-12-14 1995-11-07 Massively Parallel Instruments Method and apparatus for charged particle collection, conversion, fragmentation or detection
US5495107A (en) * 1994-04-06 1996-02-27 Thermo Jarrell Ash Corporation Analysis
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JP3355270B2 (ja) * 1996-02-05 2002-12-09 アルプス電気株式会社 発光モジュール
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
EP1164203B1 (en) 1996-11-06 2007-10-10 Sequenom, Inc. DNA Diagnostics based on mass spectrometry
EP0963443B1 (en) 1996-12-10 2006-03-08 Sequenom, Inc. Releasable nonvolatile mass-label molecules
US6043488A (en) * 1997-08-18 2000-03-28 The Perkin-Elmer Corporation Carrier gas separator for mass spectroscopy
EP0982757A1 (en) * 1998-08-25 2000-03-01 The Perkin-Elmer Corporation Carrier gas separator for mass spectroscopy
DE60137722D1 (de) 2000-06-13 2009-04-02 Univ Boston Verwendung von mass-matched nukleotide in der analyse von oligonukleotidmischungen sowie in der hoch-multiplexen nukleinsäuresequenzierung
US7465919B1 (en) * 2006-03-22 2008-12-16 Itt Manufacturing Enterprises, Inc. Ion detection system with neutral noise suppression
GB0612503D0 (en) * 2006-06-23 2006-08-02 Micromass Ltd Mass spectrometer
CA2828967C (en) 2011-03-04 2018-07-10 Perkinelmer Health Sciences, Inc. Electrostatic lenses and systems including the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3037258A1 (de) * 1980-10-02 1982-05-19 Leybold-Heraeus GmbH, 5000 Köln Energie- oder massendispersiver analysator fuer elektrisch geladene teilchen
DE102015109047B4 (de) 2014-06-20 2018-05-30 Korea Research Institute Of Standards And Science Monochromator und Vorrichtung mit geladenen Partikeln, die diesen enthält

Also Published As

Publication number Publication date
GB1473054A (en) 1977-05-11
CH583460A5 (https=) 1976-12-31
FR2286501B1 (https=) 1980-01-11
NL161918B (nl) 1979-10-15
NL7416698A (nl) 1976-04-01
US4047030A (en) 1977-09-06
FR2286501A1 (fr) 1976-04-23

Similar Documents

Publication Publication Date Title
DE2538123A1 (de) Anordnung zum massenspektrometrischen nachweis von ionen
DE2223367C3 (de) Mikrostrahlsonde zur quantitativen Erfassung von geladenen Sekundärteilchen
DE112011102323B4 (de) Ionendetektionsanordnung
DE69118492T2 (de) Massenspektrometer mit elektrostatischem Energiefilter
DE1539659A1 (de) Magnetische Sektorlinse,insbesondere bei einem Massenspektrometer
DE69936800T2 (de) Massenspektrometer
DE2255302C3 (de) Einrichtung für die Sekundär-Ionen-Massenspektroskopie
DE1937482B2 (de) Mikrostrahlsonde
DE2825760C2 (de) Einrichtung zum alternativen Nachweis von positiv und negativ geladenen Ionen am Ausgang eines Massenspektrometers
DE3231036C2 (https=)
DE7032595U (de) Vorrichtung fuer die elektronenspektroskopie zur chemischen analyse
DE69817618T2 (de) Wien filter
DE1498646A1 (de) Ionen-Mikroanalysator
DE102007013693A1 (de) Ionennachweissystem mit Unterdrückung neutralen Rauschens
DE2608958A1 (de) Vorrichtung zum erzeugen von strahlen aus geladenen teilchen
DE2137510A1 (de) Elektronenoptische Anordnung mit einem Energieselektionsfilter
DE69121463T2 (de) Ionenbündelvorrichtung
DE10235981B9 (de) Teilchenoptische Vorrichtung und Elektronenmikroskop
DE2705430A1 (de) Elektrostatischer analysator fuer geladene teilchen
DE2031811A1 (de) Stigmatisch abbildendes Massenspektrometer mit Richtungs- und Energiefokussierung
DE2105805B2 (de) Gerät für die Elektronenspektroskopie zur chemischen Analyse einer Probe
DE2540602A1 (de) Feldemissions-strahlsystem
DE4002849C2 (https=)
DE4016138A1 (de) Gleichzeitig erfassendes massenspektrometer
EP0185789B1 (de) Analysator für geladene Teilchen

Legal Events

Date Code Title Description
OHN Withdrawal