DE2502494A1 - Verfahren und vorrichtung zum messen von laenge und/oder durchmesser der kapillaren von duesenoeffnungen bei spinnduesen - Google Patents
Verfahren und vorrichtung zum messen von laenge und/oder durchmesser der kapillaren von duesenoeffnungen bei spinnduesenInfo
- Publication number
- DE2502494A1 DE2502494A1 DE19752502494 DE2502494A DE2502494A1 DE 2502494 A1 DE2502494 A1 DE 2502494A1 DE 19752502494 DE19752502494 DE 19752502494 DE 2502494 A DE2502494 A DE 2502494A DE 2502494 A1 DE2502494 A1 DE 2502494A1
- Authority
- DE
- Germany
- Prior art keywords
- signal
- bundle
- capillary
- generated
- spinneret
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 26
- 230000000737 periodic effect Effects 0.000 claims description 40
- 230000003111 delayed effect Effects 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 8
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002441 reversible effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009429 distress Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US435920A US3873211A (en) | 1974-01-23 | 1974-01-23 | Hole measurer controller |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2502494A1 true DE2502494A1 (de) | 1975-07-24 |
Family
ID=23730368
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19752502494 Pending DE2502494A1 (de) | 1974-01-23 | 1975-01-22 | Verfahren und vorrichtung zum messen von laenge und/oder durchmesser der kapillaren von duesenoeffnungen bei spinnduesen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3873211A (en, 2012) |
| JP (1) | JPS50105157A (en, 2012) |
| CA (1) | CA1014728A (en, 2012) |
| DE (1) | DE2502494A1 (en, 2012) |
| FR (1) | FR2258615B2 (en, 2012) |
| GB (1) | GB1465231A (en, 2012) |
| IT (1) | IT1054197B (en, 2012) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4145714A (en) * | 1978-02-27 | 1979-03-20 | Robert W. MacDonald | Television flaw detector for inspecting the wall surface of a hole through a circuit board |
| DE2818760C2 (de) * | 1978-04-28 | 1984-01-12 | Richard Wolf Gmbh, 7134 Knittlingen | Endoskop mit Einrichtung zum Messen des Objektabstandes vom Objekt |
| JPS61105623A (ja) * | 1984-10-29 | 1986-05-23 | Toray Ind Inc | 物体上の位置の認識装置 |
| EP0574686A2 (en) * | 1992-05-13 | 1993-12-22 | The Spectranetics Corporation | Linear scan method and system for cloupling energy into an optical fiber bundle |
| JPH0797018B2 (ja) * | 1992-05-13 | 1995-10-18 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 深さ測定方法及び装置 |
| JP3298250B2 (ja) * | 1993-07-30 | 2002-07-02 | ソニー株式会社 | 自動検査方法及び自動検査装置 |
| JP3227106B2 (ja) * | 1997-04-23 | 2001-11-12 | 株式会社ミツトヨ | 内径測定方法および内径測定装置 |
| US6724947B1 (en) | 2000-07-14 | 2004-04-20 | International Business Machines Corporation | Method and system for measuring characteristics of curved features |
| JP2002131240A (ja) * | 2000-10-27 | 2002-05-09 | Seiko Epson Corp | 透孔内異物検査の管理方法 |
| US10690773B2 (en) * | 2017-12-07 | 2020-06-23 | Velodyne Lidar, Inc. | Systems and methods for efficient multi-return light detectors |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3806252A (en) * | 1972-07-10 | 1974-04-23 | Eastman Kodak Co | Hole measurer |
-
1974
- 1974-01-23 US US435920A patent/US3873211A/en not_active Expired - Lifetime
-
1975
- 1975-01-08 CA CA217,577A patent/CA1014728A/en not_active Expired
- 1975-01-21 FR FR7501719A patent/FR2258615B2/fr not_active Expired
- 1975-01-22 JP JP50009681A patent/JPS50105157A/ja active Pending
- 1975-01-22 IT IT19526/75A patent/IT1054197B/it active
- 1975-01-22 DE DE19752502494 patent/DE2502494A1/de active Pending
- 1975-01-23 GB GB297675A patent/GB1465231A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| CA1014728A (en) | 1977-08-02 |
| US3873211A (en) | 1975-03-25 |
| FR2258615B2 (en, 2012) | 1979-02-23 |
| GB1465231A (en) | 1977-02-23 |
| JPS50105157A (en, 2012) | 1975-08-19 |
| FR2258615A2 (en, 2012) | 1975-08-18 |
| IT1054197B (it) | 1981-11-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHN | Withdrawal |